EDAX APEX™ EBSD enables the characterization of electron backscatter diffraction (EBSD) patterns within the user-friendly APEX software platform.
EDAX OIM Analysis™ is the premier microstructural visualization and analysis tool for interrogating and understanding electron backscatter diffraction (EBSD) mapping data.
The world’s first and only commercially available electron backscatter diffraction (EBSD) detector with unparalleled performance as low as 3 kV. This direct detection system is ideal for beam-sensitive perovskite, ceramic, or semiconductor materials that are difficult to analyze using conventional EBSD systems.
The EDAX Velocity™ EBSD camera series offers high-speed electron backscatter diffraction (EBSD) mapping with the best indexing performance on real-world materials.
EDAX NPAR™, or Neighbor Pattern Averaging & Reindexing, is an innovative approach to measuring crystallographic orientation from electron backscatter diffraction (EBSD) patterns.
The EDAX OIM Matrix™ software package, offered as an optional module for OIM Analysis™, allows users to simulate electron backscatter diffraction (EBSD) patterns based on the physics of the dynamical diffraction of electrons.
The EDAX Pattern Region of Interest Analysis System (PRIAS™) is a synergistic new approach for imaging and visualizing a material’s microstructural features.
EDAX Atom Probe Assist provides an innovative means of monitoring grain boundary position between FIB milling steps to ensure that a grain boundary is detected and correctly positioned for subsequent atom probe analysis.