Electron Backscatter Diffraction (EBSD)

OIM Matrix

The EDAX OIM Matrix™ software package, offered as an optional module for OIM Analysis™, allows users to simulate electron backscatter diffraction (EBSD) patterns based on the physics of the dynamical diffraction of electrons. This approach more accurately describes the behavior of the electron interactions within a sample and produces more realistic pattern simulations than traditional kinematic diffraction-based approaches. These simulated patterns can be more easily and accurately compared with experimentally collected EBSD patterns.

Resources

OIM Matrix can be used to create a library of EBSD patterns for all crystallographic orientations for a given material. Experimental patterns can then be compared and matched with the best-fitting pattern in the library in an approach termed dictionary indexing, developed for EBSD by Prof. Marc De Graef’s group at Carnegie Mellon University. Dictionary indexing improves indexing success rates over standard Hough-based indexing approaches. Within OIM Analysis, dictionary indexing can be combined with partitioning functionality and other indexing tools for efficient indexing improvements and better overall data quality.

Features and benefits

Realistic EBSD pattern simulations

Dynamic diffraction effects and forward modeling can be used to predict both scattering and diffraction intensities within EBSD patterns accurately
Experimental patterns can be easily compared with dynamic simulations

Dictionary indexing

Template matching provides improved performance over traditional Hough-based indexing
Integrated into OIM Analysis for efficiency by using targeting indexing via data partitioning functionality

Master pattern database

Includes over 450 calculated master patterns for immediate simulations
Additional crystals can be simulated using crystal structure and atomic position information and added to the database

Automatic structure file optimization

Reflector list for traditional Triplet Indexing can be automatically created and optimized
Makes the analysis of new materials easier

EBSD background simulation

Backgrounds can be simulated and used for standard image processing routines (subtraction and division) for optimized band detection
Ideal for single crystals or for multi-phase samples where constituent phases have varying average atomic numbers and scattering intensities