Electron Backscatter Diffraction (EBSD)
Orientation of c-axes in Gallium Nitride
Orientation & IQ Map
Orientation & SED Map
N. Kuwano, K. Horibuchi, K. Kagawa, S. Nishimoto and M. Sueyoshi (2002).
"Electron microscopy analyses of microstructures in ELO-GaN." Journal of Crystal Growth 237-239: 1047-1054.