Videos

Visit the EDAXNews YouTube Channel for interesting material characterization applications, which use Energy Dispersive Spectroscopy (EDS), Electron Backscatter Diffraction (EBSD), Wavelength Dispersive Spectrometry (WDS) or X-ray Fluorescence (XRF) microanalysis tools to solve current analysis challenges. A complete listing of the videos available is below.

Energy Dispersive Spectroscopy (EDS) +
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- APEX Advanced Layout
  
  APEX Advanced Layout
  
  Learn about the advanced layout features in the EDAX APEX Software.
  
  Learn about the advanced layout features in the EDAX APEX Software.
- APEX General Layout
  
  APEX General Layout
  
  Learn about the general layout options in the EDAX APEX Software.
  
  Learn about the general layout options in the EDAX APEX Software.
- APEX Software for EDS Demonstration
  
  APEX Software for EDS Demonstration
  
  Get a look at the EDAX APEX Software for Energy Dispersive Spectroscopy (EDS).
  
  Get a look at the EDAX APEX Software for Energy Dispersive Spectroscopy (EDS).
- APEX Quick Start
  
  APEX Quick Start
  
  A basic quick start guide to the EDAX APEX Software.
  
  A basic quick start guide to the EDAX APEX Software.
- APEX Reporting Options
  
  APEX Reporting Options
  
  Learn about the reporting options in the EDAX APEX Software.
  
  Learn about the reporting options in the EDAX APEX Software.
- APEX Review Mode Overview
  
  APEX Review Mode Overview
  
  Learn about the Review mode in the EDAX APEX Software.
  
  Learn about the Review mode in the EDAX APEX Software.
- 3D EDS - Visualizing the True Structure of Materials
  
  3D EDS - Visualizing the True Structure of Materials
  
  A description of techniques using software that gives microanalysts the ability to extract both 3D images and detailed quantification results from their EDS analysis.
  
  A description of techniques using software that gives microanalysts the ability to extract both 3D images and detailed quantification results from their EDS analysis.
- APEX Analysis software for Element Silicon Drift Detectors (SDDs)
  
  APEX Analysis software for Element Silicon Drift Detectors (SDDs)
  
  A discussion about the EDAX APEX software for the Element EDS System.
  
  A discussion about the EDAX APEX software for the Element EDS System.
- Beam Sensitive Samples and EDS Analysis
  
  Beam Sensitive Samples and EDS Analysis
  
  Learn how EDS analysis can be performed on beam sensitive samples.
  
  Learn how EDS analysis can be performed on beam sensitive samples.
- EDAX Instant Insight - Element Silicon Drift Detector
  
  EDAX Instant Insight - Element Silicon Drift Detector
  
  An overview of the EDAX Element Silicon Drift Detector.
  
  An overview of the EDAX Element Silicon Drift Detector.
- EDS Spectrum Analysis and Background Modeling
  
  EDS Spectrum Analysis and Background Modeling
  
  While the characteristic peaks in EDS spectra are usually the focal point of any spectral analysis, the background signal and Bremsstrahlung also carry significant information about the sample and analysis conditions. Various models and filters are used to separate the background from the characteristic peaks with each having their advantages and drawbacks. In this presentation by Dr. Jens Rafaelsen, we go through some of the basics of EDS signal generation and detection in order to discuss the merits of the different approaches to the background signal and what information it can give us.
  
  While the characteristic peaks in EDS spectra are usually the focal point of any spectral analysis, the background signal and Bremsstrahlung also carry significant information about the sample and analysis conditions. Various models and filters are used to separate the background from the characteristic peaks with each having their advantages and drawbacks. In this presentation by Dr. Jens Rafaelsen, we go through some of the basics of EDS signal generation and detection in order to discuss the merits of the different approaches to the background signal and what information it can give us.
- Fast and High-Quality Elemental and Phase Mapping with APEX Software for EDS
  
  Fast and High-Quality Elemental and Phase Mapping with APEX Software for EDS
  
  Discover how the EDAX APEX Software for EDS can perform fast, high-quality elemental and phase mapping at 1M counts per second.
  
  Discover how the EDAX APEX Software for EDS can perform fast, high-quality elemental and phase mapping at 1M counts per second.
- Fast Phase Mapping
  
  Fast Phase Mapping
  
  An example of fast phase mapping with the EDAX APEX Software for Energy Dispersive Spectroscopy (EDS).
  
  An example of fast phase mapping with the EDAX APEX Software for Energy Dispersive Spectroscopy (EDS).
- Heating experiments with an in-situ stage combined with EDS and the advantages of WDS
  
  Heating experiments with an in-situ stage combined with EDS and the advantages of WDS
  
  For this presentation, the capability of the heating stage was combined with Energy Dispersive X-ray Spectroscopy (EDS) to record the data from a TiAl alloy. With this experiment, the stability of the material and the possibilities of the combined systems will be shown. The EDAX Octane Elite Super EDS System and the Gatan Murano™ heating stage were used for this experiment. The advantages of using Wavelength Dispersive X-ray Spectroscopy (WDS) to complete the analytic characterization will also be discussed.
  
