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EBSD

  • APEX™ Software
    APEX Software for EBSD

    APEX™ EBSD enables the characterization of Electron Backscatter Diffraction (EBSD) patterns within the user-friendly APEX software platform. The combination of powerful pattern analysis and an intuitive interface, allows you to collect and report high-quality data quickly, easily, and reliably.

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  • Orientation Imaging Microscopy (OIM) Analysis™
    OIM Analysis

    OIM Analysis™ is a technique based on the automated collection and analysis of EBSD patterns. This mapping data provides information on the orientation, phase distribution, grain size and shape, grain boundary

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  • Clarity™ EBSD Analysis System
    Clarity EBSD Analysis System

    Clarity™ ‒ The world’s first commercial direct detection system to produce high fidelity EBSD patterns. This revolutionary system eliminates detector noise and distortions, opening new doors to unparalleled EBSD pattern quality and sensitivity.

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  • Velocity™ EBSD Camera
    Velocity EBSD Camera Series

    The Velocity™ EBSD camera offers high-speed EBSD mapping with the highest indexing performance on real world materials.

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  • DigiView EBSD Camera
    DigiView EBSD Camera

    The DigiView is a versatile high resolution digital camera. The CCD sensor has a particularly high Quantum Efficiency (QE), peaking in the blue-green spectrum for use with an optimized phosphor screen coating

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  • Neighbor Pattern Averaging & Reindexing (NPAR™)
    NPAR

    Neighbor Pattern Averaging & Reindexing (NPAR™) is an innovative approach to measuring crystallographic orientation from Electron Backscatter Diffraction (EBSD) patterns.

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  • OIM Matrix™
    OIM Matrix

    The OIM Matrix™ software package, which is offered as an option with OIM Analysis™, allows users to simulate EBSD patterns based on the physics of dynamical diffraction of electrons.

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  • Pattern Region of Interest Analysis System (PRIAS™)
    PRIAS

    Pattern Region of Interest Analysis System (PRIAS™) is a synergistic imaging technique to visualize microstructure and provide exciting new views of your materials. PRIAS™ enables users to quickly characterize

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  • Forward Scatter Detector
    Forward Scatter Detector

    The Forward Scatter Detector is an ideal analytical tool for previewing the microstructure to select a region for EBSD data collection and for qualitatively inspecting the microstructure to characterize deformation

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  • Atom Probe Assist
    Atom Probe Assist

    Atom Probe Assist provides an innovative means of monitoring grain boundary position between FIB milling steps to ensure that a grain boundary is detected and correctly positioned for subsequent Atom Probe analysis.

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