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Electron Backscatter Diffraction (EBSD)

  • APEX™ Software
    APEX Software for EBSD

    APEX™ EBSD enables the characterization of Electron Backscatter Diffraction (EBSD) patterns within the user-friendly APEX software platform. The combination of powerful pattern analysis and an intuitive interface, allows you to collect and report high-quality data quickly, easily, and reliably.

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  • Orientation Imaging Microscopy (OIM) Analysis™
    OIM Analysis

    OIM Analysis™ is a technique based on the automated collection and analysis of EBSD patterns. This mapping data provides information on the orientation, phase distribution, grain size and shape, grain boundary

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  • Clarity™ EBSD Analysis System
    Clarity EBSD Detector Series

    The world’s first and only commercially available Electron Backscatter Diffraction (EBSD) detector with unparalleled performance at beam energies as low as 3 kV. This direct detection system is ideal for beam-sensitive perovskite, ceramic, or semiconductor materials that are difficult to analyze using conventional EBSD systems.

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  • Velocity™ EBSD Camera
    Velocity EBSD Camera Series

    The Velocity™ EBSD Camera Series offers high-speed EBSD mapping with the best indexing performance on real-world materials.

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  • DigiView EBSD Camera
    DigiView EBSD Camera

    The DigiView is a versatile high resolution digital camera. The CCD sensor has a particularly high Quantum Efficiency (QE), peaking in the blue-green spectrum for use with an optimized phosphor screen coating

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  • Neighbor Pattern Averaging & Reindexing (NPAR™)
    NPAR

    Neighbor Pattern Averaging & Reindexing (NPAR™) is an innovative approach to measuring crystallographic orientation from Electron Backscatter Diffraction (EBSD) patterns.

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  • OIM Matrix™
    OIM Matrix

    The OIM Matrix™ software package, which is offered as an option with OIM Analysis™, allows users to simulate EBSD patterns based on the physics of dynamical diffraction of electrons.

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  • Pattern Region of Interest Analysis System (PRIAS™)
    PRIAS

    Pattern Region of Interest Analysis System (PRIAS™) is a synergistic imaging technique to visualize microstructure and provide exciting new views of your materials. PRIAS™ enables users to quickly characterize

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  • Atom Probe Assist
    Atom Probe Assist

    Atom Probe Assist provides an innovative means of monitoring grain boundary position between FIB milling steps to ensure that a grain boundary is detected and correctly positioned for subsequent Atom Probe analysis.

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