Skip to content
English
Search

Webinars

  • {3}

    {1}

    {4}

    Click here to register

  • EBSD and S/TEM study of the impact of dopants on deformation behavior in WC-Co

    Thursday, June 18, 2026

    Tungsten carbide-cobalt (WC-Co) hardmetals underpin some of the most demanding industrial applications, yet the microstructural mechanisms governing their high-temperature deformation remain incompletely understood. Here, two WC-10 wt.% Co materials whose only processing difference is their dopants; 1.3 wt.% Cr, and 1.3 wt. % Cr(+Ti,V) – were deformed via four-point bending at 1100 °C, and EBSD maps acquired across the resulting strain gradient. Contiguity, Σ2 boundary fraction and {10–10} plane prevalence all indicate that deformation drives WC/WC boundaries toward lower-energy configurations – a grain boundary-mediated process strongly modulated by dopant content. Minor additions, such as Ti and V, measurably alter this response, demonstrating that compositional tailoring is a powerful lever for optimizing hardmetal performance. STEM and STEM-EDS analysis support these EBSD findings, providing evidence for the power of EBSD as a time and labor-efficient alternative to HREM techniques.

    Download

  • Advancing EBSD for beam-sensitive materials: From noise to insights

    Thursday, March 26, 2026

    Electron backscatter diffraction (EBSD) is a powerful technique for revealing detailed information about a sample’s microstructure, including crystal orientation and phase distribution at the nanoscale. With its high spatial resolution and robustness, EBSD has become widely used in mineralogy, solid-state chemistry, and other fields.

    However, like any method, EBSD has its own limitations. Because it requires a strong signal, EBSD demands high electron-beam doses that not every material can withstand. This makes it challenging to apply EBSD to beam-sensitive materials, such as organic perovskites, which are promising materials for solar-cell applications.

    In this webinar, we will present strategies for overcoming these limitations using the EDAX® Clarity™ system with a hybrid-pixel detector, enabling low-dose EBSD on perovskites and other beam-sensitive materials, and demonstrate the insights obtained by combining this high-sensitivity system with spherical indexing in EDAX OIM Analysis™.

    Download

  • マイクロXRF分析の新たなレベルを体験可能なEDAX Orbis IIのご紹介

    Wednesday, February 18, 2026

    実績のあるEDAX® Orbis™システムをベースに開発されたOrbis IIは、比類のないスループット、優れた感度、そして直感的な次世代ソフトウェアインターフェースを備え、マイクロXRF分析の新たなベンチマークを確立します。革新的な設計により、幅広いアプリケーションにおいて正確かつ効率的な元素分析を実現します。EDAX Orbis IIが分析能力を向上させ、ワークフローを効率化し、より迅速かつ正確な結果を得るためにどのように役立つか、ぜひウェビナーにご参加ください。

    Download