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  • Register for the "Advanced Data Processing - Selection, Validation, Quantification" webinar
    Webinar - Dec. 16
  • Crystallographic and Strain Mapping in Beam-Sensitive Halide Perovskite Thin Films
    On-Demand Webinar
  • Read the "Ways to Improve the EDS Quantitative Results Accuracy: Efficiency and eZAF SCC Database" application note
    Application Note
  • Read the "Correlative Microscopy with OIM Analysis" application note
    New Application Note
  • Experiment Brief: Quantitative mapping of lithium in a scanning electron microscope
    Never done before!
  • Introducing the EDAX EDS Powered by Gatan
    Introducing the EDAX EDS Powered by Gatan
  • EDAX Adds Velocity Pro to its EBSD Camera Series
    Introducing the Velocity Pro EBSD Camera
  • Clarityโ„ข EBSD Analysis System
    Introducing the Clarityโ„ข EBSD Analysis System

EDAX AT A GLANCE

EDAX is a leading provider of innovative materials characterization systems encompassing Energy Dispersive Spectroscopy (EDS), Electron Backscatter Diffraction (EBSD), Wavelength Dispersive Spectrometry (WDS), Micro X-ray Fluorescence (Micro-XRF), and X-ray Metrology.

EDAX products include stand alone tools, integrated tools for EDS-EBSD, EDS-WDS, and EDS-EBSD-WDS, and a free-standing Micro-XRF bench-top elemental analyzer providing small and micro-spot X-ray analysis and mapping.

EDAX develops the best solutions for micro- and nano-characterization, where elemental and/or structural information is required, making analysis easier and more accurate.

EDAX designs, manufactures, distributes and services products for a broad range of industries, educational institutions and research organizations.

RECENT NEWS

Non-destructive Authentication of Gemstones Using Micro-XRF
Read the latest EDAX application note “Non-destructive Authentication of Gemstones Using Micro-XRF”

Discover how the Orbis Micro-XRF Elemental Analyzer can be used to quickly and non-destructively verify the authentication of gemstones.

 

Did you miss the โ€œCrystallographic and Strain Mapping in Beam-Sensitive Halide Perovskite Thin Filmsโ€ webinar? Watch it on-demand.
Did you miss the “Crystallographic and Strain Mapping in Beam-Sensitive Halide Perovskite Thin Films” webinar? Watch it on-demand.

In this joint webinar with AMOLF, we describe the advantages of the very high sensitivity of the Clarity EBSD Analysis System for beam-sensitive materials, such as halide perovskite thin films.

 

Check out the new Gatan EBSD web page
Are you interested in learning more about EBSD? Check out the new Gatan EBSD web page.

Gatan launched a new web page dedicated to EBSD. You can find out more about the technique, applications, and how the combination of Gatan sample preparation and EDAX detectors and software can take your analysis to the next level.

 

Watch the "OIM Matrix and Forward Modeling" webinar on-demand
Did you miss the "OIM Matrix and Forward Modeling" webinar? Watch it on-demand.

In this webinar, we review the essentials of the existing forward model indexing framework using the OIM Matrix™ package, focusing on the refinement process. We also give you a preview of upcoming enhancements to OIM Matrix for accelerated indexing and enhanced usability.