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Webinars

  • Register for the "APEX™ 2.0 for EDS - What's New and Key Features"
    アメテック株式会社エダックスウェビナー、“SEM+EDS分析の基礎、APEXソフトウェアの活用”

    Wednesday, September 22, 2021

    いつも同じ条件でEDS分析していませんか?
    試料の状態や測定条件を考慮して分析を行う必要があります。また、重複元素のピークの分離、定量精度、マッピングデータの解釈に留意する必要があります。
    このウェビナーでは、分析条件や定性・定量分析、マッピングの注意点などEDS分析の基礎を解説し、最新APEXソフトウェアの活用方法や特長をご紹介します。

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  • Register for the "Low-Dose EBSD Analysis of Beam-Sensitive Materials" webinar
    Low-Dose EBSD Analysis of Beam-Sensitive Materials

    Thursday, September 9, 2021

    EBSD pattern collection on beam-sensitive materials is limited by the beam current and accelerating voltage that can be applied without damaging the crystal structure. In this webinar, we will use a Clarity™ detector to explore the minimum number of electrons required to produce indexable diffraction patterns as a function of backscatter coefficient, fraction of diffracted electrons, and accelerating voltage. In many cases, indexable patterns can already be obtained using beam currents in the pA range with less than 20 electrons per pixel. When the obtained diffracted intensity is still insufficient to get good indexing, the quality of extremely poor patterns can be enhanced using NPAR™ by considering adjacent EBSD patterns without the need to increase the beam current. Low-dose mapping will be illustrated with examples of biominerals and perovskite photovoltaic materials.

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  • Register for the "Improving sample analysis using combined energy dispersive and cathodoluminescence spectroscopies" webinar
    Improving Sample Analysis Using Combined Energy Dispersive and Cathodoluminescence Spectroscopies

    Tuesday, August 31, 2021

    Microanalysis with the scanning electron microscope (SEM) is a key technique to understanding the geological history of rocks, minerals, and gems. Energy-dispersive X-ray spectroscopy (EDS) and cathodoluminescence (CL) spectroscopy are commonly used to determine the elemental composition and trace element chemistry, enabling the geological history to be reconstructed. Despite the complementary nature of EDS and CL analysis, these characterization techniques are rarely performed simultaneously due to incompatibilities. However, recent developments have overcome this hurdle. In this webinar, we will review how the simultaneous capture of EDS and CL spectroscopic data proved invaluable in analyzing a chondritic meteorite collected in Antarctica – Miller Range 090010, which contains some of the earliest formed solids in the solar system.

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  • Die Mehrphasenanalyse mit der neuen innovativen APEX Software
    Die Mehrphasenanalyse mit der neuen innovativen APEX Software

    Tuesday, July 27, 2021

    Die Darstellung einer Hochtemperaturreaktion von MgO und Al2O3 zum Spinell der Form MgAl2O4 ist mit dem Phasenmapping der APEX Software möglich. Mit den Phasen Maps können dünne Schichten sowie unterschiedliche Phasen präzise und schnell identifiziert und visualisiert werden. Die Dicke der Reaktionsfläche ist abhängig von der Temperatur. Die tatsächliche Temperatur im Inneren dieses Konstrukts wird mit dem Pt-Thermoelement bestimmt.

    Die Abbildung von schnellen und qualitativ hochwertigen Maps, Montage Maps und Phasen Maps mit hohen Zählraten im niederenergetischen Bereich sind eines der Stärken der neuen APEX Software. Das Mapping dient zur qualitativen Abbildung des Materials und ist eine gängige Methode. Die Trennung überlappender Peaks ist mit der Darstellung der Ergebnisse als ROI- und NET-Mapping möglich. Ein neuer Weg einen großen Bereich abzubilden, ist mit dem Montage Mapping möglich. Phasen werden in Bezug auf die chemische Zusammensetzung vollautomatisch bestimmt und mit einer Farbcodierung hervorgehoben. Der CMOS basierte Vorverstärker ermöglicht ein schnelles Mapping mit hoher Zählrate ohne Beeinträchtigung der Auflösung. Mit dem ultradünnen Si3N4 Fenster steigt die Leistung der Lichtelemente bei Analysen mit niedrigen Beschleunigungsspannungen, sodass begleitend zum Bildgebungsworkflow die anspruchsvolle Quantifizierung stattfindet.

