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APEX Software for EBSD

EDAX APEX™ EBSD enables the characterization of electron backscatter diffraction (EBSD) patterns within the user-friendly APEX software platform. Combining powerful pattern analysis and an intuitive interface allows you to collect and report high-quality data quickly, easily, and reliably. Paired with EDAX hardware, APEX increases user productivity and offers the best solution for microstructural characterization.

Simultaneous EDS-EBSD collection in APEX EBSD.

 

Ease of use
  • Intuitive operation for novice and expert users
  • Graphical ribbon bar enables quick access to features and functions
  • Analysis modes are organized into application tabs with relevant functions arranged in logical groups in each tab
  • Automatic optimization of EBSD detector and data collection parameters
APEX™ EBSD ribbon bar.
APEX EBSD ribbon bar.
Context sensitive layout selection.
Context sensitive layout selection.
Adjustable layouts
  • Multiple layouts available for each application tab that show relevant view windows for desired operation
  • Ability to resize and arrange data view windows according to user requirements
  • Save and reuse custom layouts
  • Selectable color schemes to match the scanning electron microscope (SEM) interface or user preferences
User customization
  • Single or multi-user modes
  • Option to use Windows® Authentication for login
  • Individual settings saved for each user

Features and benefits

Triplet Indexing resolves overlapping patterns for better indexing.
Triplet Indexing resolves overlapping patterns for better indexing.
Triplet Indexing engine
  • Minimize sensitivity to rogue band detection with the unique three-bands (triplets) indexing approach
  • Achieve high indexing success rates with Triplet Indexing, even at the highest available speeds of the Velocity™ EBSD detectors
  • Patented Confidence Index value provides a quantitative quality measurement for the crystallographic indexing solution
  • Optimize band detection settings on the dedicated Hough page to allow for successful indexing of all crystal structures
  • Produce high-quality, indexing results on real-world samples
Comprehensive EBSD data collection
  • Easily collect individual EBSD patterns or a full scan
  • Multiple scan modes are available
  • Hexagonal grid sampling for enhanced data sampling
  • Line scan acquisition
  • Automatic step size recommendations for efficient scanning
  • Automatic detector optimization for application-specific EBSD data collection
Multiple scanning modes available.
Multiple scanning modes available.
Dynamic scanning
  • Observe and assess data collection in real-time with visual and numeric feedback during each scan
  • Grayscale maps include Image Quality, SEM signal, and PRIAS (optional)
  • Color maps include IPF, Confidence Index, phase, and energy dispersive spectroscopy (EDS) elements
  • Combine grayscale and color maps to better understand results
  • Data statistics summary
  • EBSD pattern and indexing display
  • Crystal Unit Cell display
  • Hough band detection
  • Feedback provides users with information on collection quality
Montage large area mapping
  • Scan large areas using stage movements to collect multiple fields of analysis
  • Automatically stitch data into a single file for comprehensive analysis
  • Oversampling available to improve matching between fields
EBSD mapping example from a high entropy alloy weld.
EBSD mapping example from a high entropy alloy weld.
Batch Scanning
  • Collect a series of scans as a single batch process
  • Define standard free-form, Montage, and line scans within a batch
  • Define the magnification, scan area, step size, simultaneous EDS, and stage location within the batch
  • Enable efficient use of SEM for analyzing multiple areas or samples
Project tree data organization.
Project tree data organization.
Data management
  • Project tree structure for seamless organization of data
  • 64-bit software architecture for handling big data
  • HDF file format for data management and portability
  • Single file for both EDS and EBSD collection
  • Ability to specify file name and location to meet user needs
  • Default names within project tree for quick collection with option to rename if desired
  • HDF file compatible with APEX Review for EDS analysis and OIM Analysis™ for EBSD analysis
Integrated EDS-EBSD
  • Full integration of EDS and EBSD for comprehensive materials characterization
  • Combine EDS spectrum with EBSD pattern collection for correlation of chemical and structural information
  • Utilize advanced EDS quant engine optimized for high-tilt EBSD geometries
  • Simultaneous EDS-EBSD scanning compatible with ChI-Scan processing for enhanced multi-phase analysis
Advanced reporting
  • Customizable report generation based on OIM Analysis user templates
  • Tailored report layout with Report Designer tool
  • User-defined report content in template files with default design templates available
  • Generate reports from APEX EBSD or from OIM Analysis software
  • Use reporting with batch scanning capability

Resources

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