The Octane Elect EDS System is an enhanced Energy Dispersive Spectroscopy (EDS) platform with the latest advancements in Silicon Drift Detector (SDD) technology and high speed electronics. Tailored for users who demand higher performance and functionality than the options available in entry-level systems, the Octane Elect EDS System provides excellent resolution and high throughput at an optimal value with a remarkable low energy sensitivity for light element detection and low voltage (kV) microanalysis.
Octane Elect Silicon Drift Detectors
The Octane Elect SDDs incorporate a silicon nitride (Si3N4) window, high speed electronics and a manual slide. They can be combined with one of EDAX's Electron Backscatter Diffraction (EBSD) cameras as part of the Pegasus EDS-EBSD Analysis System, providing seamless integration for both elemental composition and crystal structure analysis in one easy-to-use package. For more information, please visit the Pegasus EDS-EBSD Analysis System page.
The Octane Elect SDDs are available in 2 models:
Octane Elect Plus - 30 mm2 chip
Octane Elect Super - 70 mm2 chip
Spectra acquired from a silicon dioxide sample at 10 kV.
The comparison of the scaled spectra to the Si K peak
clearly shows the increased oxygen and carbon peak
intensities achieved with a Si3N4 window.
Best Light Element Performance
The Octane Elect SDD with a Si3N4 window offers major transmission improvements compared to detectors with a polymer window, leading to greatly improved light element performance and significantly more critical data for the materials analyst.
Low kV Performance
The mechanical properties of silicon nitride allow the use of thinly fabricated windows with a low aspect ratio support grid, offering a great benefit in terms of low energy sensitivity and optimal low voltage analysis.
Al L to Al K peak height ratio of 1:1 at 2.5 kV
Optimized SDD Electronics for stable energy at high collection rates
- Fast pulse processing for mapping and quantification
- Optimized data quality at all count rates
- High resolution quantitative analysis at mapping speeds greater than 400,000 output cps
The EDAX EDS systems with advanced detection electronics offer the highest throughput count rate on the market for the best possible analysis and increased productivity.
The design of the SDDs with the material properties and durability of the Si3N4 window offer the most robust and reliable detectors for all EDS applications. The unique design means that they are corrosion and shock resistant, and suitable for plasma cleaning.
EDS Analysis Software allows users to optimize their analysis time and get the best possible data from their sample
- Smart Diagnostics and Smart Acquisition facilitate optimized collection and analysis conditions
- Smart Pulse Pile-Up Correction minimizes concerns typical of high count rate collections and allows for maximum use of SDD technology
Standard with the EDS Analysis Software
- Fast Phase Mapping routine (patent pending) and materials libraries
- Smart Diagnostics
- Smart Acquisition
- EXpert ID
- Smart Mapping
- Smart Data Management
For more information, please visit the EDS Analysis Software page.