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  • EDAX EDS Powered by Gatan、EDAXとGatanのコラボレーションによる最新のTEM/STEMアプリケーションのご紹介
    EDAX EDS Powered by Gatan、EDAXとGatanのコラボレーションによる最新のTEM/STEMアプリケーションのご紹介

    Thursday, June 3, 2021

    EDAX と Gatan のコラボレーションによる最新の製品、EDAX EDS Powered by Gatan をご紹介します。EDAX Elite Tシリコンドリフト検出器とGatan GMS(DigitalMicrograph)ソフトウェアの組み合わせによる、最新のTEM/STEMアプリケーションとなります。走査透過型電子顕微鏡(STEM)のアプリケーションにおいて、最も直感的で操作が簡単なエネルギー分散型X線分析(EDS)を提供するためにGatanとEDAXが力を合わせました。GMS(DigitalMicrograph)ソフトウェアは様々な像観察や分析手法に対するTEM/STEMの実験のコントロールと解析においてスタンダードとなっていますが、この新しいシステムでは、GMS(DigitalMicrograph)ソフトウェアに、EDAX EDSのデータ取得と信号処理系を統合致しました。EDAXのElite Tシリコンドリフト型検出器は、検出効率を最大化し軽元素の検出性能を最適化しています。これにより、高感度のEDS Elite Tの信号にGMS(DigitalMicrograph)ソフトウェアの高度な像観察や分析手法を適用する事が可能となります。結果、TEM/STEMアプリケーションのトータルソリューションとして、EDAX/Gatanのシステムは、単一の統合されたソフトウェアでEDSとEELS信号の同時取得などの幅広いアプリケーションへの対応が可能となります。 本Webinarでは、EDAX EDS Powered by Gatanの製品に関する最新情報をご紹介致します。

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  • Register for the "Combining EBSD with Serial-Sectioning to Investigate Additively Manufactured Microstructures" webinar
    Combining EBSD with Serial-Sectioning to Investigate Additively Manufactured Microstructures

    Thursday, May 27, 2021

    Additive manufacturing (AM) has presented a new processing route for structural alloys, allowing for many exciting opportunities to create parts and components that either were too complex or expensive to make using traditional methods. However, not only are the possible part geometries complex, but with processing length-scales that are near the microstructural length-scales, and cooling rates that are much higher than normal, the microstructures that are formed during AM processing are much more complex than formed in traditional processing. Three-dimensional characterization can provide a much clearer picture of how these complex structures relate to the localized processing, and how this information can be used to quickly validate the AM processing and parts. In this webinar, we will present how automated EBSD mapping is essential to combine with serial sectioning using the Robotic Serial Sectioning System for 3D (RS3D) to clearly reconstruct the 3D microstructures in AM materials. This will include a discussion on the data collection, reconstruction, and analysis of the serial-section data. Additionally, we will present a short overview of the NLPAR algorithm for pattern processing, and how it greatly shortened the time required to collect the serial-sectioned data.

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  • Ein neuer Weg der Materialanalyse mit APEX 2.0 EDX
    A New Way to Analyze Materials with APEX 2.1 Software for EDS

    Tuesday, May 4, 2021

    A whole new world is now available to optimize and analyze Energy Dispersive Spectroscopy (EDS) data in the APEX™ Software. This new version provides many innovative features and capabilities that influence detector performance and data quality. Combined with the ultra-thin silicon nitride window in our EDS detectors, it guarantees high intensity in the light element region and provides gorgeous analysis.

    The user-friendly interface of the pioneering APEX Software offers simultaneous real-time quantification results in Live mode and data post-processing in Review mode. Novel applications are possible with additional features like Batch Mode, Montage Mapping, and Phase Mapping.

    This webinar aims to introduce you to the world of APEX 2.1 Software for EDS and all its features.

