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  • EDAX Adds Velocity Pro to its EBSD Camera Series
    Introducing the Velocity Pro EBSD Camera
  • Register for the " APEXโ„ข 2.0 for EBSD - What's New and Key Features" webinar
    Webinar On-Demand
  • Clarityโ„ข EBSD Analysis System
    Introducing the Clarityโ„ข EBSD Analysis System
  • Lambda WDS Analysis System
    Now Available!
  • APEXโ„ข Software for EBSD
    Now Available!
  • APEX software
    APEXโ„ข Software for EDS
  • Energy Dispersive Spectroscopy
    Energy Dispersive Spectroscopy
  • Micro-XRF analysis of precious artifacts


EDAX is a leading provider of innovative materials characterization systems encompassing Energy Dispersive Spectroscopy (EDS), Electron Backscatter Diffraction (EBSD), Wavelength Dispersive Spectrometry (WDS), Micro X-ray Fluorescence (Micro-XRF), and X-ray Metrology.

EDAX products include stand alone tools, integrated tools for EDS-EBSD, EDS-WDS, and EDS-EBSD-WDS, and a free-standing Micro-XRF bench-top elemental analyzer providing small and micro-spot X-ray analysis and mapping.

EDAX develops the best solutions for micro- and nano-characterization, where elemental and/or structural information is required, making analysis easier and more accurate.

EDAX designs, manufactures, distributes and services products for a broad range of industries, educational institutions and research organizations.


Download the "CPS mapping and normalization of a vitamin caplet cross-section" experiment brief
New EDAX Experiment Brief: CPS mapping and normalization of a vitamin caplet cross-section

Learn how CPS mapping and normalization can help you with your materials analysis.


Did you miss the โ€œBroad Argon Beam Tool for EBSD Preparationโ€ webinar? Watch it on-demand.
Did you miss the “Broad Argon Beam Tool for EBSD Preparation” webinar? Watch it on-demand.

In this webinar, we show how Gatan’s broad argon beam tool successfully enables EBSD results that were previously unconceivable with mechanical preparation.


Read the "Parent Phase Reconstruction" application note
Check out the latest EDAX application note, "Parent Phase Reconstruction"

We present examples of how to reconstruct the pre-transformation microstructure from the measured post-transformation microstructure using OIM Analysis™ v8.6.


Register for the โ€œHow to Get More Insight with Dual EDS Detectorsโ€ webinar
Register for the upcoming “How to Get More Insight with Dual EDS Detectors” webinar – Feb. 25

This webinar will review dual detector technology and associated features in APEX software. Application examples will be presented to illustrate the advantages and limitations of this technology.