• Energy Dispersive Spectroscopy
    Energy Dispersive Spectroscopy
  • EBSD analysis overview
    Electron Backscatter Diffraction
  • Integrated EDS EBSD WDS products
    Integrated EDS, EBSD and WDS Systems
  • XRF Process Control
    X-ray Metrology
  • Micro-XRF analysis of precious artifacts
    Micro-XRF
  • Materials analysis mapping images
    Materials Analysis
  • Pattern Region of Interest Analysis System (PRIAS)
    Pattern Region of Interest Analysis System (PRIAS™)
  • Neighbor Pattern Averaging & Reindexing
    Neighbor Pattern Averaging & Reindexing (NPAR™)

EDAX AT A GLANCE

EDAX is a leading provider of innovative materials characterization systems encompassing Energy Dispersive Spectroscopy (EDS), Electron Backscatter Diffraction (EBSD), Wavelength Dispersive Spectrometry (WDS), Micro X-ray Fluorescence (Micro-XRF), and X-ray Metrology.

EDAX products include stand alone tools, integrated tools for EDS-EBSD, EDS-WDS, and EDS-EBSD-WDS, and a free-standing Micro-XRF bench-top elemental analyzer providing small and micro-spot X-ray analysis and mapping.

EDAX develops the best solutions for micro- and nano-characterization, where elemental and/or structural information is required, making analysis easier and more accurate.

EDAX designs, manufactures, distributes and services products for a broad range of industries, educational institutions and research organizations.

RECENT NEWS

Download your free copy of the December 2017 issue of the EDAX Insight newsletter
Download your free copy of the December 2017 issue of the EDAX Insight newsletter

Articles include: Smart Materials and Minerals Library for Spectrum Match - Tips & Tricks: Create Max Pixel Spectrum Function - EBSD Analysis of Crack Propagation: A Case Study - Materials Characterization Facility, Carnegie Mellon University, Pittsburgh, PA

Read the EDAX blog post - Looking At A Grain! written by Global Marketing Manager Sia Afshari
Read the latest EDAX blog post "Looking At A Grain!" by Global Marketing Manager, Sia Afshari

Sia discusses his take aways from the International Conference on Texture of Materials (ICOTOM18).

Register for the How to Use Saved EBSD Patterns in Specific Applications webinar - Dec. 14
Register for the "How to Use Saved EBSD Patterns in Specific Applications" webinar on December 14 at 11 a.m. EST

In this webinar, EBSD product manager Matt Nowell will discuss possible applications using these saved EBSD patterns, including phase differentiation using ChI-Scan™, microstructural imaging using PRIAS™, improved indexing performance using NPAR™, advanced pattern indexing, and HR-EBSD.

Watch the When and How to Use ChI-Scan™ in OIM Analysis™ v8 webinar on demand
Watch the "When and How to Use ChI-Scan™ in OIM Analysis™ v8" webinar on demand

ChI-Scan™ allows users to use simultaneously collected EDS data as a filter for indexing. In this webinar, EDAX Applications Specialist, Shawn Wallace, covers when and how to use ChI-Scan™ in OIM Analysis™ v8.