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  • Read the "Ways to Improve the EDS Quantitative Results Accuracy: Efficiency and eZAF SCC Database" application note
    Application Note
  • Read the "Correlative Microscopy with OIM Analysis" application note
    New Application Note
  • OIM Matrix and Forward Modeling
    Webinar - Oct. 28
  • Download your free copy of the September 2021 issue of the EDAX Insight newsletter
    Just Released!
  • Experiment Brief: Quantitative mapping of lithium in a scanning electron microscope
    Never done before!
  • Introducing the EDAX EDS Powered by Gatan
    Introducing the EDAX EDS Powered by Gatan
  • EDAX Adds Velocity Pro to its EBSD Camera Series
    Introducing the Velocity Pro EBSD Camera
  • Clarityโ„ข EBSD Analysis System
    Introducing the Clarityโ„ข EBSD Analysis System

EDAX AT A GLANCE

EDAX is a leading provider of innovative materials characterization systems encompassing Energy Dispersive Spectroscopy (EDS), Electron Backscatter Diffraction (EBSD), Wavelength Dispersive Spectrometry (WDS), Micro X-ray Fluorescence (Micro-XRF), and X-ray Metrology.

EDAX products include stand alone tools, integrated tools for EDS-EBSD, EDS-WDS, and EDS-EBSD-WDS, and a free-standing Micro-XRF bench-top elemental analyzer providing small and micro-spot X-ray analysis and mapping.

EDAX develops the best solutions for micro- and nano-characterization, where elemental and/or structural information is required, making analysis easier and more accurate.

EDAX designs, manufactures, distributes and services products for a broad range of industries, educational institutions and research organizations.

RECENT NEWS

Read the "Ways to Improve the EDS Quantitative Results Accuracy: Efficiency and eZAF SCC Database" application note
Read the latest EDAX application note, "Ways to Improve the EDS Quantitative Results Accuracy: Efficiency and eZAF SCC Database"

In this application note, we discuss the full standards quantification that has been added with the release of the APEX 2.2 Software.

 

Read the "Correlative Microscopy with OIM Analysis" application note
New application note: Correlative Microscopy with OIM Analysis

In this application note, we show how combining CL and EBSD techniques can provide a more comprehensive characterization.

 

Quantitative Mapping of Lithium in the SEM Using Composition by Difference Method Application Note
Check out our latest application note, “Quantitative Mapping of Lithium in the SEM Using Composition by Difference Method

Learn more about how EDAX and Gatan collaborated to quantify lithium for the first time in the scanning electron microscope.

 

Register for the upcoming โ€œOIM Matrix and Forward Modelingโ€ webinar
Register for the upcoming “OIM Matrix and Forward Modeling” webinar – Oct. 28

In this webinar, Dr. Will Lenthe will review the essentials of the existing forward model indexing framework using the OIM Matrix™ package, focusing on the refinement process.