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Gatan has merged with EDAX. The combined organization will retain the Gatan name, offering the ultimate suite of tools for transmission electron (TEM) and scanning electron (SEM) microscopes.

We are a global leader in Energy Dispersive X-ray Spectroscopy (EDS), Electron Backscatter Diffraction (EBSD), Wavelength Dispersive X-ray Spectrometry (WDS) and X-ray Fluorescence (XRF) systems. EDAX manufactures, markets, and services high-quality products and systems for leading companies in semiconductors, metals, and geological, biological, material and ceramics markets.

Gatan is a business of AMETEK, Inc., a leading global provider of industrial technology solutions serving a diverse set of attractive niche markets with annual sales over $6.0 billion.

Some landmark events that portray our commitment to maintaining a technology leadership position include:
  • 2020s +


    Gatan and EDAX merged under the Gatan name


    Velocity™ Ultra added to the Velocity EBSD Camera Series
    Introduction of the Clarity™ Super EBSD Analysis System


    Velocity™ Pro added to the Velocity EBSD Camera Series


    Introduction of the Clarity™ EBSD Analysis System
    Release of the Lambda WDS Analysis System
    Launch of the APEX™ Software for EBSD 
  • 2010s +


    Introduction of the OIM Matrix™ Software Package
    Release of the Elite T Ultra EDS System for the Transmission Electron Microscope (TEM)
    Launch of the Velocity™ Super EBSD Camera


    Launch of Velocity™ Plus EBSD Camera
    Introduction of the Elite T Super EDS System for the TEM
    Release of APEX™ 1.3 software for Element and Octane Elect EDS Systems


    Granted patent for Neighbor Pattern Averaging and Reindexing (NPAR™) Routine
    Release of APEX™ 1.1 software for Element EDS Systems
    Introduction of the Octane Elect EDS System


    Introduction of OIM Analysis™ v8.0
    Release of the APEX™ Analysis Software for Tabletop Scanning Electron Microscopes (SEMs)
    Introduction of the Octane Elite Plus and Super Silicon Drift Detectors (SDDs)
    Launch of the XLNCE SMX-ILH In-Line XRF Analyzer


    Release of TEAM™ 4.3 Software
    Introduction of the Octane Elite SDD Series
    Launch of the XLNCE SMX-BEN XRF Analyzer


    Launch of the Element SDD Series
    Release of TEAM™ 3D Imaging and Quant (IQ)
    Introduction of Pattern Region of Interest Analysis System (PRIAS™), a synergistic new imaging technique to visualize microstructure and provide new views of materials
    Introduction of Octane Silicon Drift Detector Series for the Transmission Electron Microscope


    Introduction of faster, more productive Hikari XP and DigiView EBSD cameras
    Release of TEAM™ Neptune and TEAM™ Trident integrated analysis systems
    Introduction of WDS as part of the TEAM™ Analysis System


    EDAX celebrates its 50th anniversary
    Introduction of the Octane SDD Series
    Release of TEAM™ Pegasus integrated EDS and EBSD analysis system


    Release of Coating Analysis Software for Orbis Micro-XRF Systems
    Introduction of the Apollo XLT SDD Series for the TEM


    Introduction of OIM 6.0 Software

  • 2000s +


    Introduction of the TEAM™ EDS Analysis System
    Introduction of the Apollo X and XL Silicon Drift Detector Series


    Introduction of the Orbis Micro-XRF Spectrometer
    Introduction of the Genesis Apex X-ray Microanalysis System
    Introduction of the DigiView IV Electron Backscatter Diffraction Detector
    Release of EXpert ID Revolutionary Element Identification Software Available within Genesis


    Introduction of the Apollo Silicon Drift Detector Series


    EDAX and SPECTRO Analytical Instruments become Business Units within the new AMETEK Materials Analysis Division
    Introduction of high speed Hikari EBSD Detector
    Introduction of OIM 3D Data Collection and Processing Tool 
    Introduction of the LambdaSpec (TEXS) Wavelength Dispersive Detector


    Introduction of TEXS HP wavelength dispersive X-ray spectrometer
    Introduction of the Eagle III XPL automated filter option
    Introduction of DigiView III CCD Detector


    Introduction of Trident three-in-one analysis tool Combines EDS, EBSD and WDS
    Introduction of Neptune; complimentary union of EDS and WDS for accurate X-ray microanalysis
    Release of Element Detective within Genesis


    Introduction of the third generation Eagle µ-Probe micro-focus XRF
    Introduction of DigiView II firewire CCD Detector


    Introduction of Genesis system, which includes new hardware and multiple detector capabilities combined with Genesis software
    Introduction of Pegasus; simultaneous data acquisition optimizing EDS and EBSD
    Introduction of three new detectors for microanalysis: the CryoSpec Si(Li) LN2 Free detector, the LambdaSpec (LEXS) Wavelength Dispersive detector and the MegaSpec Silicon Drift Detector
    Release of ChI-Scan™ software to incorporate elemental composition into the indexing process in EBSD
    EDAX celebrates its 40th anniversary!
    EDAX achieves re-certification to the ISO9001:2000 standard


    AMETEK Inc. acquires EDAX Inc.
    Introduction of Genesis EDS Software, setting a new standard for overall ease of use, while maintaining flexibility and power
    Introduction of DigiView high-speed, high resolution CCD detector, the first fully digital EBSD detector


    Release of ViP software, a unique quant routine which take into account and corrects for beam scattering that occurs while working in low vacuum, variable pressure SEM conditions
    Introduction of Delphi, an integrated EBSD/EDS phase identification product
  • 1990s +


    EDAX acquires TexSEM Laboratories (TSL), the industry leader in Electron Backscatter Diffraction analysis
    Introduction of Automated Crystallography for the TEM (ACT)


    Introduction of the Falcon EDS system; providing economy and performance


    Introduction of the EAGLE µ-Probe; a new generation of micro-focus XRF
    Introduction of the OIM EBSD System on PC platform
    First simultaneous OIM/EDS scan


    Introduction of the Phoenix - the first Windows-NT based EDS system
    Introduction of Sapphire detectors series; providing the best standard resolution of any EDS detector


    Introduction of the DX PRIME, a PC Windows-95 based EDS system
    Introduction of the CryoSpec liquid nitrogen free detector


    TexSEM Laboratories (TSL) founded by the OIM development team offers the first commercially available fully automated EBSD System


    Introduction of the DX-95 XRF system
    ISO 9001 certification


    Introduction of DX-4, the world's first and most popular Windows based EDS system
    Introduction of EDAX's unique compact detecting unit (CDU)
    Introduction of the first fully automated EBSD system (OIM)
  • 1980s +


    Introduction of the PV9800 EDS X-ray microanalysis system


    Introduction of the PV9900 EDS X-ray microanalysis system


    First commercially available EBSD System (developed by the forerunner to TSL)


    First computer aided Electron Backscatter Diffraction (EBSD) System developed at Bristol University by Dr. David Dingley
  • 1970s +


    Introduction of the PV9500 XRF System


    Introduction of the PV9100 EDS X-ray microanalysis system


    Nuclear Diodes becomes EDAX International, Inc.
    Introduction of the ECON, the first windowless detector
  • 1960s +


    Introduction of Nuclear Diodes 505 - the first commercially available X-ray system for electron microscope applications


    Introduction of LN2-cooled detectors


    Company founded under the name Nuclear Diodes
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