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  • Improving the time to quality results with the Velocity Ultra EBSD detector and OIM Analysis 9 software
    Application Note
  • Improved composition metrology in compound semiconductors using the Neptune system
    Experiment Brief
  • Download your free copy of the March 2023 issue of the EDAX Insight newsletter.
    Just released!
  • EDAX and Gatan merge to offer the ultimate suite of microscopy tools
    Now Together
  • Using Cipher system to map the lithium content in Li-ion battery cathode materials
    Application Note
  • Advances in EDS and EBSD Webinar
    Webinar On-Demand
  • Introducing APEX 3.0 Software โ€“ now with EDS, EBSD, and WDS
    Webinar On-Demand
  • Why you should save EBSD patterns
    Tips & Tricks

EDAX AT A GLANCE

EDAX is now combined with Gatan to develop new approaches to uncover insights and explore the boundaries of your transmission and scanning electron microscopy (TEM and SEM) research. Under the Gatan name, customers will receive reliable, cutting-edge products of the highest quality while maintaining the responsive customer care that you expect.

Now together, let’s discover how to achieve your next breakthrough.

RECENT NEWS

Improving the time to quality results with the Velocity Ultra EBSD detector and OIM Analysis 9 software
Check out our new application note “Improving the time to quality results with the Velocity Ultra EBSD detector and OIM Analysis 9 software”

Discover how the combination of the Velocity™ Ultra electron backscatter diffraction (EBSD) detector, APEX™ EBSD pattern acquisition and indexing, and OIM Analysis™ 9 processing allow you to quickly collect and reliably analyze EBSD data with much improved time-to-results.

 

Improved composition metrology in compound semiconductors using the Neptune system
Download our latest experiment brief “Improved composition metrology in compound semiconductors using the Neptune system”

Discover how the EDAX Neptune (EDS-WDS) system was used to resolve the overlapping peaks in an indium-antimony-telluride semiconductor wafer to provide more accurate results.

 

Read the latest EDAX Blog post, โ€œBeing more preciseโ€
Read the latest EDAX Blog post, “Being more precise”

Dr. Stuart Wright discusses some of the advancements in the OIM Analysis 9 software and how it can help with your analysis.

 

EDAX and Gatan merge to offer the ultimate suite of microscopy tools
EDAX and Gatan merge to offer the ultimate suite of microscopy tools

EDAX is now combined with Gatan to develop new approaches that uncover insights and explore the boundaries of your TEM and SEM research. Under the Gatan name, customers will receive reliable, cutting-edge products of the highest quality while maintaining the responsive customer care that you expect.