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Applications Literature

Download articles, application notes, technical notes and more about how EDAX's products can help solve your materials problems.

Forensics +
- Precision forensic glass analysis using the EDAX Orbis II micro-XRF system

Life Sciences +
- Experiment Brief: Specimen surface and thickness effects on EDS mapping

Materials Science +
- 3D EBSD and EDS characterization of additively manufactured Inconel 718 application note
- A windowless EDS detector combining scientific grade performance and industrial grade robustness
- Analyzing a shot-peened titanium alloy with spherical indexing application note
- Breaking through EDS limitations: A study on using WDS for silicon wafer contaminant detection application note
- Breakthroughs in light element detection using a large-area windowless EDS detector
- Cathodoluminescence as a technique for inspection, metrology, and failure analysis of μLED processing Application Note
- Characterizing silicon carbide polymorphs with EBSD using spherical indexing
- Characterizing the microstructure of a nitrided steel with combined EDS-EBSD analysis application note
- ChI-Scan — the Shortcut to a Quantitative Understanding of the Microstructure in Multi-Phase Samples Application Note
- Complete Characterization with Integrated EDS – EBSD Application Note
- EBSD Analysis of Cracking in Polycrystalline Materials Application Note
- EBSD characterization of additively manufactured aluminum-silicon alloys using spherical indexing application note
- EDAX OIM Analysis 9 – The best just got better Application Note
- EDAX OIM Analysis 9.1 – One-button analysis
- EDS Maps of Entire Petrographic Sections via Montage Large Area Mapping in APEX 2.0 and Alignment Considerations Application Note
- Enhancements from EDS to WDS
- Evaluation of the accuracy of standardless EDS analysis in APEX EDS software
- Experiment Brief: Accurate elemental mapping of semiconductor devices—separating ‘overlapping’ peaks
- Experiment Brief: Characterizing composition and crystallography of a mixed halide perovskite in the SEM
- Experiment Brief: Combining NPAR with spherical indexing – A unique method to solve the most challenging EBSD indexing problems
- Experiment Brief: CPS Mapping and Normalization of a Vitamin Caplet Cross-Section
- Experiment Brief: Determining the microstructure of zinc-lithium alloys for enhanced biomedical devices
- Experiment Brief: Developing thinner diffusion barriers for the microelectronics industry with energy dispersive x-ray spectroscopy (EDS)
- Experiment Brief: EBSD sample preparation on Al/Mg bulk material using the Gatan Ilion II System
- Experiment Brief: The effect of pattern size and sensitivity to noise refinement in EBSD patterns
- Experiment Brief: Failure Analysis of a 316 Stainless Steel Heat Exchanger Cell
- Experiment Brief: Fast-track the search for inclusions and trace elements with APEX Software
- Experiment Brief: Identifying titanium hydride in a titanium alloy using EBSD and quantitative backscatter imaging
- Experiment Brief: Precise elemental composition analysis during EBSD measurements
- Experiment Brief: Live Wt% Linescan Across the Cutting Edge of a Razor Blade Sample
- Experiment Brief: Precise elemental composition analysis during EBSD measurements
- Quantitative mapping of lithium in a scanning electron microscope
- Experiment Brief: Resolving bimodal grain distribution in Zr-Al alloy with high efficiency and accuracy
- Experiment Brief: Revealing the lithium content in aerospace alloys
- Experiment Brief: Streamlined Microanalysis in the SEM
- Hunting down 0.5 wt% rare earth element distribution in a Mg alloy sample using the EDAX Octane Elite Super EDS detector Application Note
- Improving EBSD Characterization of Li-Ion Battery Cathode Materials using Clarity Application Note
- Lightweight structural materials for automotive applications application note
- Microstructural Analysis of Optical Materials Application Note
- New Features in APEX 2.2 for EDS
- On the accuracy of standardless EDS analysis in APEX EDS software for light and heavy elements
- Precision forensic glass analysis using the EDAX Orbis II micro-XRF system
- Phase and subgrain mapping in a nanoscale NiAl–(Cr,Mo) eutectic composite application note
- Phase Differentiation in Stainless Steel Oxide Scales Application Note
- Spherical Indexing in OIM Analysis Application Note
- Use of a large area windowless EDS detector for quantitative analysis of heavy elements at high accelerating voltages application note
- Using Cipher system to map the lithium content in Li-ion battery cathode materials
- Ways to Improve the EDS Quantitative Results Accuracy: Efficiency and eZAF SCC Database
- Ways to Improve the EDS Quantitative Results Accuracy: eZAF MACC Database and Correction Avoidance
- Ways to Improve EDS Quantitative Results Accuracy: FSQ and SmartStandards

