Insight Newsletter

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  • Download your free copy of the December 2017 issue of the EDAX Insight newsletter
    EDAX Insight Vol. 15 No. 4

    Tuesday, December 12, 2017

    Articles include: Smart Materials and Minerals Library for Spectrum Match - Tips & Tricks: Create Max Pixel Spectrum Function - EBSD Analysis of Crack Propagation: A Case Study - Materials Characterization Facility, Carnegie Mellon University, Pittsburgh, PA

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  • Download your free copy of the September 2017 issue of EDAX Insight
    EDAX Insight Vol. 15 No. 3

    Friday, September 29, 2017

    Articles include: Celebrating More Than 50 Years of Microanalysis with EDAX - Tips & Tricks: Spectral Background Fitting and Peak Noise Statistics - Imaging and Characterization of Metallic Antioxidants in Plant Based Food Using Energy Dispersive Spectroscopy - University of Connecticut-Thermo Fisher Scientific Center for Advanced Microscopy and Materials Analysis (CAMMA), Storrs, CT

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  • EDAX Insight Vol. 15 No. 2
    EDAX Insight Vol. 15 No. 2

    Thursday, July 27, 2017

    Articles include: In vivo XRF probing the absorption and translocation of nutrients in seeds and plants - How I Prepare Samples for Electron Backscatter Diffraction (EBSD) - Department of Materials and Manufacturing, Jönköping University, Sweden

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  • EDAX Insight Vol. 15 No. 1
    EDAX Insight Vol. 15 No. 1

    Tuesday, March 28, 2017

    Articles include: Octane Elect EDS System Joins EDAX Portfolio of EDS Products - Tips & Tricks: Analysis Is Better With APEX™ - EBSD Observations of the Evolution of Crystallographic Orientation during In-Situ Deformation - Otto Schott Institute for Materials Research, Friedrich Schiller University

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  • EDAX Insight Vol. 14 No. 4
    EDAX Insight Vol. 14 No. 4

    Wednesday, December 14, 2016

    Articles include: EDAX Takes the Next Step with OIM Analysis™ v8 Release - Tips & Tricks: Understanding the EDAX Autophase Selection Routine - Calibration Strategies for Coating Measurements on the XLNCE X-ray Metrology Product Line - The School of Earth and Climate Sciences at the University of Maine

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  • EDAX Insight Vol. 14 No. 3
    EDAX Insight Vol. 14 No. 3

    Thursday, September 29, 2016

    Articles include: A Peek at the APEX Software - Tips & Tricks: Atom Probe Assist™ Mode - When A Smaller EDS Detector Size Is Actually Better - Materials Science & Engineering at Washington State University

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  • EDAX Insight Vol. 14 No. 2
    EDAX Insight Vol. 14 No. 2

    Thursday, July 14, 2016

    Articles include: Octane Elite - Sharpening Edges in Energy Dispersive Spectroscopy (EDS) Detection - Tips & Tricks: Using Manual Phase Mapping to Find Gold - OIM Analysis™ v8: The Best Just Got Better - Materials Research Institute Aalen

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  • EDAX Insight Vol. 14 No. 1
    EDAX Insight Vol. 14 No. 1

    Thursday, March 24, 2016

    Articles include: Introducing the XLNCE SMX-ILH XRF Analyzer - Tips & Tricks: EDS Calibration in TEAM™ - Analyzing Absorption of Wood Preservatives Using Micro-XRF - Materials Engineering Department at KU Leuven

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  • EDAX Insight Vol. 13 No. 4
    EDAX Insight Vol. 13 No. 4

    Tuesday, December 15, 2015

    Articles include: NPAR™ - A Novel Approach to Accelerating and Extending EBSD Indexing Performance - Tips & Tricks: Understanding Electron Backscatter Diffraction (EBSD) Background Corrections - Discriminating Glass Fragments Using Micro-XRF Spectrometry with Poly-Capillary Optics - First European X-ray Fluorescence (XRF) Workshop was a Great Success

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  • EDAX Insight Vol. 13 No. 3
    EDAX Insight Vol. 13 No. 3

    Tuesday, September 29, 2015

    Articles include: EDAX Propels Technology With The Latest TEAM™ Release - Tips & Tricks: Analysis Depth for Micro-XRF - Atom Probe Assist for Efficient Atom Probe Tomography Specimen Preparation

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  • EDAX Insight Vol. 13 No. 2
    EDAX Insight Vol. 13 No. 2

    Tuesday, July 14, 2015

    Articles include: Octane Elite SDD Series Lowers the (Analysis)Bar with New Silicon Nitride Windows - Tips & Tricks: Which XRF Line Series to Use? - Fast Simultaneous EDS-EBSD Mapping and ChI-Scan™ Analysis

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  • EDAX Insight Vol. 13 No. 1
    EDAX Insight Vol. 13 No. 1

    Wednesday, March 25, 2015

    Articles include: EDAX Launches the XLNCE X-ray Metrology Series - Tips & Tricks: Spectrum Auto Processing - Analysis of Pb-Free Solder and Solder Films with the XLNCE SMX-BEN XRF Analyzer

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  • EDAX Insight Vol. 12 No. 4
    EDAX Insight Vol. 12 No. 4

    Wednesday, December 17, 2014

    Articles include: Fast Acquisition of Quality EBSD Data on Multiple Sample Types Using the New Hikari Super Detector - Tips & Tricks: Utilizing Internal Intensity Ratios in Micro-XRF - Phase Identification Through Mapping and Spectrum Matching

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  • EDAX Insight Vol. 12 No. 3
    EDAX Insight Vol. 12 No. 3

    Friday, September 26, 2014

    Articles include: Investigating Localized Deformation Behavior Through Combined Nanoindentation and Orientation Imaging Microscopy - Tips & Tricks: Advanced OIM - Analyzing Daguerreotype Chemistry Using the Orbis Micro-XRF Elemental Analyzer

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  • EDAX Insight Vol. 12 No. 2
    EDAX Insight Vol. 12 No. 2

    Thursday, July 17, 2014

    Articles include: 3D Visualization of EDS Map Analyses From FIB Slices - Octane Silicon Drift Detector (SDD) Series for the Transmission Electron Microscope (TEM) - EDAX Opens Demo Facility in India

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  • EDAX Insight Vol. 12 No. 1
    EDAX Insight Vol. 12 No. 1

    Thursday, March 20, 2014

    Articles include: EDAX Brings Octane Silicon Drift Detector (SDD) Technology to the Transmission Electron Microscope - Tips & Tricks: Orbis Vision Version 2.1 Update - Revised KENO Function - EDAX Introduces New Pattern Region of Interest Analysis System (PRIAS™)

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