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  • Register for the "How to Gain More Insight with Dual EDS Detectors" webinar
    デュアルEDS検出器でより良い結果を得る方法

    Friday, April 23, 2021

    デュアル検出器は、スループットを2倍にすることで、効率的なデータ収集や高品質のデータが得られます。同じアナライザーを使用した1本の大面積検出器と比較して、デュアル検出器システムは、スループットを犠牲にせず、高いエネルギー分解能で分析することができます。さらに粒子や粗い表面のサンプルでは、サンプルの形状に起因する影の影響を軽減することが出来ます。このウェビナーでは、SEM用シリコンナイトライドEDS検出器の特長とAPEXソフトウェアのデュアル検出器機能を紹介し、その利点と限界を説明するアプリケーション例を発表します。

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  • Sign up for the "Using EBSD to Investigate Steel Microstructures" webinar
    Using EBSD to Investigate Steel Microstructures

    Thursday, April 22, 2021

    Electron Backscatter Diffraction (EBSD) is a powerful microanalysis characterization tool. In this webinar, its applications to analyze and understand the microstructure of different steel alloys will be presented. EBSD can quickly and easily measure both the crystallographic orientation and phase with nanometer-scale spatial resolution. This information can be used to investigate the prior austenite grain size, the fraction of retained austenite, and the degree of deformation within a material. For additively manufactured steel alloys, EBSD can reveal the complex microstructures that develop over large spatial length scales to help optimize build parameters. EBSD can also be combined with chemical information collected via Energy Dispersive Spectroscopy (EDS) to measure phases more accurately. Examples of using this information in nitrided and oxidized steel will be presented. Finally, recent developments in EBSD technology and how they can improve these measurements will also be discussed.

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  • Register for the "From Hoover to Fighter Jets: A Vision and a Framework for Future Aerospace Metals Processing Research" webinar
    From Hoover to Fighter Jets: A Vision and a Framework for Future Aerospace Metals Processing Research

    Thursday, April 15, 2021

    Microstructures retain a “memory” of prior processing history through the size, shape, orientation, and spatial distributions of phases and defects. A complex interplay exists between the grain size distribution, heterogeneity of stored strain, and joint size-spatial distributions of secondary phases. It has long been a goal of the materials research community to develop an understanding of the physical relationships between these features using advanced characterization and simulation tools, then apply that understanding toward the design of revolutionary new materials. Advancements in materials face many challenges, however, in transitioning from the research laboratory into demanding applications. This talk will frame these challenges and present a vision for the path forward by linking together a number of seemingly unrelated things: Herbert Hoover, the 31st president of the United States; a $10 toaster; beverage cans; electron backscatter diffraction; robotic vacuum cleaners; and a $100 million fighter jet.

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  • Register for the "Broad Argon Beam Tool for EBSD Preparation" webinar
    Gatan离子抛光& EDAX EBSD——EBSD的优化解决方案

    Tuesday, March 30, 2021

    EBSD能提供关于材料性能结构的各种信息,在材料表征领域具有非常广泛的应用。良好的样品制备是做好EBSD检测的前提,也是很多样品进行EBSD测试的痛点及难点。本次讲座主要讲述Al,Mg这类易氧化的金属/合金,多相样品以及半导体器件如何用Gatan离子抛光设备来优化EBSD制样过程,并最终得到优化的EBSD数据来分析材料性能及器件特性。

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  • Register for the "Clarity:超灵敏的直接电子检测EBSD探测器" webinar presented in Chinese
    Clarity:超灵敏的直接电子检测EBSD探测器

    Thursday, March 4, 2021

    EDAX推出的全新的直接电子检测EBSD探测器将EBSD的发展推向了新的高度。其超高灵敏度,低电压低束流要求及极高的花样清晰度,拓宽了商用EBSD的应用范围,尤其是对电子束敏感材料及形变材料的表征方面。本次讲座将介绍Clarity的特性并以一些事例介绍其应用。

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  • Register for the "How to Gain More Insight with Dual EDS Detectors" webinar
    How to Gain More Insight with Dual EDS Detectors

    Thursday, February 25, 2021

    Dual detectors result in more efficient data collection or higher data quality by doubling the throughput. Compared to one larger size detector with the same electronics, a dual detector system can achieve a better resolution without sacrificing throughput. Dual detectors improve quantitative results on samples with flat and smooth surfaces. When dealing with coarse particles or samples with rough surfaces, dual detectors are helpful for mitigating shadowing artifacts associated with sample topography. This webinar will review dual detector technology and associated features in APEX software. Application examples will be presented to illustrate the advantages and limitations of this technology.   

