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  • Experiment Brief: Quantitative mapping of lithium in a scanning electron microscope
    Never done before!
  • Register for the โ€œLow-Dose EBSD Analysis of Beam-Sensitive Materialsโ€ webinar
    Webinar On-Demand
  • Download the โ€œHigh-Resolution Spectral Mapping of Odessa Meteorite with Filtersโ€ experiment brief
    New Experiment Brief
  • Introducing the EDAX EDS Powered by Gatan
    Introducing the EDAX EDS Powered by Gatan
  • EDAX Adds Velocity Pro to its EBSD Camera Series
    Introducing the Velocity Pro EBSD Camera
  • Clarityโ„ข EBSD Analysis System
    Introducing the Clarityโ„ข EBSD Analysis System
  • APEXโ„ข Software for EBSD
    Now Available!
  • APEX software
    APEXโ„ข Software for EDS

EDAX AT A GLANCE

EDAX is a leading provider of innovative materials characterization systems encompassing Energy Dispersive Spectroscopy (EDS), Electron Backscatter Diffraction (EBSD), Wavelength Dispersive Spectrometry (WDS), Micro X-ray Fluorescence (Micro-XRF), and X-ray Metrology.

EDAX products include stand alone tools, integrated tools for EDS-EBSD, EDS-WDS, and EDS-EBSD-WDS, and a free-standing Micro-XRF bench-top elemental analyzer providing small and micro-spot X-ray analysis and mapping.

EDAX develops the best solutions for micro- and nano-characterization, where elemental and/or structural information is required, making analysis easier and more accurate.

EDAX designs, manufactures, distributes and services products for a broad range of industries, educational institutions and research organizations.

RECENT NEWS

Watch the "Heating experiments with an in-situ stage combined with EDS and the advantages of WDS" video
If you missed the "Heating experiments with an in-situ stage combined with EDS and the advantages of WDS" symposium at MC 2021, you can watch it on-demand

Dr. Nalan Kalyon demonstrates the capability of a heating stage combined with EDS to record the data from a TiAl alloy. With this experiment, the stability of the material and the possibilities of the combined systems are shown. The advantages of using WDS to complete the analytic characterization are also discussed.

 

Check out the new "Fast Phase Mapping" YouTube video

Get a look at the fast phase mapping feature in the EDAX APEX™ Software for EDS.

 

Watch the โ€œLow-Dose EBSD Analysis of Beam-Sensitive Materialsโ€ webinar on-demand
Watch the “Low-Dose EBSD Analysis of Beam-Sensitive Materials” webinar on-demand

In this webinar, Dr. René de Kloe uses a Clarity™ detector to explore the minimum number of electrons required to produce indexable diffraction patterns as a function of backscatter coefficient, fraction of diffracted electrons, and accelerating voltage.