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Velocity EBSD Camera Series

The EDAX Velocity™ EBSD camera series offers high-speed electron backscatter diffraction (EBSD) mapping with the best indexing performance on real-world materials. Powered by a CMOS sensor, the Velocity combines fast acquisition with high sensitivity and low noise performance for optimal collection and data quality.

Velocity™ EBSD Camera

 

EBSD orientation map from additively manufactured 316L was collected at 6,700 indexed points per second with Velocity Ultra with a 99% indexing success rate.
EBSD orientation map from additively manufactured 316L was collected at 6,700 ipps with Velocity Ultra with a 99% indexing success rate.

EBSD orientation map from additively manufactured Inconel 718 was collected at 4,500 indexed points per second with Velocity Super with a 99% indexing success rate.
EBSD orientation map from additively manufactured Inconel 718 was collected at 4,500 ipps with Velocity Super with a 99% indexing success rate.

EBSD orientation map from Inconel 600 was collected at 3,000 indexed points per second with Velocity Plus with a 99% indexing success rate.
EBSD orientation map from Inconel 600 was collected at 3,000 ipps with Velocity Plus with a 99% indexing success rate.

EBSD orientation map from deformed brass was collected at 2,000 indexed points per second with Velocity Pro with a 99% indexing success rate.
EBSD orientation map from deformed brass was collected at 2,000 ipps with Velocity Pro with a 99% indexing success rate.

The Velocity camera series is available in four different models:

  • EDAX Velocity Ultra – Up to 6,700 indexed points per second (ipps)
  • EDAX Velocity Super – Up to 4,500 ipps
  • EDAX Velocity Plus – Up to 3,000 ipps
  • EDAX Velocity Pro – Up to 2,000 ipps

All models can achieve these speeds while providing up to 99% indexing success rates. EDAX’s proven Triplet Indexing routine provides orientation precision values of less than 0.1° without needing any specialized processing routines for accurate characterization of deformed microstructures.

The performance of the Velocity camera extends to a wide range of materials, including lower symmetry, multi-phase, and deformed structures. The Velocity series enables efficient data collection on these real-world samples with the quality results needed for optimal materials analysis.

The Velocity EBSD cameras can integrate with compatible EDAX energy dispersive spectroscopy (EDS) detectors for efficient simultaneous EDS-EBSD collection, even at the highest collection speeds. When combined with ChI-Scan™ analysis, this results in useful integrated data for accurate phase differentiation.

Features and benefits

Data collection rates up to 6,700 ipps
  • Collects EBSD maps in minutes for efficient scanning electron microscope (SEM) use, in-situ experiments, and 3D EBSD applications
High-speed, low-noise CMOS sensor
  • Provides high sensitivity, low noise images for EBSD indexing at the highest speeds
Orientation precision of less than 0.1°
  • Clear characterization of deformed microstructures with standard indexing routines
High indexing success rates
  • EDAX’s proven Triplet Indexing and patented Confidence Index provide unparalleled indexing performance on challenging real-world samples
High-speed simultaneous EDS-EBSD collection
  • The Velocity EBSD cameras have been optimized with compatible EDAX EDS detectors for efficient data collection at the highest speeds
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