Skip to content
English
Search

Microscopy & Microanalysis 2021

Microscopy & Microanalysis (M&M) 2021 Virtual Meeting
August 2 – 5, 2021

Looking for the best results to advance your understanding of materials? Visit the EDAX virtual booth to learn how our elemental and structural microanalysis solutions can bring new insight to enhance your materials characterization.

New | Demos | Tutorial | Sessions | (S)TEM

New From EDAX

Clarity™ EBSD Analysis System

Clarity EBSD Analysis System
World’s first commercial direct detection system to produce high fidelity Electron Backscatter Diffraction (EBSD) patterns. This revolutionary system eliminates detector noise and distortions, opening new doors to unparalleled EBSD pattern quality and sensitivity.

EBSD ComboScan of a Gibeon Meteorite sample for large area analysis.

APEX™ Software for EDS and EBSD
Powerful and user-friendly software that drives the collection and analysis of Energy Dispersive Spectroscopy (EDS) and EBSD data for the compositional and microstructural characterization of materials.

Lambda WDS Analysis System

Lambda WDS Analysis System
Combines EDAX Wavelength Dispersive Spectrometry (WDS) software with state-of-the-art spectrometers for improved accuracy and precision, guaranteeing the best results for your materials analysis.

EDAX Vendor Tutorial

Tuesday, August 3 (time in EDT)

6:45 – 7:45 p.m.

EDAX Exhibitor Spotlight Session

Wednesday, August 4 (time in EDT)

1:45 p.m.

EDAX Platform & Poster Sessions

Monday, August 2 (times in EDT)

12:30 p.m.

Platform: Real World Application of EBSD Forward Models
Session: A03.1 - Microscopy and Microanalysis for Real World Problem Solving
Presentation: 15
Presenter: Will Lenthe

2:30 p.m.

Platform: Low Dose EBSD Analysis of Biominerals
Session: A12.2 - Microscopy and Microanalysis of Biomineralized and Biomimetic Materials and Structures
Presentation: 95
Presenter: Dr. René de Kloe

Tuesday, August 3 (times in EDT)

12:30 p.m.

Platform: Abilities Towards Improved Accuracy in EPMA
Session: A10.P1 - Unresolved Challenges in Quantitative X-ray Microanalysis 
Presentation: 358
Presenter: Frank Eggert

5:15 p.m.

Poster: The Detector Efficiency Question with EDS
Session: A10.P1 - Unresolved Challenges in Quantitative X-ray Microanalysis 
Presentation: 558
Presenter: Frank Eggert

5:15 p.m.

Poster: EDS Quantification Using Fe L Peaks and Low Beam Energy
Session: A10.P1 - Unresolved Challenges in Quantitative X-ray Microanalysis 
Presentation: 557
Presenter: Dr. Jens Rafaelsen

5:15 p.m.

Poster: Mitigating Shadowing and Topographic Artifacts Using Dual EDS Detectors
Session: A03.P1 - Microscopy and Microanalysis for Real World Problem Solving
Presentation: 523
Presenter: Dr. Shangshang Mu

Thursday, August 5 (times in EDT)

10:00 a.m.

Platform: HR-EBSD based Characterization of Dislocations in Additive Manufactured 316L Stainless Steel
Session: P08.2 - Advanced Characterization of Components Fabricated by Additive Manufacturing
Presentation: 888
Presenter: Dr. Josh Kacher, Georgia Tech

4:15 p.m.

Poster: Applications of Direct Electron Detection to the EBSD Analysis of Energy Conversion and Storage Materials 
Session: P12.P2 - Microscopy & Spectroscopy of Energy Conversion and Storage Materials 
Presentation: 1124
Presenter: Matt Nowell

(S)TEM Advancements

Visit our sister-company, Gatan, to learn how they can take the most powerful microscopy on earth and make it work even harder for you.

Gatan