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Electron backscatter diffraction (EBSD)

  • APEX™ Software
    EDAX APEX Software for EBSD

    EDAX APEX™ EBSD enables the characterization of electron backscatter diffraction (EBSD) patterns within the user-friendly APEX software platform.

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  • Orientation Imaging Microscopy (OIM) Analysis™ software
    EDAX OIM Analysis

    EDAX OIM Analysis™ is the premier microstructural visualization and analysis tool for interrogating and understanding electron backscatter diffraction (EBSD) mapping data.

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  • Clarity™ EBSD Analysis System
    EDAX Clarity EBSD Detector Series

    The world’s first and only commercially available electron backscatter diffraction (EBSD) detector with unparalleled performance as low as 3 kV. This direct detection system is ideal for beam-sensitive perovskite, ceramic, or semiconductor materials that are difficult to analyze using conventional EBSD systems.

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  • Velocity™ EBSD Camera
    EDAX Velocity EBSD Camera Series

    The EDAX Velocity™ EBSD camera series offers high-speed electron backscatter diffraction (EBSD) mapping with the best indexing performance on real-world materials.

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  • Neighbor Pattern Averaging & Reindexing (NPAR™)
    EDAX Neighbor Pattern Averaging & Reindexing (NPAR)

    EDAX NPAR™, or Neighbor Pattern Averaging & Reindexing, is an innovative approach to measuring crystallographic orientation from electron backscatter diffraction (EBSD) patterns.

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  • OIM Matrix™
    EDAX OIM Matrix

    EDAX OIM Matrix™ software elevates EBSD analysis by allowing users to simulate patterns based on the physics of the dynamical diffraction of electrons.

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  • Pattern Region of Interest Analysis System (PRIAS™)
    EDAX Pattern Region of Interest Analysis System (PRIAS)

    The EDAX Pattern Region of Interest Analysis System (PRIAS™) is a synergistic new approach for imaging and visualizing a material’s microstructural features.

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