• Register for the "Measuring Al Coatings with X-ray Fluorescence" webinar
    Measuring Al Coatings with X-ray Fluorescence (XRF)

    Tuesday, December 18, 2018

    Aluminum can be used to create durable, highly reflective coatings for both light and heat as well as coatings for semiconductor, protective and decorative applications. The use of X-ray Fluorescence is well known for the non-destructive, non-contact measurement of metal and metal oxide coatings. Typically, XRF coating measurements rely on the high energy of the fluoresced X-rays generated within the coating to measure the thickness of the coating. Paradoxically, the Al(K) line at 1.486 keV is rather weak for XRF coating measurements.

    This webinar describes measurement methods for aluminum coatings which allow coating measurements beyond the directly excited range using the EDAX SMX XRF analyzer.


  • Sample Preparation

    Wednesday, December 5, 2018



  • Texture Analysis via EBSD Webinar
    Texture Analysis via EBSD

    Thursday, November 29, 2018

    In the 1970’s Electron Backscatter Diffraction (EBSD) was a technique use by just a few researchers. At that time, a single EBSD pattern was recorded using film in the SEM and then analyzed with a protractor and a calculator. However, as computers began to be used for image analysis, Professor David Dingley at the University of Bristol built a computer system allowing a user to click on a few key features in the patterns to aid an operator in analyzing the patterns. When David presented his work to the texture community at the 8th International Conference of Textures of Materials (ICOTOM) in Santa Fe in 1987 the community recognized the potential of this “new” EBSD technique to quantitatively characterize the crystallographic texture of polycrystalline materials. Professor Brent Adams at Brigham Young University further recognized that the technique could allow the texture to be linked to the microstructure and his research group began working to automate the technique. The first fully automated maps we are familiar with today were achieved over the December 1991 semester break. A modern EBSD system is now assumed to be an automated tool capable of rapidly measuring individual crystallographic orientations for characterizing the microstructure of crystalline materials. Dr. Stuart Wright, a key member of the original team responsible for automating EBSD, will revisit the original motivation beyond those development efforts 30 years ago now; namely in characterizing crystallographic texture. The outline for the webinar will be as follows: Introduction to Crystallographic Texture, Orientation Distribution Function, Fiber Textures, Texture Components, Statistical Reliability, and Case Study.


  • Register for the "How to Optimize Backgrounds for EBSD Analysis on Multiphase Samples using OIM Analysis™ v8" - September 27, 2018
    How to Optimize Backgrounds for EBSD Analysis on Multiphase Samples using OIM Analysis™ v8

    Thursday, September 27, 2018

    Getting a good background on multiphase samples can be tricky. Intensity can vary between the phases by enough to cause oversaturation in one phase and undersaturation in another. This can cause issues with band detection and pattern indexing. A different approach is needed to overcome this challenge.

    Post Processing Background options in OIM Analysis™ v8 now allow users to pick a background on any partitionable value to help them get the best results from the data. The same holds true for other indexing parameters such as Hough Setting. This webinar explains how to make and use these backgrounds in OIM Analysis™ v8.


  • Register for the Can Direct Electron Detection be Used to Improve EBSD Analysis? Webinar - May 17
    Can Direct Electron Detection be Used to Improve EBSD Analysis?

    Thursday, May 17, 2018

    Electron Backscatter Diffraction (EBSD) is a very important microanalytical technique to measure and understand the crystallographic arrangements in materials. EBSD detection hardware has not changed significantly in the decades since its commercialization and performance has not always kept up with customer and sample needs.

    A new type of direct electron detection hardware has been reported, which borrows technology from other applications. In this webinar, we show a comparison of this new technology to current commercial systems and also examine its performance considerations.


  • Register for the "How to Get the Most out of Orbis micro-XRF Measurements with Multiple Acquisition Conditions" webinar - April 26
    How to Get the Most out of Orbis micro-XRF Measurements with Multiple Acquisition Conditions

    Thursday, April 26, 2018

    Measurement of trace elements can be improved by optimizing micro-XRF acquisition conditions. However, it may take more than one set of acquisition conditions to get the best results for various trace elements.

    Spectral data can be collected under varying conditions on the Orbis micro-XRF system to minimize the effects of background, tube scatter and spectral artifacts.

    In this webinar, we show some examples using glasses and gemstones, but this technique also has applications in a wide variety of fields including forensics, industrial QC/QA, gemology, geology, metal alloys and more.


  • Register for the "EDS Mapping: Data Collection, Representation, Extraction, and Mining" webinar on April 11
    EDS Mapping: Data Collection, Representation, Extraction, and Mining

    Wednesday, April 11, 2018

    In this webinar, we take a look at how different microscope settings affect map output and quality under high vacuum and variable pressure conditions and what information can be gained by varying these settings. Based on several examples, we go through the various map types that can be calculated based on the raw data and discuss the difference between them. We also cover some of the various options for extracting data from the maps in order to access information that is not obvious or accessible at first glance.


  • Sample Preparation
    EBSD for the EDS User: Understanding the Hows and Whys of Electron Backscatter Diffraction

    Thursday, February 15, 2018

    To the EDS user, an Electron Backscatter Diffraction (EBSD) system can seem like a magical box.

    In this webinar, we peel back the layers and get to the core concepts on a basic level to show both how EBSD works and how EBSD data can complement nearly any EDS dataset as you seek solutions to your problems or a better understanding of your samples.


  • How to Analyze Multiphase Samples with CompoMaps and Spectrum Libraries
    How To Analyze Multiphase samples with CompoMaps and Spectrum Libraries

    Tuesday, January 23, 2018

    In this webinar, we explore how quantitative maps are used for understanding the distribution of phases in a map set, and then further analyze the map results with the power of a known standards library.


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