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  • Register for the "Broad Argon Beam Tool for EBSD Preparation" webinar
    EBSD用試料作製のためのブロードアルゴンビームツール

    Thursday, February 25, 2021

    電子線後方散乱回折法 (EBSD) はSEMにおける材料解析において必須の手法です。EBSDは結晶粒径、集合組織、結晶方位といったエネルギー分散型X線分析では得ることが出来ない情報が取得可能であり、第二相の識別や主相に対する第二相の方位関係が判ります。

    EBSDに関して重要な点は、試料最表面から10nm以下の領域からの信号を利用していることです。それゆえ、その試料作製は難しいとされてきました。最も一般的な試料作製法である機械研磨では工程が複雑になりがちで、またソフトマテリアルや多孔質材料、大きく異なる相からなる多相材料などに対しては研磨が困難であり、良好な結果を得るためには試料作製に対する豊富な経験が必要とされます。

    ブロードアルゴンビームツールはこれらの試料作製の複雑さから解放します。本ウェビナーでは、GatanのPECS IIとEBSDにおけるアドバンテージをEDAXとの共同発表でご紹介します。Gatanのブロードアルゴンビームツールによって、機械研磨による試料作製では不可能であったEBSD測定が実現されます。

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  • Register for the "Broad Argon Beam Tool for EBSD Preparation" webinar
    Broad Argon Beam Tool for EBSD Preparation

    Thursday, February 4, 2021

    Electron backscatter diffraction (EBSD) is a critical technique for materials analysis in an SEM. EBSD provides far more than energy dispersive x-ray spectroscopy in that grain size, texture, grain orientation, and in many cases, secondary phases can be identified and their relationship in terms of grain orientation to the primary phase. An important point to appreciate about EBSD is that the signal comes from less than the top 10 nm of the surface. Therefore, sample preparation has traditionally been difficult. Mechanical preparation, the most common technique, may be complicated, have difficulties with very dissimilar materials, and usually requires an experienced metallographer to succeed. Broad argon beam tools nearly eliminate these complexities. Here, we will describe the Gatan PECS II and an EBSD results challenge that we worked on with our sister company—EDAX. In all cases, Gatan’s broad argon beam tool successfully enabled EBSD results that were previously unconceivable with mechanical preparation.

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  • Register for the "How to Reconstruct Pre-Transformation Microstructures in OIM" webinar
    How to Reconstruct Pre-Transformation Microstructures in OIM

    Thursday, January 21, 2021

    When a material undergoes a transformation from one crystallographic phase to another, a grain in the original microstructure may transform into several different crystallographic variants. If the transformed microstructure is scanned by EBSD, it is possible to reconstruct the pre-transformation microstructure from the EBSD results (assuming a given orientation relationship). This webinar will discuss the reconstruction algorithm implemented in OIM Analysis™ and present some case studies illustrating its capabilities and limitations.

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  • Ein neuer Weg der Materialanalyse mit APEX 2.0 EDX
    Ein neuer Weg der Materialanalyse mit APEX 2.0 EDX

    Tuesday, January 19, 2021

    Durch systematische Optimierung der APEX™ Software und der damit verbundenen Mikroanalyse haben wir eine neue Welt der EDX Analyse betreten. APEX 2.0 EDX bietet eine Vielzahl an Funktionalitäten und Kapazitäten an. Bestimmende Einflussfaktoren beeinträchtigen die Detektionsperformance und die daraus resultierende Analyse. Durch das ultradünne Keramikfenster ist eine hohe Zählrate im Leichtelementbereich erlaubt.

    Die benutzerfreundliche Oberfläche der innovativen Software bietet ein simultanes Aufnehmen qualitativer und quantitativer Ergebnisse, sowie das Arbeiten im Review Modus. Mit seinen neuartigen Funktionen wie dem Batchmodus, Montage Mapping und Phasenmapping werden neue Darstellungen möglich.

    Dieser Webcast wird allen einen neuen Einblick in die EDX Welt und in die APEX 2.0 EDX Software verschaffen.

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