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Applications Literature

Download articles, application notes, technical notes and more about how EDAX's products can help solve your materials problems.

Art and Conservation +
- Applications of EBSD in Archaeometry Technical Note
- Embrittlement of Ancient Silver Technical Note

Forensics +
- Analysis of Gun Shot Residue with EDS Application Note
- How to Get the Most Out of Orbis Micro-XRF Measurements with Multiple Acquisition Conditions Technical Note

Life Sciences +
- Experiment Brief: Specimen surface and thickness effects on EDS mapping
- Trace Mineral Analysis in Biological Materials with EDAX Octane Elect and APEX™ Technical Note

Materials Science +
- Analysis of PB Free Solder and Solder Films Application Note
- Calibration Strategies for Coating Measurements on the XLNCE X-ray Metrology Product Line Technical Note
- Cathodoluminescence as a technique for inspection, metrology, and failure analysis of μLED processing Application Note
- Characterizing Coarse Particles with Dual EDS Detectors Technical Note
- Characterizing Fracture Surfaces with Dual EDS Detectors Technical Note
- ChI-Scan — the Shortcut to a Quantitative Understanding of the Microstructure in Multi-Phase Samples Application Note
- Complete Characterization with Integrated EDS – EBSD Application Note
- Determining Variations in Concentrations of Chlorine Prepared Cement Using Micro-XRF Application Note
- EBSD Analysis of Cracking in Polycrystalline Materials Application Note
- EDS Maps of Entire Petrographic Sections via Montage Large Area Mapping in APEX 2.0 and Alignment Considerations Application Note
- Experiment Brief: Accurate elemental mapping of semiconductor devices—separating ‘overlapping’ peaks
- Experiment Brief: CPS Mapping and Normalization of a Vitamin Caplet Cross-Section
- Experiment Brief: Defect Analysis of a Catalyst Board
- Experiment Brief: EBSD sample preparation on Al/Mg bulk material using the Gatan Ilion II System
- Experiment Brief: Failure Analysis of a 316 Stainless Steel Heat Exchanger Cell
- Experiment Brief: Fast-track the search for inclusions and trace elements with APEX Software
- Experiment Brief: High-Resolution Spectral Mapping of Odessa Meteorite with Filters
- Experiment Brief: Live Wt% Linescan Across the Cutting Edge of a Razor Blade Sample
- Experiment Brief: Micro-XRF Analysis of Inclusions in Plastic Films
- Experiment Brief: Micro-XRF spectrum mapping for studying salt infiltration into concrete infrastructure
- Experiment Brief: Precise elemental composition analysis during EBSD measurements
- Quantitative mapping of lithium in a scanning electron microscope
- Experiment Brief: Streamlined Microanalysis in the SEM
- FP Quantification of Thermal Barrier Ceramics by Micro-EDXRF Technical Note
- High-Speed EBSD Mapping with the Velocity™ EBSD Camera Series Technical Note
- How to Correlate Micro-XRF and SEM-EDS for Optimal X-ray Characterization of Materials Application Note
- How to Get the Most Out of Orbis Micro-XRF Measurements with Multiple Acquisition Conditions Technical Note
- Improving EBSD Characterization of Li-Ion Battery Cathode Materials using Clarity Application Note
- Interactive OIM Analysis of Fatigue Cracks Technical Note
- Measuring Grain Size in Heavily Twinned Materials Technical Note
- Mechanical Properties of Ferrite and Austenite Phases in Duplex Steel: A Combined EBSD and SEM Nanoindentation Study Technical Note
- Microstructural Analysis of Optical Materials Application Note
- New Features in APEX 2.2 for EDS
- Phase Differentiation in Stainless Steel Oxide Scales Application Note
- Using Cipher system to map the lithium content in Li-ion battery cathode materials
- Using EBSD to Improve the Material Properties of Additive Manufactured Metals Application Note
- Ways to Improve the EDS Quantitative Results Accuracy: Efficiency and eZAF SCC Database
- Ways to Improve the EDS Quantitative Results Accuracy: eZAF MACC Database and Correction Avoidance
- Ways to Improve EDS Quantitative Results Accuracy: FSQ and SmartStandards

