Breakthroughs and Enhancements of Microanalysis in the SEM
Tuesday, February 2, 2021
1:00 - 2:00 p.m. EST
Hosted by EDAX and the University of Pittsburgh
The abundance of signals generated in the Scanning Electron Microscope (SEM) makes it a unique tool for characterizing the crystallography, chemistry, and electronic state of a wide range of materials and specimens. As the techniques of Energy Dispersive X-Ray Spectroscopy (EDS), Electron Backscatter Diffraction (EBSD), Cathodoluminescence (CL), and Wavelength Dispersive Spectrometry (WDS) have evolved, the efficiency of the hardware and software employed for these techniques have also advanced. Examples include:
- EBSD indexing speeds are now over 4,500 patterns per second routinely yield rich, detailed maps of specimen crystallography, orientation, and texture.
- Direct Electron Detection allows high-fidelity EBSD mapping to occur at truly unprecedented beam currents as low as 10 pA.
- WDS High Collection Polycapillary optics enable spectral collection from 0.1 - 15 keV with spectral resolution dipping below 7 eV.
- Improvements in signal processing and data handling enable faster mapping for these techniques and allow for more efficient, streamlined data collection to improve the modern EM lab’s throughput.
In this talk, we will review the past, present, and future of EDS, EBSD, CL, and WDS techniques highlighting numerous technological advancements in the past 12 months that accelerate research discovery.
Click here to register.