Webinars

  • Register for the "Applications of High-Speed CMOS Cameras for EBSD Microstructural Analysis" webinar
    Applications of High-Speed CMOS Cameras for EBSD Microstructural Analysis

    Thursday, March 28, 2019

    The recent adoption of CMOS-based cameras for the collection of Electron Backscatter Diffraction (EBSD) patterns has unlocked faster collection speeds at higher pixel resolution. This technology enables rapid and accurate microstructural characterization of a wide range of materials. This presentation introduces EDAX’s new Velocity CMOS-based camera, and presents numerous application examples. Microstructural characterization strategies utilizing this new technology are also discussed.

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  • Register for the EDS in the TEM: Fundamentals and Principles webinar
    EDS in the TEM: Fundamentals and Principles

    Thursday, February 21, 2019

    While the vast majority of Energy Dispersive X-ray Spectroscopy (EDS) systems are mounted on Scanning Electron Microscopes (SEM), the incorporation of an EDS system on a Transmission Electron Microscopes (TEM) gives access to the same wealth of compositional information but on a scale much smaller than what is achievable in the SEM. However, the TEM poses a very different set of challenges both from a hardware and analytical point of view compared to the SEM.

    In this webinar, we go through the fundamentals of X-ray generation, detection, and analysis in the TEM with a focus on the challenges that are unique to the TEM. This includes holder influence, geometry optimization, quantification and correction routines as well as performance metrics such as Fiori number and artefact peaks.

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  • Register for the "EDS Mapping: Data Collection, Representation, Extraction, and Mining" webinar
    EDS面扫描:数据采集、表示、提取和挖掘

    Tuesday, January 29, 2019

    这次讲座我们将讨论在高真空和可变气压环境下不同的电镜设置对面扫描图输出和质量的影响以及改变这些设置可以获得什么样的信息。通过一些实例,我们将介绍基于原始数据可以计算得出的各种面扫描图类型并讨论它们之间的不同。我们同时也会涉及一部分从面扫描图中提取数据来获得给人第一感觉并不显眼或难以利用的信息的方法。

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