• Register for the "Applications of High-Speed CMOS Cameras for EBSD Microstructural Analysis" webinar
    Applications of High-Speed CMOS Cameras for EBSD Microstructural Analysis

    Thursday, March 28, 2019

    The recent adoption of CMOS-based cameras for the collection of Electron Backscatter Diffraction (EBSD) patterns has unlocked faster collection speeds at higher pixel resolution. This technology enables rapid and accurate microstructural characterization of a wide range of materials. This presentation introduces EDAX’s new Velocity CMOS-based camera, and presents numerous application examples. Microstructural characterization strategies utilizing this new technology are also discussed.


  • Register for the EDS in the TEM: Fundamentals and Principles webinar
    EDS in the TEM: Fundamentals and Principles

    Thursday, February 21, 2019

    While the vast majority of Energy Dispersive X-ray Spectroscopy (EDS) systems are mounted on Scanning Electron Microscopes (SEM), the incorporation of an EDS system on a Transmission Electron Microscopes (TEM) gives access to the same wealth of compositional information but on a scale much smaller than what is achievable in the SEM. However, the TEM poses a very different set of challenges both from a hardware and analytical point of view compared to the SEM.

    In this webinar, we go through the fundamentals of X-ray generation, detection, and analysis in the TEM with a focus on the challenges that are unique to the TEM. This includes holder influence, geometry optimization, quantification and correction routines as well as performance metrics such as Fiori number and artefact peaks.


  • Register for the "EDS Mapping: Data Collection, Representation, Extraction, and Mining" webinar

    Tuesday, January 29, 2019



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