Electron Backscatter Diffraction (EBSD)
OIM orientation map of a Co-Sn-Te thermoelectric thin film.
Crystallization of a Co-Sn-Te thin film
Wavelength Dispersive Spectrometry (WDS)
Indium-Antimony-Telluride
Complex semiconducting compounds are being investigated for unique electrical properties. They usually consist of thin layers and solid-solution mixtures of elements that have similar atomic numbers for optimum properties. Discovery, identification, and quantification are needed by the producers to correlate with the properties to optimize their application. Since intermediate to low beam energies are used for spatial resolution analyses, many of the elemental X-ray peaks overlap in an EDS spectrum (green), especially for X-ray line families containing many different energies. Only the use of WDS (red) can discover the unique contributions of all of the elements in the sample.