Velocity™ EBSD Camera Series

The Velocity™ EBSD camera offers high-speed EBSD mapping with the highest indexing performance on real world materials. Powered by a CMOS sensor, the Velocity™ combines fast acquisition with high sensitivity and low noise performance for optimal collection and data quality.

Velocity™ EBSD Camera
The Velocity™ Camera Series offers two different models:
  • Velocity™ Plus – up to 3,000 indexed points per second
  • Velocity™ Super – up to 4,500 indexed points per second

For both models these speeds can be achieved while providing indexing success rates of up to 99% or better. At these speeds, the Velocity™ utilizes 120 x 120 pixel images for improved band detection. This image resolution, combined with EDAX’s proven triplet indexing routine, provides orientation precision values of less than 0.1° without needing any specialized processing routines for accurate characterization of deformed microstructures.

EBSD orientation map from Inconel 600 collected at 3,000 indexed points per second at 11 nA beam current with >99% indexing success.
EBSD orientation map from Inconel 600 collected at 3,000 indexed points per second at 11 nA beam current with >99% indexing success.
EBSD orientation map from additively manufactured Inconel 718 collected at 4,500 indexed points per second at 25 nA beam current.
EBSD orientation map from additively manufactured Inconel 718 collected at 4,500 indexed points per second at 25 nA beam current.

The performance of the Velocity™ camera series extends to a wide range of materials, including lower symmetry, multi-phase and deformed structures. The Velocity™ Series enables efficient data collection on these real-world samples with the quality results needed for optimal materials analysis.

The Velocity™ EBSD camera can be integrated with compatible EDAX EDS detectors for efficient simultaneous EDS-EBSD collection, even at the highest collection speeds. When combined with ChI-Scan™ analysis, this results in useful integrated data for accurate phase differentiation.

Features and Benefits

Data collection rates up to 3,000 or 4,500 indexed points per second
  • EBSD maps can be collected in minutes for efficient SEM use, in-situ experiments, and 3D EBSD applications
High-speed, low noise CMOS sensor
  • Sensor provides high sensitivity and low noise, and 120 x 120 pixel images for EBSD indexing at highest speeds
Orientation precision less than 0.1°
  • Clear characterization of deformed microstructures with standard indexing routines
High indexing success rates
  • EDAX’s proven triplet indexing and patented Confidence Index provide unparalleled indexing performance on challenging real-world samples
High-speed simultaneous EDS-EBSD collection
  • The Velocity™ EBSD cameras have been optimized with compatible EDAX EDS detectors for efficient data collection at highest speeds
EBSD Phase map from a dual phase ferritic and austenitic steel collected at ≈ 2,500 indexed points per second
EBSD Phase map from a dual phase ferritic and austenitic steel collected at ≈ 2,500 indexed points per second.
EBSD IPF Orientation map collected from an additively manufactured Titanium implant at ≈ 2,500 indexed points per second
EBSD IPF Orientation map collected from an additively manufactured Titanium implant at ≈ 2,500 indexed points per second.
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