Octane Elite EDS System
Octane Elite SDD
The game changing advancements in the Octane Elite EDS System with Octane Elite Silicon Drift Detector (SDDs) takes Energy Dispersive Spectroscopy (EDS) analysis to the next level. This system includes detectors which incorporate a silicon nitride (Si3N4) window, offering remarkable improvements in low energy sensitivity for light element detection and low kV microanalysis. The Octane Elite detectors also use technology, which yields high speed X-ray data processing within a smaller and fully vacuum encapsulated detector device.
Octane Elite Silicon Drift Detectors
The Octane Elite SDDs incorporate a silicon nitride (Si3N4) window, high speed electronics and a motorized slide. They can be combined with one of EDAX's Electron Backscatter Diffraction (EBSD) cameras and/or Wavelength Dispersive Spectrometry (WDS) detectors as part of the Pegasus EDS-EBSD Analysis System or Trident EDS-EBSD-WDS Analysis System for a complete materials characterization solution. For more information, please visit the Pegasus Analysis System and Trident Analysis System pages.
The Octane Elite SDDs are available in 2 models:
Octane Elite Plus - 30 mm2 chip
Octane Elite Super - 70 mm2 chip
Spectra acquired from a chromium nitride sample at 10 kV.
The comparison of the scaled spectra to the Cr K peak clearly
shows the increased nitrogen and oxygen peak intensities
achieved with a Si3N4 window.
Best Light Element Performance
The silicon nitride window offers major improvements compared to a polymer window, leading to greatly improved light element performance and significantly more critical data for the analyst.
The silicon nitride window offers superior low energy transmission compared to a polymer window.
Low kV Performance
The mechanical properties of Si3N4 allow the use of thinly fabricated windows, offering a great benefit in terms of sensitivity and optimal low voltage analysis.
Optimized SDD Electronics
- Fast pulse processing from mapping and quantification
- Optimized data quality at all count rates
- High resolution quantitative analysis at mapping speeds greater than 400,000 output cps
EDAX EDS systems with advanced detection electronics offer the highest throughput count rates on the market for the best possible analysis and increased productivity.
The material properties and durability of Si3N4 ensure the most robust and reliable detectors available for all EDS applications.
The motorized slide on the Octane Elite SDDs offers full control of the detector via the software and is optimal for analytical flexibility. It is ideal for all Focused Ion Beam (FIB) systems.
EDS Analysis Software allows users to optimize their analysis time and get the best possible data from their sample
- Smart Diagnostics and Smart Acquisition facilitate optimized collection and analysis conditions
- Smart Pulse Pile-Up Correction minimizes concerns typical of high count rate collections and allows maximum use of SDD technology
For more information, please visit the EDS Analysis Software page.