Webinars

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  • Register for the "How to Optimize Backgrounds for EBSD Analysis on Multiphase Samples using OIM Analysis™ v8" - September 27, 2018
    How to Optimize Backgrounds for EBSD Analysis on Multiphase Samples using OIM Analysis™ v8

    Thursday, September 27, 2018

    Getting a good background on multiphase samples can be tricky. Intensity can vary between the phases by enough to cause oversaturation in one phase and undersaturation in another. This can cause issues with band detection and pattern indexing. A different approach is needed to overcome this challenge.

    Post Processing Background options in OIM Analysis™ v8 now allow users to pick a background on any partitionable value to help them get the best results from the data. The same holds true for other indexing parameters such as Hough Setting. This webinar explains how to make and use these backgrounds in OIM Analysis™ v8.

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  • Register for the Can Direct Electron Detection be Used to Improve EBSD Analysis? Webinar - May 17
    Can Direct Electron Detection be Used to Improve EBSD Analysis?

    Thursday, May 17, 2018

    Electron Backscatter Diffraction (EBSD) is a very important microanalytical technique to measure and understand the crystallographic arrangements in materials. EBSD detection hardware has not changed significantly in the decades since its commercialization and performance has not always kept up with customer and sample needs.

    A new type of direct electron detection hardware has been reported, which borrows technology from other applications. In this webinar, we show a comparison of this new technology to current commercial systems and also examine its performance considerations.

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  • Register for the "How to Get the Most out of Orbis micro-XRF Measurements with Multiple Acquisition Conditions" webinar - April 26
    How to Get the Most out of Orbis micro-XRF Measurements with Multiple Acquisition Conditions

    Thursday, April 26, 2018

    Measurement of trace elements can be improved by optimizing micro-XRF acquisition conditions. However, it may take more than one set of acquisition conditions to get the best results for various trace elements.

    Spectral data can be collected under varying conditions on the Orbis micro-XRF system to minimize the effects of background, tube scatter and spectral artifacts.

    In this webinar, we show some examples using glasses and gemstones, but this technique also has applications in a wide variety of fields including forensics, industrial QC/QA, gemology, geology, metal alloys and more.

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  • Register for the "EDS Mapping: Data Collection, Representation, Extraction, and Mining" webinar on April 11
    EDS Mapping: Data Collection, Representation, Extraction, and Mining

    Wednesday, April 11, 2018

    In this webinar, we take a look at how different microscope settings affect map output and quality under high vacuum and variable pressure conditions and what information can be gained by varying these settings. Based on several examples, we go through the various map types that can be calculated based on the raw data and discuss the difference between them. We also cover some of the various options for extracting data from the maps in order to access information that is not obvious or accessible at first glance.

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  • Sample Preparation
    EBSD for the EDS User: Understanding the Hows and Whys of Electron Backscatter Diffraction

    Thursday, February 15, 2018

    To the EDS user, an Electron Backscatter Diffraction (EBSD) system can seem like a magical box.

    In this webinar, we peel back the layers and get to the core concepts on a basic level to show both how EBSD works and how EBSD data can complement nearly any EDS dataset as you seek solutions to your problems or a better understanding of your samples.

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  • How to Analyze Multiphase Samples with CompoMaps and Spectrum Libraries
    How To Analyze Multiphase samples with CompoMaps and Spectrum Libraries

    Tuesday, January 23, 2018

    In this webinar, we explore how quantitative maps are used for understanding the distribution of phases in a map set, and then further analyze the map results with the power of a known standards library.

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