Electron Backscatter Diffraction (EBSD)
PZT - Lead Zirconium Titanate
The pseudo-symmetric structure of PZT results in similar yet different orientation solutions for a given pattern. Recent results show that OIM can distinguish between these solutions correctly the majority of the time.
Orientation Maps before and after Pseudo Symmetry Corrections
Micro X-ray Fluorescence (Micro-XRF)
Measuring Pb on Printed Circuit Boards for RoHS Compliance
Printed circuit board: Pb(L) X-ray map
Printed circuit board: Total X-ray spectral count image
The screening of samples for restricted or banned materials and chemicals is becoming increasingly important. European law, which has quickly spread in various forms globally, restricts the use of Hg, Pb, Cd, hexavalent Cr, and Br, in certain fire retardants in consumer electronics and other electrical appliances. Micro-XRF can be used to determine Hg, Pb, and Cd levels and identify components with significant levels of Cr and Br requiring further definitive testing. In this case, a printed circuit board has been mapped, showing the use of Pb-based solder on the board.