APEX Software for EDS

 

Ease of Use

• Intuitive operation for novice and expert users
• Acquire and report data with as little as one mouse click
• Routine tasks are automated for quick and easy analysis
• Profile-based login ensures everyone has the right level of access; from individual users to administrators

Customization

• Selectable color scheme to match the Scanning Electron Microscope (SEM) interface or user preferences
• Display configuration options to show data according to user preferences
• Resize and arrange data windows according to your requirements

Features

Simultaneous Live and Review Mode

Improve the efficiency of your experiment by simultaneously collecting a spectrum, linescan, or map while you evaluate data and generate reports.

Real-Time Results

• Immediately identify and display elements using Element ID
• Dynamically edit elements for the most accurate and efficient analysis
• Easily understand your sample's composition using the live quantification statistics and graphical results

Smart Quant

• Use ZAF-corrected spectral analysis for quantitative compositional information
• Simultaneously perform quantitative analysis during spectral data collection with no delay in the acquisition

Multipoint Analysis

• Utilize Survey mode to perform point sampling quickly
• Mark and analyze several locations on a sample to improve your data collection efficiency
• Save and recall Multipoint scan lists to automate data collection and analysis

Data Management and Reporting

• Ability to edit and export files in Microsoft® Word, Excel or PowerPoint, and PDF formats
• Project tree storage for seamless management of all data
• Project exports to *.HDF file format
• One-click saving of windows as *.bmp, *.jpg, *.png, or *.tif images

Advanced Reporting

• Directly generate reports from the APEX Live mode to shorten your time to results
• Use Report Designer to customize presentation templates for images, spectra, quantification results, text, logos, and sample information
• Easily compare data from multiple areas or samples in the same report
• Combines multiple templates to display results easily
• Automatically create reports immediately after data collection is complete

EDS Mapping

• Counts per second (CPS) map showing count rate quality at every pixel displayed to provide a CPS distribution and highlights variations caused by surface features
• CompoMaps separate contributions from overlapping peaks to individual elemental maps for more accurate representations of EDS maps
• Quickly activate and add elements while mapping to simplify operation and inspection
• Select from 40 color options to effortlessly create vibrant images during elemental mapping
• Simultaneously map multiple element lines (K, L, M)

 

Dynamic Element Mapping

• Interact in real-time to show only the elements while in Mapping and Linescan modes
• Edit elements, element lines, and user-selected regions of interest during map collection

Montage Large Area Mapping

• Scan large areas using stage movements to collect multiple fields of analysis
• Automatically stitch data into a single file for comprehensive analysis

Smart Phase Mapping

• No user setup required
• Automatically collect spectra, elemental, and phase maps
• Customize the name and color selection of phases
• Predefine or reanalyze phases based on spectra

Dual Detectors

• Mitigates shadowing and topographic artifacts
• Option to merge spectra/compositional maps from both detectors
• Doubles throughput count rate while maintaining single detector energy resolution
• Better resolution stability versus systems with one detector with a large sensor
• Averages quantitative analysis from two detectors to build more accurate results

Enhanced Linescan Acquisition

• Configure spectra collection for efficient analysis of compositional gradients
• Real-time overlay and scaling of the Linescan chart enables easy correlation of compositional data with image features
• Avoid samples errors when you use Linescan with drift correction in the APEX Advanced software package

Drift Correction

• Automatically set drift parameters for easy operation
• Dynamically adjusts the correction frequency based on the drift magnitude for robust correction performance
• Advanced correction options available to save drift images and define manual reference area
• Available in Spectrum, Linescan, and Mapping modes for quality data in all collection modes

Spectrum Match

• Optional feature allows users to search through a spectrum library to find similar spectra
• Simplifies identification of unknowns by comparing them to potential candidates and reduces the complexity of finding discrepancies and similarities between spectra
• Create and use your unique spectrum library for Spectrum Match
• Match a collected "unknown" spectrum to a library of reference spectra using the Smart Materials and Minerals Library option