Velocity™ EBSD Camera

The Velocity™ EBSD camera offers high-speed EBSD mapping with the highest indexing performance on real world materials. Powered by a CMOS sensor, the Velocity™ combines fast acquisition with high sensitivity and low noise performance for optimal collection and data quality.

Velocity™ EBSD Camera

The Velocity™ generates indexing speeds greater than 3,000 indexed points per second. These speeds can be achieved while providing indexing success rates of 99% or greater. At these speeds, the Velocity™ utilizes 120 x 120 pixel images for improved band detection. This image resolution, combined with EDAX’s proven triplet indexing routine, provides orientation precision values of less than 0.1° without needing any specialized processing routines for accurate characterization of deformed microstructures.

EBSD Image Quality and Orientation Map from Additively Manufactured Nickel Superalloy Collected at >3,000 indexed points per second with >99% indexing success rate
EBSD Image Quality and Orientation map from an additively manufactured nickel superalloy collected at >3,000 indexed points per second at >99% indexing success rate

The performance of the Velocity™ camera extends to a wide range of materials, including lower symmetry, multi-phase and deformed structures. The Velocity™ enables efficient data collection on these real-world samples with the quality results needed for optimal materials analysis.

The Velocity™ EBSD camera can be integrated with compatible EDAX EDS detectors for efficient simultaneous EDS-EBSD collection, even at the highest collection speeds. When combined with ChI-Scan™ analysis, this results in useful integrated data for accurate phase differentiation.

Features and Benefits

Data collection rates greater than 3,000 indexed points per second
  • EBSD maps can be collected in minutes for efficient SEM use, in-situ experiments, and 3D EBSD applications
High-speed, low noise CMOS sensor
  • Sensor provides high sensitivity and low noise, and 120 x 120 pixel images for EBSD indexing at highest speeds
Orientation precision less than 0.1°
  • Clear characterization of deformed microstructures with standard indexing routines
High indexing success rates
  • EDAX’s proven triplet indexing and patented Confidence Index provide unparalleled indexing performance on challenging real-world samples
High-speed simultaneous EDS-EBSD collection
  • The Velocity™ EBSD camera has been optimized with compatible EDAX EDS detectors for efficient data collection at highest speeds

EBSD Image Quality and Orientation (left) and Phase (right) maps from 2205 Duplex Steel collected at approximately 2,500 indexed points per second with a >99% indexing success rate
EBSD Image Quality and Orientation (left) and Phase (right) maps from 2205 Duplex Steel collected at approximately 2,500 indexed points per second with a >99% indexing success rate

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