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  • EDAX Releases 160mm Detector for TEM Analysis
    EDAX Adds a New Detector to the Elite T EDS Analysis System for TEM

    Friday, June 7, 2019 45 days ago

    MAHWAH, NJ, June 5, 2019 – AMETEK EDAX, Inc., a leader in X-ray microanalysis and electron diffraction instrumentation, has added a new 160 mm2 detector to its Elite T Energy Dispersive Spectroscopy (EDS) System for Transmission Electron Microscopes (TEM).

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  • Velocity-Super-EBSD
    EDAX Launches New Velocity™ Super Electron Backscatter Diffraction (EBSD) Camera

    Wednesday, March 27, 2019 117 days ago

    MAHWAH, NJ, March 27, 2019 –EDAX, Inc., a leader in X-ray microanalysis and electron diffraction instrumentation has added a new, faster, low-noise CMOS camera to its Velocity™ EBSD Camera Series. The Velocity™ Super is currently the fastest EBSD camera in the world, offering high-speed EBSD mapping with the highest indexing performance on real-world materials.

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