• Elite T EDS System
    Elite T EDS System
  • APEX software
    APEX™ EDS Analysis Software
  • Energy Dispersive Spectroscopy
    Energy Dispersive Spectroscopy
  • EBSD analysis overview
    Electron Backscatter Diffraction
  • Integrated EDS EBSD WDS products
    Integrated EDS, EBSD and WDS Systems
  • XRF Process Control
    X-ray Metrology
  • Micro-XRF analysis of precious artifacts
    Micro-XRF
  • Neighbor Pattern Averaging & Reindexing
    Neighbor Pattern Averaging & Reindexing (NPAR™)

EDAX AT A GLANCE

EDAX is a leading provider of innovative materials characterization systems encompassing Energy Dispersive Spectroscopy (EDS), Electron Backscatter Diffraction (EBSD), Wavelength Dispersive Spectrometry (WDS), Micro X-ray Fluorescence (Micro-XRF), and X-ray Metrology.

EDAX products include stand alone tools, integrated tools for EDS-EBSD, EDS-WDS, and EDS-EBSD-WDS, and a free-standing Micro-XRF bench-top elemental analyzer providing small and micro-spot X-ray analysis and mapping.

EDAX develops the best solutions for micro- and nano-characterization, where elemental and/or structural information is required, making analysis easier and more accurate.

EDAX designs, manufactures, distributes and services products for a broad range of industries, educational institutions and research organizations.

RECENT NEWS

Watch the "Can Direct Electron Detection be Used to Improve EBSD Analysis?" webinar on demand
Watch the "Can Direct Electron Detection be Used to Improve EBSD Analysis?" webinar on demand

In this webinar, Dr. Patrick Camus shows a comparison of direct electron detection to current commercial systems and also examines its performance considerations.

Read our latest EDAX Blog post "One Analysis Technique - So Many Options!" by Roger Kerstin
Read the newest EDAX Blog post "One Analysis Technique - So Many Options!" by Roger Kerstin

EDAX North America Sales Manager Roger Kerstin gives a high level overview of and guide to all the many options offered to users of X-ray Fluorescence (XRF).

Read the latest EDAX Blog post "Seeing is Believing?" by Dr. Rene de Kloe
Read Dr. Rene de Kloe's latest EDAX Blog post "Seeing is Believing?"

Dr. de Kloe writes about his participation in a joint SEM – in-situ analysis workshop, "One of the activities during this workshop was to perform a live in-situ tensile experiment with simultaneous EBSD data collection to illustrate the capabilities of all the systems involved."

Watch the "How to Get the Most out of Orbis micro-XRF Measurements with Multiple Acquisition Conditions" webinar on demand
Did you miss the "How to Get the Most out of Orbis micro-XRF Measurements with Multiple Acquisition Conditions" webinar? Watch it on demand.

In this webinar, Dr. Bruce Scruggs shows some examples using glasses and gemstones, but this technique also has applications in a wide variety of fields including forensics, industrial QC/QA, gemology, geology, metal alloys and more.