Metals +
- An OIM Study of Five-fold Branched Si Particles Produced by Laser Cladding of an Al-Si Alloy Technical Note
- Analysis of PB Free Solder and Solder Films Application Note
- Characterizing directionally solidified Al-Cu-Mg eutectic alloys with combined EDS-EBSD Application Note
- Characterizing the Deformation Microstructure of an Additively Manufactured 316-L Stainless Steel Alloy Application Note
- Characterizing the Microstructure of a Nitrided Steel with Combined EDS-EBSD Analysis Technical Note
- ChI-Scan — the Shortcut to a Quantitative Understanding of the Microstructure in Multi-Phase Samples Application Note
- Complete Characterization with Integrated EDS – EBSD Application Note
- EBSD Analysis of Crack Propagation: A Case Study Technical Note
- EBSD Analysis of Cracking in Polycrystalline Materials Application Note
- EBSD Based Analysis of Lead Free Solders Technical Note
- EBSD Observations of the Evolution of Crystallographic Orientation during In-Situ Deformation Technical Note
- Experiment Brief: Characterizing Contaminants on a Rough Surface with Dual EDS Detectors
- Experiment Brief: Cryoforged Nanotwinned Titanium with Ultra-High Strength and Ductility
- Experiment Brief: Damage-Free Preparation of a Porous Zn Alloy with a Cu Coating
- Experiment Brief: EBSD sample preparation on Al/Mg bulk material using the Gatan Ilion II System
- Experiment Brief: Failure Analysis of a 316 Stainless Steel Heat Exchanger Cell
- Experiment Brief: Interphase analysis in multiphase CoRe alloy
- Experiment Brief: Optimizing the Surface of Multiphase Al Alloys for Successful EBSD Analysis
- Experiment Brief: Precise elemental composition analysis during EBSD measurements
- Experiment Brief: Quantitative Mapping of Lithium in a SEM
- Experiment Brief: Removing the Oxide Layer from Magnesium Alloys to Allow Successful EBSD Data Collection
- High-Speed EBSD Mapping with the Velocity™ EBSD Camera Series Technical Note
- How to Get the Most Out of Orbis Micro-XRF Measurements with Multiple Acquisition Conditions Technical Note
- Lightweight Structural Materials for Automotive Applications Application Note
- Lithium quantification using the composition-by-difference method
- Mechanical Properties of Ferrite and Austenite Phases in Duplex Steel: A Combined EBSD and SEM Nanoindentation Study Technical Note
- Microstructural Analysis of Forged Aluminum Carabiners Technical Note
- Parent Phase Reconstruction Application Note
- Phase Differentiation in Stainless Steel Oxide Scales Application Note
- Quantitative Mapping of Lithium in the SEM Using Composition by Difference Method
- Steel Property Optimization: Using EBSD to Control Retained Austenite Content in Steel Application Note
- Using EBSD to Improve the Material Properties of Additive Manufactured Metals Application Note
- Using TEAM™ Pegasus to Characterize Intermetallic Phases in Duplex Steel Alloys Technical Note

Mineralogy +
- ChI-Scan — the Shortcut to a Quantitative Understanding of the Microstructure in Multi-Phase Samples Application Note
- Experiment Brief: Streamlined Microanalysis in the SEM
- Experiment Brief: Fast-track the search for inclusions and trace elements with APEX Software
- Green Metallography Technical Note
- Experiment Brief: High-Resolution Spectral Mapping of Odessa Meteorite with Filters
- How to Get the Most Out of Orbis Micro-XRF Measurements with Multiple Acquisition Conditions Technical Note
- OIM Analysis of Biominerals Technical Note
- Optimization of Analytical Testing in Mining and Oil & Gas Applications Technical Note
- Trace Mineral Analysis in Biological Materials with EDAX Octane Elect and APEX™ Technical Note
- X-ray Mapping Features in APEX 2.0: Example Analysis of a Geological Sample Application Note

Nano/Emerging Technologies +
- EBSD and Thermoelectrics Technical Note
- EBSD Based Analysis of Lead Free Solders Technical Note
- Experiment Brief: Accurate elemental mapping of semiconductor devices—separating ‘overlapping’ peaks
- Improving EBSD Characterization of Li-Ion Battery Cathode Materials using Clarity Application Note
- Improving Through-Silicon Via Reliability in 3D Integrated Circuits Using EBSD Application Note
- Microstructural Analysis of Optical Materials Technical Note
- Microstructural Characterization of Thin Film Photovoltaics using EBSD Technical Note
- Quantitative mapping of lithium in a scanning electron microscope
- Solid Oxide Fuel Cells and EBSD Technical Note
- Texture Inhomogeneity in Tantalum Sputter Targets Technical Note
- Using Cipher system to map the lithium content in Li-ion battery cathode materials
- Using EBSD to Improve the Material Properties of Additive Manufactured Metals Application Note

Renewable Energy +
- Applications of EBSD in Material Research for Nuclear Energy Technical Note
- Calibration Strategies for Coating Measurements on the XLNCE X-ray Metrology Product Line Technical Note
- Correlative Microscopy in OIM Analysis Application Note
- Deployment of EDAX Tools in Support of Materials Problems Associated with the Hydrogen Economy Application Note
- EBSD and Thermoelectrics Technical Note
- Quantitative mapping of lithium in a scanning electron microscope
- Improving EBSD Characterization of Li-Ion Battery Cathode Materials using Clarity Application Note
- Microstructural Characterization of Thin Film Photovoltaics using EBSD Technical Note
- Optimization of Analytical Testing in Mining and Oil & Gas Applications Technical Note
- Solid Oxide Fuel Cells and EBSD Technical Note
- Using Cipher system to map the lithium content in Li-ion battery cathode materials

Semiconductor +
- Analysis of PB Free Solder and Solder Films Application Note
- Calibration Strategies for Coating Measurements on the XLNCE X-ray Metrology Product Line Technical Note
- EBSD Based Analysis of Lead Free Solders Technical Note
- Experiment Brief: Accurate elemental mapping of semiconductor devices—separating ‘overlapping’ peaks
- High Resolution X-ray Microanalysis Application Note
- Improving Through-Silicon Via Reliability in 3D Integrated Circuits Using EBSD Application Note
- Microstructural Analysis of Optical Materials Technical Note
- Microstructural Characterization of Metal Thin Films for IC Interconnects Application Note
- OIM Analysis of Texture in a High Temperature Superconductor Technical Note
- Phase Identification of Carbide Precipitates Application Note
- Texture Inhomogeneity in Tantalum Sputter Targets Technical Note

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