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  • 最近のOIM Analysisの解析機能の進化

    Tuesday, December 16, 2025

    今回はOIM Analysis™9のGUIの変更、解析速度の向上を含め、OIM Analysisではどのような解析ができるのについて説明します。 OIM AnalysisにはIPFマップなどの結晶方位以外に方位差・結晶粒・相・指数付け・機械的特性等を解析するために50以上のパラメータを用意しており、材料の微細組織の定量的な解析を行うことができます。さらにそれぞれの解析時に定義変更や抽出を行うことで、非常に詳細な解析が可能になります。さらに、ハイライト機能を用いることで、マップデータとチャート、集合組織の分布をリンクさせ、相互関係を調べることが可能になります。また、Spherical indexingによるEBSD パターンの再指数付け機能が実装され、これまでEBSDにて分析することが難しかった材料の方位・相解析を行うことが可能になっております。
    OIM Analysis 9.1では基本的な機能のショートカットアイコンのカスタマイズ機能やカスタムテンプレートを使用することのできる新しいリボンレイアウトを導入しました。
    リボンデザイン導入に合わせ、リボン部から直接テンプレートの適用や図の出力、一部の簡易的な条件設定変更をできるようになりました。 過去を踏襲していたすべてのコードを書き直し、マップの描画・図の保存・各種計算を非常に高速で行うことができるようになりました。 このウェビナーでは、OIM Analysis9を用いて、基本的なデータ解析から応用的な解析方法に関してご紹介します。

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  • Practical aspects of wavelength dispersive spectroscopy: Use cases, setup, and optimization

    Thursday, November 20, 2025

    In this webinar, we explore wavelength dispersive spectroscopy (WDS) — when to use it, why it remains a vital tool in modern microanalysis, and how to get the most from your measurements. We’ll discuss key considerations for setup and calibration, practical workflow strategies, and expert tips to optimize accuracy and efficiency. Whether you’re new to WDS or looking to refine your techniques, this webinar will help you leverage WDS for reliable, high-resolution elemental analysis.

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  • Advances in EBSD for geological materials: The impact of spherical indexing and experimental master pattern simulation

    Thursday, November 13, 2025

    Recent advancements in EBSD analysis—especially the shift from Hough-based indexing to spherical indexing and the use of experimental master patterns—have significantly improved the characterization of geological materials. Traditional methods often struggled with rough surfaces, low-quality patterns, and complex crystallography, resulting in poor indexing success. Spherical indexing addresses these issues by matching entire EBSD patterns to master patterns, capturing subtle crystallographic details that older methods missed. Using experimentally acquired patterns instead of simulated ones further enhances accuracy, particularly for challenging samples like solid solutions or multiphase minerals.

    This new approach also improves angular precision, enabling better detection of orientation gradients and pseudosymmetry—common in many minerals. By leveraging full-pattern information rather than just Kikuchi bands, researchers can achieve more sensitive phase differentiation and higher-quality EBSD data. In this webinar, we’ll explore how spherical indexing can elevate your geological sample analysis and lead to more reliable, insightful results.

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  • Experience the next level of micro-XRF analysis with the EDAX Orbis II

    Thursday, September 25, 2025

    Building on the proven success of the original EDAX Orbis system, the Orbis II sets a new benchmark in micro-XRF analysis with unparalleled throughput, superior sensitivity, and an intuitive next-generation software interface. Its innovative design delivers precise and efficient elemental analysis across a wide range of applications. Join us to discover how the EDAX Orbis II can elevate your analytical capabilities, streamline workflows, and help you achieve faster, more accurate results with confidence.

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  • Spherical Index法によるEBSDの進化

    Thursday, March 13, 2025

    AMETEK/EDAX社にて開発されたEBSDの解析ソフト OIM Analysis９は、シミュレーションパターンを用いた高精度指数付けソフトウェアがオプションとして装備されています。

    本手法は角度空間上でシミュレーションパターンと実験パターンを比較することを行うことで、効率的に指数付けを行うことができ、１秒間に１万点以上の指数付けが可能になっております。

    従来のHough変換による指数付け法に比べ、ノイズの多いパターンの指数付けに強く、高い角度分解能の向上や、高度な相分離が可能になるという優れた特徴があります。

    本セミナーでは、Spherical Indexの原理と従来の指数付け法との違い、実際の解析事例を中心に紹介させていただきます。

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  • Getting the most out of your data: Advanced EBSD data processing and reporting in OIM Analysis 9

    Thursday, February 27, 2025

    For electron backscatter diffraction (EBSD) users, typical measurement results consist of maps and charts displaying the microstructure of the sample. In many cases, these may simply be generic maps like inverse pole figure (IPF) and image quality (IQ) maps, which can easily be generated with a single mouse click. In addition to these basic analysis options, the EDAX OIM Analysis™ software offers an extensive range of analytical tools to quantify many of your materials’ microstructure components. Customization of your analyses allows targeted and highly detailed analysis of specific features of the microstructure. Additionally, the highlighting capabilities focus on one of the main strengths of EBSD analysis: the location of each measurement point is known and can be linked to all available displays. The incorporation of EBSD pattern reprocessing with spherical indexing extends the analytical capabilities to materials that simply could not be measured before.
    To better lead users through all the capabilities, OIM Analysis 9.1 introduces a new ribbon bar layout that combines easy access to the basic analysis tools with powerful customization capabilities using templates. When a user needs to do repetitive analysis, for example, for quality control or to compare the microstructure of a set of samples after a series of experiments, an analysis needs only to be defined once in a template and can be easily repeated directly from the ribbon bar. Such templates can also be used to create custom reports that are automatically generated after data collection finishes. This webinar will guide you through the workflow and capabilities of OIM Analysis 9.1 from basic data analysis to automatic reporting.

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