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  • Energy Dispersive Spectroscopy

    EDAX EDS systems are used with electron microscopes to analyze the elements present in materials. The Element, Octane Elect and Octane Elite EDS Systems offer analysis options at different levels of sophistication.

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  • Electron Backscatter Diffraction

    EDAX EBSD tools provide leading performance and groundbreaking technology for analyzing crystallographic microstructure, using electron backscatter diffraction in the SEM.

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  • Wavelength Dispersive Spectrometry

    EDAX’s WDS tools complement EDS analysis for light element work or where elemental overlaps cause serious problems. The TEAM™ WDS Analysis System is available with two spectrometers.

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  • Integrated Technologies
    Integrated Technologies

    EDAX offers the seamless integration of EDS, EBSD, and WDS on the electron microscope, allowing the direct correlation between the physical properties, chemical composition, and crystallographic structure of materials.

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  • Micro X-ray Fluorescence

    EDAX’s Orbis Micro-XRF System signifies a new generation of micro X-ray fluorescence systems. The X-ray sources, optics, and detectors are guaranteed to provide superior analytical results.

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  • X-ray Metrology
    X-ray Metrology

    EDAX’s XLNCE X-ray Metrology products use non-destructive, X-ray Fluorescence (XRF) spectrometry to measure composition and film thickness of complex materials and multi-layer structures.

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