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Webinars

  • Register for the "How to Gain More Insight with Dual EDS Detectors" webinar
    How to Gain More Insight with Dual EDS Detectors

    Thursday, February 25, 2021

    Dual detectors result in more efficient data collection or higher data quality by doubling the throughput. Compared to one larger size detector with the same electronics, a dual detector system can achieve a better resolution without sacrificing throughput. Dual detectors improve quantitative results on samples with flat and smooth surfaces. When dealing with coarse particles or samples with rough surfaces, dual detectors are helpful for mitigating shadowing artifacts associated with sample topography. This webinar will review dual detector technology and associated features in APEX software. Application examples will be presented to illustrate the advantages and limitations of this technology.   

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  • Register for the "Broad Argon Beam Tool for EBSD Preparation" webinar
    EBSD用試料作製のためのブロードアルゴンビームツール

    Thursday, February 25, 2021

    電子線後方散乱回折法 (EBSD) はSEMにおける材料解析において必須の手法です。EBSDは結晶粒径、集合組織、結晶方位といったエネルギー分散型X線分析では得ることが出来ない情報が取得可能であり、第二相の識別や主相に対する第二相の方位関係が判ります。

    EBSDに関して重要な点は、試料最表面から10nm以下の領域からの信号を利用していることです。それゆえ、その試料作製は難しいとされてきました。最も一般的な試料作製法である機械研磨では工程が複雑になりがちで、またソフトマテリアルや多孔質材料、大きく異なる相からなる多相材料などに対しては研磨が困難であり、良好な結果を得るためには試料作製に対する豊富な経験が必要とされます。

    ブロードアルゴンビームツールはこれらの試料作製の複雑さから解放します。本ウェビナーでは、GatanのPECS IIとEBSDにおけるアドバンテージをEDAXとの共同発表でご紹介します。Gatanのブロードアルゴンビームツールによって、機械研磨による試料作製では不可能であったEBSD測定が実現されます。

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  • Register for the "Broad Argon Beam Tool for EBSD Preparation" webinar
    Broad Argon Beam Tool for EBSD Preparation

    Thursday, February 4, 2021

    Electron backscatter diffraction (EBSD) is a critical technique for materials analysis in an SEM. EBSD provides far more than energy dispersive x-ray spectroscopy in that grain size, texture, grain orientation, and in many cases, secondary phases can be identified and their relationship in terms of grain orientation to the primary phase. An important point to appreciate about EBSD is that the signal comes from less than the top 10 nm of the surface. Therefore, sample preparation has traditionally been difficult. Mechanical preparation, the most common technique, may be complicated, have difficulties with very dissimilar materials, and usually requires an experienced metallographer to succeed. Broad argon beam tools nearly eliminate these complexities. Here, we will describe the Gatan PECS II and an EBSD results challenge that we worked on with our sister company—EDAX. In all cases, Gatan’s broad argon beam tool successfully enabled EBSD results that were previously unconceivable with mechanical preparation.

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  • Register for the "How to Reconstruct Pre-Transformation Microstructures in OIM" webinar
    How to Reconstruct Pre-Transformation Microstructures in OIM

    Thursday, January 21, 2021

    When a material undergoes a transformation from one crystallographic phase to another, a grain in the original microstructure may transform into several different crystallographic variants. If the transformed microstructure is scanned by EBSD, it is possible to reconstruct the pre-transformation microstructure from the EBSD results (assuming a given orientation relationship). This webinar will discuss the reconstruction algorithm implemented in OIM Analysis™ and present some case studies illustrating its capabilities and limitations.

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  • Ein neuer Weg der Materialanalyse mit APEX 2.0 EDX
    Ein neuer Weg der Materialanalyse mit APEX 2.0 EDX

    Tuesday, January 19, 2021

    Durch systematische Optimierung der APEX™ Software und der damit verbundenen Mikroanalyse haben wir eine neue Welt der EDX Analyse betreten. APEX 2.0 EDX bietet eine Vielzahl an Funktionalitäten und Kapazitäten an. Bestimmende Einflussfaktoren beeinträchtigen die Detektionsperformance und die daraus resultierende Analyse. Durch das ultradünne Keramikfenster ist eine hohe Zählrate im Leichtelementbereich erlaubt.

    Die benutzerfreundliche Oberfläche der innovativen Software bietet ein simultanes Aufnehmen qualitativer und quantitativer Ergebnisse, sowie das Arbeiten im Review Modus. Mit seinen neuartigen Funktionen wie dem Batchmodus, Montage Mapping und Phasenmapping werden neue Darstellungen möglich.

    Dieser Webcast wird allen einen neuen Einblick in die EDX Welt und in die APEX 2.0 EDX Software verschaffen.

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