Metals +
- 3D EBSD and EDS characterization of additively manufactured Inconel 718 application note
- Analyzing a shot-peened titanium alloy with spherical indexing application note
- Breakthroughs in light element detection using a large-area windowless EDS detector
- Characterizing directionally solidified Al-Cu-Mg eutectic alloys with combined EDS-EBSD Application Note
- Characterizing the Deformation Microstructure of an Additively Manufactured 316-L Stainless Steel Alloy Application Note
- Characterizing the microstructure of a nitrided steel with combined EDS-EBSD analysis application note
- ChI-Scan — the Shortcut to a Quantitative Understanding of the Microstructure in Multi-Phase Samples Application Note
- Complete Characterization with Integrated EDS – EBSD Application Note
- EBSD Analysis of Cracking in Polycrystalline Materials Application Note
- EBSD characterization of additively manufactured aluminum-silicon alloys using spherical indexing application note
- EDAX OIM Analysis 9 – The best just got better Application Note
- EDAX OIM Analysis 9.1 – One-button analysis
- Enhancements from EDS to WDS
- Evaluation of the accuracy of standardless EDS analysis in APEX EDS software
- Experiment Brief: Characterizing Contaminants on a Rough Surface with Dual EDS Detectors
- Experiment Brief: Combining NPAR with spherical indexing – A unique method to solve the most challenging EBSD indexing problems
- Experiment Brief: Cryoforged Nanotwinned Titanium with Ultra-High Strength and Ductility
- Experiment Brief: Damage-Free Preparation of a Porous Zn Alloy with a Cu Coating
- Experiment Brief: Determining the microstructure of zinc-lithium alloys for enhanced biomedical devices
- Experiment Brief: EBSD sample preparation on Al/Mg bulk material using the Gatan Ilion II System
- Experiment Brief: Failure Analysis of a 316 Stainless Steel Heat Exchanger Cell
- Experiment Brief: Identifying titanium hydride in a titanium alloy using EBSD and quantitative backscatter imaging
- Experiment Brief: Interphase analysis in multiphase CoRe alloy
- Experiment Brief: Lithium quantification using the composition-by-difference method
- Experiment Brief: Optimizing the Surface of Multiphase Al Alloys for Successful EBSD Analysis
- Experiment Brief: Precise elemental composition analysis during EBSD measurements
- Experiment Brief: Quantitative Mapping of Lithium in a SEM
- Experiment Brief: Removing the Oxide Layer from Magnesium Alloys to Allow Successful EBSD Data Collection
- Experiment Brief: Resolving bimodal grain distribution in Zr-Al alloy with high efficiency and accuracy
- Experiment Brief: Revealing the lithium content in aerospace alloys
- Hunting down 0.5 wt% rare earth element distribution in a Mg alloy sample using the EDAX Octane Elite Super EDS detector Application Note
- Lightweight structural materials for automotive applications application note
- On the accuracy of standardless EDS analysis in APEX EDS software for light and heavy elements
- Parent Phase Reconstruction Application Note
- Phase and subgrain mapping in a nanoscale NiAl–(Cr,Mo) eutectic composite application note
- Phase Differentiation in Stainless Steel Oxide Scales Application Note
- Quantitative Mapping of Lithium in the SEM Using Composition by Difference Method
- Spherical Indexing in OIM Analysis Application Note
- Use of a large area windowless EDS detector for quantitative analysis of heavy elements at high accelerating voltages application note

Mineralogy +
- ChI-Scan — the Shortcut to a Quantitative Understanding of the Microstructure in Multi-Phase Samples Application Note
- Enhancements from EDS to WDS
- Evaluation of the accuracy of standardless EDS analysis in APEX EDS software
- Experiment Brief: Streamlined Microanalysis in the SEM
- Experiment Brief: Fast-track the search for inclusions and trace elements with APEX Software
- On the accuracy of standardless EDS analysis in APEX EDS software for light and heavy elements
- X-ray Mapping Features in APEX 2.0: Example Analysis of a Geological Sample Application Note

Nano/Emerging Technologies +
- Experiment Brief: Accurate elemental mapping of semiconductor devices—separating ‘overlapping’ peaks
- Experiment Brief: Developing thinner diffusion barriers for the microelectronics industry with energy dispersive x-ray spectroscopy (EDS)
- Improving EBSD Characterization of Li-Ion Battery Cathode Materials using Clarity Application Note
- Quantitative mapping of lithium in a scanning electron microscope
- Using Cipher system to map the lithium content in Li-ion battery cathode materials

Renewable Energy +
- Correlative Microscopy in OIM Analysis Application Note
- Deployment of EDAX Tools in Support of Materials Problems Associated with the Hydrogen Economy Application Note
- Improving EBSD Characterization of Li-Ion Battery Cathode Materials using Clarity Application Note
- Experiment Brief: Characterizing composition and crystallography of a mixed halide perovskite in the SEM
- Experiment Brief: Quantitative analysis of trace elements in solar cells by energy dispersive and cathodoluminescence spectroscopies
- Quantitative mapping of lithium in a scanning electron microscope
- Using Cipher system to map the lithium content in Li-ion battery cathode materials

Semiconductor +
- Experiment Brief: Accurate elemental mapping of semiconductor devices—separating ‘overlapping’ peaks
- Breaking through EDS limitations: A study on using WDS for silicon wafer contaminant detection application note
- Experiment Brief: Precise elemental composition analysis during EBSD measurements

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