APEX™ Software for EBSD

Ease of Use

• Intuitive operation for novice and expert users
• Graphical ribbon bar enables quick access to features and functions
• Analysis modes organized into application tabs with relevant functions arranged in logical groups in each tab
• Smart functions for automatic optimization of data collection and reporting

APEX EBSD ribbon bar.

Context sensitive layout selection.

Adjustable Layouts

• Multiple layouts available for each application tab that show relevant view windows for desired operation
• Ability to resize and arrange data view windows according to user requirements
• Save and reuse custom layouts
• Selectable color schemes to match the Scanning Electron Microscope (SEM) interface or user preferences
• Compatible with multiple monitor configurations

User Customization

• Single or multi-user modes
• Option to use Windows® Authentication for login
• Individual settings saved for each user

Features

Triplet Indexing resolves overlapping patterns.

Triplet Indexing Engine

• Minimize sensitivity to rogue band detection with the unique three-bands (triplets) indexing approach
• Achieve high indexing success rates with Triplet Indexing, even at fast acquisition speeds of 4,500 indexed points per second with the Velocity™ Super EBSD camera
• Patented Confidence Index value provides a quantitative quality measurement for the crystallographic indexing solution
• Optimize band detection settings on the dedicated Hough page to allow for successful indexing of all crystal structures
• Produce high-quality, indexing results on real-world samples

Comprehensive EBSD Data Collection

• Easily collect individual EBSD patterns or a full scan
• Multiple scan modes available
• Hexagonal grid sampling for enhanced data sampling
• Line scan acquisition
• Smart step size recommendations for efficient scanning
• Smart detector optimization allows you to set up EBSD acquisition per application requirements
• Atom Probe Assist™ mode available for monitoring grain boundaries

Multiple scanning modes available.

Dynamic Scanning

• Observe and assess data collection in real-time with visual and numeric feedback during each scan
• Grayscale maps include Image Quality, SEM signal, and PRIAS (optional)
• Color maps include IPF, Confidence Index, Phase, and EDS Elements
• Combine grayscale and color maps to better understand results
• Data statistics summary
• EBSD pattern and indexing display
• Crystal Unit Cell display
• Hough band detection
• Feedback provides users with information on collection quality

Montage Large Area Mapping

• Scan large areas using stage movements to collect multiple fields of analysis
• Automatically stitch data into a single file for comprehensive analysis
• Oversampling available to improve matching between fields

EBSD of a Gibeon Meteorite sample covering a 7.5 mm x 6.5 mm area using Montage for large area analysis.

Batch Scanning

• Collect a series of scans as a single batch process
• Define standard free-form, Montage, and line scans within a batch
• Define the magnification, scan area, step size, simultaneous EDS, and stage location within the batch
• Enable efficient use of SEM for analyzing multiple areas or samples

Project tree data organization.

Data Management

• Project tree structure for seamless organization of data
• 64-bit software architecture for handling big data
• HDF file format for data management and portability
• Single file for both EDS and EBSD collection
• Ability to specify file name and location to meet user needs
• Default names within project tree for quick collection with option to rename if desired
• HDF file compatible with APEX Review for EDS analysis and OIM Analysis™ for EBSD analysis

Integrated EDS-EBSD

• Full integration of Energy Dispersive Spectroscopy (EDS) and EBSD for comprehensive materials characterization
• Combine EDS spectrum with EBSD pattern collection for correlation of chemical and structural information
• Utilize advanced EDS quant engine optimized for high-tilt EBSD geometries
• Simultaneous EDS-EBSD scanning compatible with ChI-Scan processing for enhanced multi-phase analysis

Advanced Reporting

• Customizable report generation based on OIM Analysis user templates
• Tailored report layout with Report Designer tool
• User-defined report content in template files with default design templates available
• Generate reports from APEX EBSD or from OIM Analysis software
• Use reporting with batch scanning capability