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  • Register for the "Comparisons between 2D and 3D experimental mesoscale measurements to examine slip transfer through grain boundaries in titanium and Ti-5Al-2.5Sn" webinar
    Comparisons between 2D and 3D experimental mesoscale measurements to examine slip transfer through grain boundaries in titanium and Ti-5Al-2.5Sn

    Thursday, April 28, 2022

    Identification of slip processes at grain boundaries is complex and challenging for both characterization and modeling. To enable modeling of heterogeneous deformation near grain boundaries, credible observations with good statistics are necessary, as the size of grain boundary misorientation space combined with slip system activation is huge. Recent work with 2D characterization of slip transfer in Ti-5Al-2.5Sn (direct or indirect transmission of dislocations through grain boundaries) provides statistics. However, the detail provided by Transmission Electron Microscope (TEM) requires effort that precludes gathering of such statistics. Furthermore, extraction of a TEM foil removes the state of stress that drove the slip transfer process and observations may not represent the dislocation configuration that took place during deformation. To overcome this limitation, a 3D investigation using far-field measurements in pure Ti to examine twin nucleation by slip transfer reveals different constraints than observed in surface measurements. Use of differential aperture X-ray microscopy on in-situ deformation enables micron scale quantification of geometrically necessary dislocations (GNDs) present near grain boundaries while under load, so that the concurrent local elastic stress state associated with local heterogeneous deformation near boundaries can also be extracted. Insights gained from analysis of GNDs and local stress states indicates that the local kinematics of slip even along a single grain boundary vary greatly from place to place.

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  • Register for the How to Correlate Micro-XRF and SEM-EDS for Optimal X-ray Characterization of Materials webinar
    X線マイクロアナリシス ~ミクロからマクロまでSEM+EDS/WDS とμEDXRF分析~

    Friday, February 25, 2022

    微小部の元素分析手法は色々ありますが、分析装置の励起源や検出器の違いで得られる結果が異なります。

    このウェビナーでは、弊社の製品で測定した試料の分析結果を比較しながら、各装置の特長やアプリケーションデータをご紹介します。

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  • Register for the How to Correlate Micro-XRF and SEM-EDS for Optimal X-ray Characterization of Materials webinar
    How to Correlate Micro-XRF and SEM-EDS for Optimal X-ray Characterization of Materials

    Thursday, January 20, 2022

    Micro X-ray Fluorescence (Micro-XRF) is a non-destructive analytical technique that utilizes the benefits of conventional XRF while implementing micro-spot X-rays with a moveable stage. It does not require sample preparation and coating, and the sample shape and height can be irregular. This technique improves detection limits for higher Z elements and greater analysis depth than can be achieved with Energy Dispersive Spectroscopy (EDS) in a Scanning Electron Microscope (SEM). SEM-EDS has higher light element sensitivity and is more appropriate for smaller-scale features and more precise locations. Both techniques allow spectrum acquisition, linescan, and mapping. This webinar will look at the relative advantages of SEM-EDS and benchtop Micro-XRF analysis and suggest how the two techniques can be used together for the optimal X-ray characterization of materials.

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