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  • Register for the When and How to Use ChI-Scan™ in OIM Analysis™ v8 webinar
    When and How to Use ChI-Scan™ in OIM Analysis™ v8

    Thursday, November 16, 2017

    The tools available in OIM Analysis™ are always being updated and improved upon. With the recent release of OIM Analysis™ v8, the full suite of indexing options is now available outside our data collection software suites, including ChI-Scan™.

    ChI-Scan™ allows the user to use simultaneously collected EDS data as a filter for indexing. This webinar covers when and how to use ChI-Scan™ in OIM Analysis™ v8.

  • Life Sciences
    How to Apply Microanalysis to the Life Sciences

    Thursday, October 19, 2017

    The fields of biology and life sciences are growing at a tremendous pace, and there are a growing number of uses of applied microscopy and imaging in these disciplines. Microanalysis, however, is underutilized in these areas due to historical challenges in soft tissue sample analysis and EM operating conditions. Advancements in microanalysis technology such as fast detector collection and processing, paired with low vacuum or VP SEM modes have opened up some very interesting applications of microanalysis in the life sciences. In this webinar, we show a series of interesting EDS and EBSD examples ranging from metallic antioxidants in plant foods to marine biology EDS and EBSD studies. For those materials scientists joining in, we also explore the field of biomimetics, in which industry is following the elegant designs of biological organisms to manufacture optimal materials characteristics.

  • Correlative Microscopy
    Correlative Microscopy with OIM Analysis™

    Thursday, September 21, 2017

    Electron backscatter diffraction (EBSD) has become a well-established microanalysis technique for characterizing the crystallographic microstructure of materials. Traditionally, complementary chemical information has been collected simultaneously with the EBSD data via Energy Dispersive Spectroscopy (EDS). Combining the structural and chemical information provides a more-complete measurement and helps improve phase differentiation performance. Because this data is collected simultaneously, the data is spatially correlated for easy analysis. The drive to correlate EBSD data with other characterization techniques has increased. In this webinar we will demonstrate new features, which have been introduced into OIM Analysis™ to allow other sources of spatially-resolved data to be imported into the software. Examples of this data would include: Electron Beam Induced Current (EBIC); Cathodoluminescence (CL); Wavelength Dispersive Spectroscopy (WDS); Nanoindentation. We will also show routines, which have been added to spatially correlate this input data with the EBSD data. This allows users to gain new insight into their materials by exploring the relationship between the crystallographic microstructure and these other signals.

  • NPAR
    How to Use NPAR™ in OIM Analysis™ v8

    Thursday, July 20, 2017

    With more and more users seeing the power of NPAR™, EBSD Applications Engineer Shawn Wallace, shows you how to use NPAR™ inside OIM Analysis™ v8. He covers all steps involved including how to make and tweak backgrounds, how to change phases, how to recalibrate data sets, and every other step involved in getting the most of your data. The webinar also covers some of things to watch out for and the effects of NPAR™ on the resulting datasets.

  • Practical Quant Analysis
    Practical Quantitative Analysis - How to Optimize the Accuracy of your Data

    Thursday, June 15, 2017

    There are often questions about how to a set up an EDS collection to achieve the “best” data, but the best data is usually dependent both on the analytical goals and the characteristics of the sample. Often, there is no single correct answer. The analyst needs to consider a variety of factors when setting up an analysis to achieve the optimal results. For example, it’s hard to recommend a collection time for a typical EDS analysis because a quick collection time of 5-10 seconds is only realistic on a sample with major and minor elements, but a longer collection time would be more appropriate for samples with trace elements or low count rates. And while a sample with a trace amount of an element may need 100 seconds or longer collection time to achieve minimum detection limits, this does not necessarily improve the quantification accuracy of major elements. In this webinar, we explore the relationship between collection time, count rate and resolution, and how it affects the data accuracy and error interval. Experimental data also shows the influence of geometry settings, sample surface quality, background adjustments, and peak overlaps and the quantification results.

  • Sample Preparation
    Learn How I Prepare Samples for EBSD Analysis

    Thursday, May 18, 2017

    Electron Backscatter Diffraction (EBSD) has become an established and accepted microanalysis technique for characterizing crystalline materials. However, like many other techniques, proper sample preparation is necessary to produce quality results.
    In this presentation, I present the “standard” preparation technique I use that has been developed over 20 years of analyzing different materials with EBSD. This includes details on how it is done and why we do it. I also discuss exceptions to the standard rules and where and why these come into play. The goal for this webinar is for participants to gain a practical knowledge of how to better prepare EBSD samples for their analysis.

  • OIM with NPAR
    EBSD OIM Analysis™ with NPAR™ or How to Salvage Your Datasets!

    Thursday, April 20, 2017

    The highest quality EBSD analyses prefer the highest quality pattern collection. However, limited acquisition time, non-ideal sample perfection, and restricted SEM setup do not provide optimum collection quality. Many times the resultant OIM maps will have a severely diminished quality and appear to be useless. NPAR™ is a routine that can recover the greatest amount of quality available in the data set. This webinar will present examples of data sets that were salvaged by the technique.

  • Advances in EDS analysis
    Advances in EDS Throughput - From X-ray Counts to Solutions

    Thursday, March 16, 2017

    Ongoing advancements in energy dispersive spectroscopy (EDS) analysis are leading to higher count rates, better light-element sensitivity, and improved energy-resolution stability over a wide range of count rates. In this webinar we briefly review how the different parts of the EDS system interact, from X-rays leaving the sample to the production of useful data and where recent improvements have taken place. We then apply the gains offered by this new technology to three samples to illustrate the benefits that can be reaped from the changes.

  • AtomProbe Assist
    Elemental Microstructural Analysis - Combining structure and chemistry from cm to atoms: EBSD combined with EDS and APT

    Thursday, January 19, 2017

    In this joint EDAX-CAMECA webinar the use of chemical information collected together with EBSD microstructural data is reviewed. Combined analysis may be performed from the cm- to nm- scale in the scanning electron microscope. The availability of simultaneously collected EDS data ensures successful EBSD analysis of multiphase materials and identification of particles. For even higher resolution data, EBSD may be paired with atom probe tomography. There it can both be used to pinpoint the exact volume of material to be analysed with atom probe tomography and also to provide the microstructural framework to interpret APT data once it is collected.