History

2023

Gatan and EDAX merged under the Gatan name

2022

Velocity™ Ultra added to the Velocity EBSD Camera Series
Introduction of the Clarity™ Super EBSD Analysis System

2021

Velocity™ Pro added to the Velocity EBSD Camera Series

2020

Introduction of the Clarity™ EBSD Analysis System
Release of the Lambda WDS Analysis System
Launch of the APEX™ Software for EBSD 

2019

Introduction of the OIM Matrix™ Software Package
Release of the Elite T Ultra EDS System for the Transmission Electron Microscope (TEM)
Launch of the Velocity™ Super EBSD Camera

2018

Launch of Velocity™ Plus EBSD Camera
Introduction of the Elite T Super EDS System for the TEM
Release of APEX™ 1.3 software for Element and Octane Elect EDS Systems

2017

Granted patent for Neighbor Pattern Averaging and Reindexing (NPAR™) Routine
Release of APEX™ 1.1 software for Element EDS Systems
Introduction of the Octane Elect EDS System

2016

Introduction of OIM Analysis™ v8.0
Release of the APEX™ Analysis Software for Tabletop Scanning Electron Microscopes (SEMs)
Introduction of the Octane Elite Plus and Super Silicon Drift Detectors (SDDs)
Launch of the XLNCE SMX-ILH In-Line XRF Analyzer

2015

Release of TEAM™ 4.3 Software
Introduction of the Octane Elite SDD Series
Launch of the XLNCE SMX-BEN XRF Analyzer

2014

Launch of the Element SDD Series
Release of TEAM™ 3D Imaging and Quant (IQ)
Introduction of Pattern Region of Interest Analysis System (PRIAS™), a synergistic new imaging technique to visualize microstructure and provide new views of materials
Introduction of Octane Silicon Drift Detector Series for the Transmission Electron Microscope

2013

Introduction of faster, more productive Hikari XP and DigiView EBSD cameras
Release of TEAM™ Neptune and TEAM™ Trident integrated analysis systems
Introduction of WDS as part of the TEAM™ Analysis System

2012

EDAX celebrates its 50th anniversary
Introduction of the Octane SDD Series
Release of TEAM™ Pegasus integrated EDS and EBSD analysis system

2011

Release of Coating Analysis Software for Orbis Micro-XRF Systems
Introduction of the Apollo XLT SDD Series for the TEM

2010

Introduction of OIM 6.0 Software

2009

Introduction of the TEAM™ EDS Analysis System
Introduction of the Apollo X and XL Silicon Drift Detector Series

2008

Introduction of the Orbis Micro-XRF Spectrometer
Introduction of the Genesis Apex X-ray Microanalysis System
Introduction of the DigiView IV Electron Backscatter Diffraction Detector
Release of EXpert ID Revolutionary Element Identification Software Available within Genesis

2007

Introduction of the Apollo Silicon Drift Detector Series

2006

EDAX and SPECTRO Analytical Instruments become Business Units within the new AMETEK Materials Analysis Division
Introduction of high speed Hikari EBSD Detector
Introduction of OIM 3D Data Collection and Processing Tool 
Introduction of the LambdaSpec (TEXS) Wavelength Dispersive Detector

2005

Introduction of TEXS HP wavelength dispersive X-ray spectrometer
Introduction of the Eagle III XPL automated filter option
Introduction of DigiView III CCD Detector

2004

Introduction of Trident three-in-one analysis tool Combines EDS, EBSD and WDS
Introduction of Neptune; complimentary union of EDS and WDS for accurate X-ray microanalysis
Release of Element Detective within Genesis

2003

Introduction of the third generation Eagle µ-Probe micro-focus XRF
Introduction of DigiView II firewire CCD Detector

2002

Introduction of Genesis system, which includes new hardware and multiple detector capabilities combined with Genesis software
Introduction of Pegasus; simultaneous data acquisition optimizing EDS and EBSD
Introduction of three new detectors for microanalysis: the CryoSpec Si(Li) LN2 Free detector, the LambdaSpec (LEXS) Wavelength Dispersive detector and the MegaSpec Silicon Drift Detector
Release of ChI-Scan™ software to incorporate elemental composition into the indexing process in EBSD
EDAX celebrates its 40th anniversary!
EDAX achieves re-certification to the ISO9001:2000 standard

2001 

AMETEK Inc. acquires EDAX Inc.
Introduction of Genesis EDS Software, setting a new standard for overall ease of use, while maintaining flexibility and power
Introduction of DigiView high-speed, high resolution CCD detector, the first fully digital EBSD detector

2000

Release of ViP software, a unique quant routine which take into account and corrects for beam scattering that occurs while working in low vacuum, variable pressure SEM conditions
Introduction of Delphi, an integrated EBSD/EDS phase identification product

1999

EDAX acquires TexSEM Laboratories (TSL), the industry leader in Electron Backscatter Diffraction analysis
Introduction of Automated Crystallography for the TEM (ACT)

1998

Introduction of the Falcon EDS system; providing economy and performance

1997

Introduction of the EAGLE µ-Probe; a new generation of micro-focus XRF
Introduction of the OIM EBSD System on PC platform
First simultaneous OIM/EDS scan

1996

Introduction of the Phoenix - the first Windows-NT based EDS system
Introduction of Sapphire detectors series; providing the best standard resolution of any EDS detector

1995

Introduction of the DX PRIME, a PC Windows-95 based EDS system
Introduction of the CryoSpec liquid nitrogen free detector

1994

TexSEM Laboratories (TSL) founded by the OIM development team offers the first commercially available fully automated EBSD System

1993

Introduction of the DX-95 XRF system
ISO 9001 certification

1992

Introduction of DX-4, the world's first and most popular Windows based EDS system
Introduction of EDAX's unique compact detecting unit (CDU)
Introduction of the first fully automated EBSD system (OIM)

1987

Introduction of the PV9800 EDS X-ray microanalysis system

1985

Introduction of the PV9900 EDS X-ray microanalysis system

1984

First commercially available EBSD System (developed by the forerunner to TSL)

1982

First computer aided Electron Backscatter Diffraction (EBSD) System developed at Bristol University by Dr. David Dingley

1979

Introduction of the PV9500 XRF System

1978

Introduction of the PV9100 EDS X-ray microanalysis system

1972

Nuclear Diodes becomes EDAX International, Inc.
Introduction of the ECON, the first windowless detector

1969

Introduction of Nuclear Diodes 505 - the first commercially available X-ray system for electron microscope applications

1964

Introduction of LN2-cooled detectors

1962

Company founded under the name Nuclear Diodes