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Webinars

  • Register for the "Current Issues with Data Presentation and Publication" webinar
    Current Issues with Data Presentation and Publication

    Thursday, September 15, 2022

    Electron Backscatter Diffraction (EBSD) has become a common technique used in the characterization of crystalline materials in the Scanning Electron Microscope (SEM). A quick literature survey shows that since 1997, there have been over 29,000 individual publications that mention the EBSD technique. Unfortunately, there has been very little effort to discuss or standardize how or what should be included when EBSD data is presented. This presentation will briefly introduce the technique of EBSD. The discussion will then turn to appropriate ways to present EBSD data and some of the problems and pitfalls that have been commonly observed in the published literature. These include proper use of reference frames, the ethics of data “cleaning”, what can we really tell about a sample’s grain size from a single section, what IPF maps to present and how to describe them so that they are useful to the reader, what do we need to provide along with our pretty EBSD maps to make them most useful, and finally data sample size. Careful and thoughtful presentation of EBSD data can allow the technique to progress beyond the creation of pretty pictures and to allow EBSD to become accepted as a quantitative characterization technique.

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  • Register for the Developing Clarity – Applications of Direct Detection for Electron Backscatter Diffraction webinar
    Clarity 直接検出型EBSD検出器のご紹介

    Wednesday, September 14, 2022

    Clarityは、電子直接検出(Direction Detection :DD)技術を採用した世界初の商業用EBSD検出器です。この技術はリードノイズゼロのセンサーを使用し、従来のEBSD検出器の光学系で生成されたアーティファクトを除去することで、感度とパターンのクオリティを大幅に向上させます。Clarityは単一電子感度を備えているため、ロードーズ測定が可能です。このセミナーではClarityのテクノロジーについて説明し、従来のEBSDでは分析が困難なビームセンシティブな試料のアプリケーションをご紹介します。

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  • Determining Lithium Content by the Composition by Difference Method
    Determining Lithium Content by the Composition by Difference Method

    Thursday, June 30, 2022

    Lithium (Li)-ion batteries have been adopted for a wide range of energy storage applications due to their outstanding energy density and low mass compared to other technologies. However, there remains considerable scope for energy capacity and efficiency improvements by optimizing devices and materials used in their construction. In particular, microstructural and compositional analysis has proven challenging at the micro- and nano-scales with structure evolution and degradation mechanisms due to lack of understooding at these length scales. In this webinar, we introduce a new technique that offers the potential to recharge research of Li-ion batteries, as well as Li alloys used in aerospace applications—the lithium composition by difference method (Li-CDM). For the first time, we demonstrate the microscale lithium distribution quantitatively from a range of lithium compounds and alloys. Going forward, this new characterization method looks set to play a vital role in lithium materials research.

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  • Register for the Developing Clarity – Applications of Direct Detection for Electron Backscatter Diffraction webinar
    Developing Clarity – Applications of Direct Detection for Electron Backscatter Diffraction

    Thursday, May 19, 2022

    The Clarity EBSD Detector is the first and only commercially available Electron Backscatter Diffraction (EBSD) detector. With single-electron sensitivity, zero noise, and zero distortion, the Clarity can be used to characterize both new and legacy applications. Recently, EDAX announced the addition of the Clarity Super to the direct detection product line. This detector is optimized for high performance down to 3 kV. The combination of performance at both low beam currents and low beam energies makes the Clarity Super the ideal detector for the analysis of beam-sensitive materials. The quality of the high-fidelity EBSD patterns obtained with the Clarity also enables applications for HR-EBSD and pseudosymmetry analysis. The Clarity EBSD Detector Series will be presented in this webinar, and a range of applications will be discussed.

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  • Register for the "Comparisons between 2D and 3D experimental mesoscale measurements to examine slip transfer through grain boundaries in titanium and Ti-5Al-2.5Sn" webinar
    Comparisons between 2D and 3D experimental mesoscale measurements to examine slip transfer through grain boundaries in titanium and Ti-5Al-2.5Sn

    Thursday, April 28, 2022

    Identification of slip processes at grain boundaries is complex and challenging for both characterization and modeling. To enable modeling of heterogeneous deformation near grain boundaries, credible observations with good statistics are necessary, as the size of grain boundary misorientation space combined with slip system activation is huge. Recent work with 2D characterization of slip transfer in Ti-5Al-2.5Sn (direct or indirect transmission of dislocations through grain boundaries) provides statistics. However, the detail provided by Transmission Electron Microscope (TEM) requires effort that precludes gathering of such statistics. Furthermore, extraction of a TEM foil removes the state of stress that drove the slip transfer process and observations may not represent the dislocation configuration that took place during deformation. To overcome this limitation, a 3D investigation using far-field measurements in pure Ti to examine twin nucleation by slip transfer reveals different constraints than observed in surface measurements. Use of differential aperture X-ray microscopy on in-situ deformation enables micron scale quantification of geometrically necessary dislocations (GNDs) present near grain boundaries while under load, so that the concurrent local elastic stress state associated with local heterogeneous deformation near boundaries can also be extracted. Insights gained from analysis of GNDs and local stress states indicates that the local kinematics of slip even along a single grain boundary vary greatly from place to place.

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  • Register for the How to Correlate Micro-XRF and SEM-EDS for Optimal X-ray Characterization of Materials webinar
    X線マイクロアナリシス ~ミクロからマクロまでSEM+EDS/WDS とμEDXRF分析~

    Friday, February 25, 2022

    微小部の元素分析手法は色々ありますが、分析装置の励起源や検出器の違いで得られる結果が異なります。

    このウェビナーでは、弊社の製品で測定した試料の分析結果を比較しながら、各装置の特長やアプリケーションデータをご紹介します。

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  • Register for the How to Correlate Micro-XRF and SEM-EDS for Optimal X-ray Characterization of Materials webinar
    How to Correlate Micro-XRF and SEM-EDS for Optimal X-ray Characterization of Materials

    Thursday, January 20, 2022

    Micro X-ray Fluorescence (Micro-XRF) is a non-destructive analytical technique that utilizes the benefits of conventional XRF while implementing micro-spot X-rays with a moveable stage. It does not require sample preparation and coating, and the sample shape and height can be irregular. This technique improves detection limits for higher Z elements and greater analysis depth than can be achieved with Energy Dispersive Spectroscopy (EDS) in a Scanning Electron Microscope (SEM). SEM-EDS has higher light element sensitivity and is more appropriate for smaller-scale features and more precise locations. Both techniques allow spectrum acquisition, linescan, and mapping. This webinar will look at the relative advantages of SEM-EDS and benchtop Micro-XRF analysis and suggest how the two techniques can be used together for the optimal X-ray characterization of materials.

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