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  • Using EBSD and TKD for New Insights on the Cold Spray Deposition Process
    Webinar โ€“ Dec. 1
  • Revealing lithium distribution at the microscale with Cipher
    New Application Note
  • Read our new application note, โ€œSpherical Indexingโ€
    Application Note
  • Precise elemental composition analysis during EBSD measurements
    Experiment Brief
  • Register for the โ€œNew Tools for EBSD Data Collection and Analysisโ€ webinar
    Webinar On-Demand
  • Read our new โ€œAccurate elemental mapping of semiconductor devicesโ€”separating โ€˜overlappingโ€™ peaksโ€ experiment brief
    Experiment Brief
  • Download your free copy of the September 2022 issue of the EDAX Insight newsletter
    Just released!
  • EDAX launches the Velocity Ultra EBSD Detector
    Introducing Velocity Ultra

EDAX AT A GLANCE

EDAX is a leading provider of innovative materials characterization systems encompassing Energy Dispersive Spectroscopy (EDS), Electron Backscatter Diffraction (EBSD), Wavelength Dispersive Spectrometry (WDS), Micro X-ray Fluorescence (Micro-XRF), and X-ray Metrology.

EDAX products include stand alone tools, integrated tools for EDS-EBSD, EDS-WDS, and EDS-EBSD-WDS, and a free-standing Micro-XRF bench-top elemental analyzer providing small and micro-spot X-ray analysis and mapping.

EDAX develops the best solutions for micro- and nano-characterization, where elemental and/or structural information is required, making analysis easier and more accurate.

EDAX designs, manufactures, distributes and services products for a broad range of industries, educational institutions and research organizations.

RECENT NEWS

Using EBSD and TKD for New Insights on the Cold Spray Deposition Process
Register for the “Using EBSD and TKD for New Insights on the Cold Spray Deposition Process” webinar – Dec. 1

Guest presenter Dr. Luke Brewer will discuss two examples highlighting how EBSD and related techniques can bring new understanding to the cold spray process.

 

Register for the โ€œNew Tools for EBSD Data Collection and Analysisโ€ webinar
Did you miss the “New Tools for EBSD Data Collection and Analysis” webinar? Watch it on-demand.

In this webinar, details and results from the Velocity Ultra™, OIM Analysis™ v9, and Spherical Indexing are presented, and the unique benefits to users are discussed.

 

Revealing lithium distribution at the microscale with Cipher
Read our latest application note, “Revealing lithium distribution at the microscale with Cipher”

See how for the first time, the lithium content of an NMC cathode material was determined quantitatively in a scanning electron microscope.

 

Read our new application note, โ€œSpherical Indexingโ€
Read our new application note, “Spherical Indexing”

Learn how the new spherical harmonic-based indexing in OIM Analysis™ v9 combines the robustness of forward model indexing with the speed and ease of use of Hough indexing to quickly and efficiently improve your electron backscatter diffraction (EBSD) analysis.