EDAX’s TEAM™ EBSD Analysis System is the most comprehensive system available for analyzing crystalline microstructures. The solution obtains crystallographic orientation, grain-boundary character, and phase-
OIM Analysis™ is a technique based on the automated collection and analysis of EBSD patterns. This mapping data provides information on the orientation, phase distribution, grain size and shape, grain boundary
The Velocity™ EBSD Camera with CMOS technology offers the highest speeds for EBSD mapping with the best indexing performance on real world materials.
The Hikari EBSD Camera Series is the next generation in electron backscatter diffraction (EBSD) cameras offering outstanding performance across the complete range of EBSD applications. Users no longer have to choose
The DigiView is a versatile high resolution digital camera. The CCD sensor has a particularly high Quantum Efficiency (QE), peaking in the blue-green spectrum for use with an optimized phosphor screen coating
Neighbor Pattern Averaging & Reindexing (NPAR™) is an innovative approach to measuring crystallographic orientation from Electron Backscatter Diffraction (EBSD) patterns.
Pattern Region of Interest Analysis System (PRIAS™) is a synergistic imaging technique to visualize microstructure and provide exciting new views of your materials. PRIAS™ enables users to quickly characterize
The Forward Scatter Detector is an ideal analytical tool for previewing the microstructure to select a region for EBSD data collection and for qualitatively inspecting the microstructure to characterize deformation
Atom Probe Assist provides an innovative means of monitoring grain boundary position between FIB milling steps to ensure that a grain boundary is detected and correctly positioned for subsequent Atom Probe analysis.