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EDAX OIM Matrix

EDAX OIM Matrix™ software elevates electron backscatter diffraction (EBSD) analysis by allowing users to simulate patterns based on the physics of the dynamical diffraction of electrons. This optional module for EDAX OIM Analysis™ more accurately describes electron interaction behaviors within a sample and produces more realistic pattern simulations than traditional kinematic diffraction-based approaches. These simulated patterns can be more easily and accurately compared with experimentally collected EBSD patterns to improve indexing performance and orientation precision.

Schematic of the spherical indexing process.

Figure 1. Schematic of spherical indexing procedure where experimental EBSD patterns are projected onto a sphere to match against a simulated master pattern to improve indexing performance.

 

Spherical indexing

The state-of-the-art EDAX spherical indexing* approach provides superior results by indexing experimentally collected EBSD patterns using master pattern simulations.

  • Improves indexing performance compared to traditional Hough-based indexing
  • Accelerates reindexing to >10,000 pps
  • When coupled with NPAR™, improves EBSD pattern signal-to-noise levels
  • OIM Analysis integration streamlines access to the spherical indexing functionality
  • Compatible with transmission Kikuchi diffraction (TKD) to improve spatial resolution

*Requires NVIDIA GPU card running drivers 452.39 or newer (support CUDA runtime version 11.7 or newer)

Comparison of spherical indexing performance with traditional Hough-based indexing and NPAR approaches on a deformed aluminum alloy. The indexing success rates (shown in parentheses) are maximized by combining spherical indexing and NPAR together to analyze as much of the field of view as possible.
Figure 2. Comparison of spherical indexing performance with traditional Hough-based indexing and NPAR approaches on a deformed aluminum alloy. The indexing success rates (shown in parentheses) are maximized by combining spherical indexing and NPAR together to analyze as much of the field of view as possible.

Dynamically simulated EBSD patterns for: a) Cr23C6 , b) TiN, and c) Sigma phases using OIM Matrix.
Figure 3. Dynamically simulated EBSD patterns for: a) Cr23C6, b) TiN, and c) Sigma phases using OIM Matrix.

Realistic EBSD pattern simulations

  • Uses dynamic diffraction effects and forward modeling to accurately predict scattering and diffraction intensities within EBSD patterns
  • Easily compares experimental patterns with dynamic simulations
  • Over 280 calculated master patterns available to enable immediate simulations
  • Simulates additional crystals using crystal structure and atomic position information

Spherical indexing improvements on a shot-peened titanium alloy. The increased colored orientation measurements and reduction of black non-indexed points with spherical indexing compared to traditional indexing shows where orientations can now be reliably measured. Data courtesy of Mr. Prathompoom Newyawong, NSTDA Characterization and Testing Service Center.
Figure 4. Spherical indexing improvements on a shot-peened titanium alloy. The increased colored orientation measurements and reduction of black non-indexed points with spherical indexing compared to traditional indexing shows where orientations can now be reliably measured. Data courtesy of Mr. Prathompoom Newyawong, NSTDA Characterization and Testing Service Center.

Dictionary indexing

  • Template matching provides improved performance over traditional Hough-based indexing

Orientation refinement

  • Improves orientation precision for characterizing deformed materials
  • Achieves precision values <0.01° resolution
  • Resolves pseudosymmetry indexing artifacts

Automatic structure file optimization

  • Automatically creates and optimizes the reflector list for traditional Triplet Indexing
  • Makes the analysis of new materials easier

Improved indexing and grain determination in the NMC Li-ion battery cathode material. The speckling within grains with traditional indexing is eliminated with spherical indexing. Data courtesy of Dr. Siyan Wang, Imperial College London.
Figure 5. Improved indexing and grain determination in the NMC Li-ion battery cathode material. The speckling within grains with traditional indexing is eliminated with spherical indexing. Data courtesy of Dr. Siyan Wang, Imperial College London.

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