• Register for the "Applications of High-Speed CMOS Cameras for EBSD Microstructural Analysis" webinar

    Friday, October 18, 2019



  • Background Modeling and Non-Ideal Sample Analysis
    Background Modeling and Non-Ideal Sample Analysis

    Thursday, September 26, 2019

    Typically, EDS analysis of a sample deals with the characteristic radiation that is associated with the elements present within the interaction volume. Often the background or continuum radiation is ignored or even stripped away before the analysis starts. However, valuable information can be extracted from the background and be used to give an indication of whether the conditions for analysis are good or not.

    In this webinar, we will look at what information is contained in background signal and how this information can be used to improve and optimize sample analysis, especially under non-ideal conditions, such as samples with topography, particles, and charging samples.


  • Register for the "Dynamical Simulation of Electron Backscatter Diffraction (EBSD) Patterns" webinar presented by Dr. Stuart Wright
    Dynamical Simulation of Electron Backscatter Diffraction (EBSD) Patterns

    Thursday, June 27, 2019

    Kinematical based simulation has helped move electron backscatter diffraction (EBSD) forward but lacks the ability to realistically capture the intensity of the bands in the patterns. In recent years, significant strides have been made to improve the simulation of EBSD patterns using a dynamical model of diffraction [1,2]. The ability to more accurately simulate diffraction has helped advance EBSD development in several ways.

    In this webinar, we briefly describe dynamical simulation of diffraction and three specific applications based on dynamical diffraction: reflector optimization [3], dictionary indexing [4], and background generation.

    [1] A. Winkelmann, C. Trager-Cowan, F. Sweeney, A. P. Day, P. Parbrook. (2007) “Many-Beam Dynamical Simulation of Electron Backscatter Diffraction Patterns”, Ultramicroscopy 107: 414-421.
    [2] P. G. Callahan, M. De Graef. (2013) “Dynamical Electron Backscatter Diffraction Patterns. Part I: Pattern Simulations”, Microscopy and Microanalysis 19: 1255-1265.
    [3] S. I. Wright, S. Singh, M. De Graef. (2019) “Reflector Selection for the Indexing of Electron Back-Scatter Diffraction Patterns”, Microscopy and Microanalysis 25: 675-681.
    [4] Y.H. Chen, S. U. Park, D. Wei, G. Newstadt, M.A. Jackson, J.P. Simmons, M. De Graef, A.O. Hero. (2015) “A dictionary approach to electron backscatter diffraction indexing”, Microscopy and Microanalysis 21: 739-752.


  • Sample Preparation
    EBSD auch was für EDX Nutzer?

    Thursday, June 6, 2019

    EBSD (Electron Backscatter Diffraction), was ist das denn, denkt sich mancher EDX Nutzer. In diesem Webinar geht es um eine erste Übersicht zur Elektronenbeugung am Elektronenmikroskop. Sind die gewonnen Informationen für irgendwas gut. Wie funktioniert EBSD und macht die Methode meine EDX Ergebnisse nützlicher, um brennende analytische Fragen bestehender Probleme zu klären und ein besseres Verständnis der eingesetzten Materialien zu erhalten.


  • Register for the "Applications of High-Speed CMOS Cameras for EBSD Microstructural Analysis" webinar
    Applications of High-Speed CMOS Cameras for EBSD Microstructural Analysis

    Thursday, March 28, 2019

    The recent adoption of CMOS-based cameras for the collection of Electron Backscatter Diffraction (EBSD) patterns has unlocked faster collection speeds at higher pixel resolution. This technology enables rapid and accurate microstructural characterization of a wide range of materials. This presentation introduces EDAX’s new Velocity CMOS-based camera, and presents numerous application examples. Microstructural characterization strategies utilizing this new technology are also discussed.


  • Register for the EDS in the TEM: Fundamentals and Principles webinar
    EDS in the TEM: Fundamentals and Principles

    Thursday, February 21, 2019

    While the vast majority of Energy Dispersive X-ray Spectroscopy (EDS) systems are mounted on Scanning Electron Microscopes (SEM), the incorporation of an EDS system on a Transmission Electron Microscopes (TEM) gives access to the same wealth of compositional information but on a scale much smaller than what is achievable in the SEM. However, the TEM poses a very different set of challenges both from a hardware and analytical point of view compared to the SEM.

    In this webinar, we go through the fundamentals of X-ray generation, detection, and analysis in the TEM with a focus on the challenges that are unique to the TEM. This includes holder influence, geometry optimization, quantification and correction routines as well as performance metrics such as Fiori number and artefact peaks.


  • Register for the "EDS Mapping: Data Collection, Representation, Extraction, and Mining" webinar

    Tuesday, January 29, 2019



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