  For this presentation, the capability of the heating stage was combined with Energy Dispersive X-ray Spectroscopy (EDS) to record the data from a TiAl alloy. With this experiment, the stability of the material and the possibilities of the combined systems will be shown. The EDAX Octane Elite Super EDS System and the Gatan Murano™ heating stage were used for this experiment. The advantages of using Wavelength Dispersive X-ray Spectroscopy (WDS) to complete the analytic characterization will also be discussed.
- Low kV EDS - Mapping at Low Limits
  
  Low kV EDS - Mapping at Low Limits
  
  Learn how to use EDS analysis at low kV.
  
  Learn how to use EDS analysis at low kV.
- Montage Large Area Mapping with APEX Software for EDS
  
  Montage Large Area Mapping with APEX Software for EDS
  
  An overview of the Montage Large Area Mapping function in the EDAX APEX™ Software for Energy Dispersive Spectroscopy (EDS).
  
  An overview of the Montage Large Area Mapping function in the EDAX APEX™ Software for Energy Dispersive Spectroscopy (EDS).
- Octane Elite Plus and Super Silicon Drift Detectors (SDDs)
  
  Octane Elite Plus and Super Silicon Drift Detectors (SDDs)
  
  A discussion of the Octane Elite Plus and Super Silicon Drift Detectors (SDDs).
  
  A discussion of the Octane Elite Plus and Super Silicon Drift Detectors (SDDs).
- Practical Applications of EDS in Materials Science
  
  Practical Applications of EDS in Materials Science
  
  Dr. Roger Ristau presents an overview of how Energy Dispersive Spectroscopy (EDS) can be used to solve a variety of different materials analysis challenges.
  
  Dr. Roger Ristau presents an overview of how Energy Dispersive Spectroscopy (EDS) can be used to solve a variety of different materials analysis challenges.
- Spectrum Library Matching
  
  Spectrum Library Matching
  
  A description of the powerful software package.
  
  A description of the powerful software package.
- TEAM™ 3D Imaging and Quant (IQ) - Dr. Patrick Camus
  
  TEAM™ 3D Imaging and Quant (IQ) - Dr. Patrick Camus
  
  A demonstration of the flexibility and power afforded by use of TEAM™ 3D IQ software to analyze EDS data slices.
  
  A demonstration of the flexibility and power afforded by use of TEAM™ 3D IQ software to analyze EDS data slices.
- The Material Properties of Silicon Nitride Windows
  
  The Material Properties of Silicon Nitride Windows
  
  Evaluation of the ability of the Silicon Nitride windows, used in the latest EDS silicon drift detectors, to withstand mechanical and physical abuse.
  
  Evaluation of the ability of the Silicon Nitride windows, used in the latest EDS silicon drift detectors, to withstand mechanical and physical abuse.
- Visualizing EDS Data from Simultaneous EDS-EBSD Acquisitions
  
  Visualizing EDS Data from Simultaneous EDS-EBSD Acquisitions
  
  Learn how to use the EDAX OIM Analysis™ Software to visualize EDS data from simultaneous EDS-EBSD acquisitions.
  
  Learn how to use the EDAX OIM Analysis™ Software to visualize EDS data from simultaneous EDS-EBSD acquisitions.

Electron Backscatter Diffraction (EBSD) +
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- A (R)evolution of EBSD Pattern Detection
  
  A (R)evolution of EBSD Pattern Detection
  
  This short video clip shows the next frontier in EBSD applications with amazing structural details and clarity.
  
  This short video clip shows the next frontier in EBSD applications with amazing structural details and clarity.
- Advanced EBSD Data Processing with OIM Analysis - Data Selection, Validation, and Quantification
  
  Advanced EBSD Data Processing with OIM Analysis - Data Selection, Validation, and Quantification
  
  In this video, the capabilities and workflow of the OIM Analysis software will be presented.
  
  In this video, the capabilities and workflow of the OIM Analysis software will be presented.
- An Introduction to APEX™ Software for EBSD
  
  An Introduction to APEX™ Software for EBSD
  
  An overview of the APEX™ Software for EBSD.
  
  An overview of the APEX™ Software for EBSD.
- APEX Velocity 4500
  
  APEX Velocity 4500
  
  See the EDAX Velocity Super EBSD Camera run at 4,500 indexed points per second in the APEX Software.
  
  See the EDAX Velocity Super EBSD Camera run at 4,500 indexed points per second in the APEX Software.
- Batch Scanning with APEX™ Software for EBSD
  
  Batch Scanning with APEX™ Software for EBSD
  
  An overview of the Batch Scanning feature in the APEX™ Software for EBSD.
  
  An overview of the Batch Scanning feature in the APEX™ Software for EBSD.
- Clarity EBSD Analysis System Presentation
  
  Clarity EBSD Analysis System Presentation
  
  Learn more about how the Clarity EBSD Analysis System can help you with your materials characterization problems.
  
  Learn more about how the Clarity EBSD Analysis System can help you with your materials characterization problems.
- Configuring the Velocity EBSD Camera within APEX Software for EBSD
  
  Configuring the Velocity EBSD Camera within APEX Software for EBSD
  
  A demonstration of how to properly set up a Velocity™ EBSD camera in the APEX™ Software for EBSD.
  
  A demonstration of how to properly set up a Velocity™ EBSD camera in the APEX™ Software for EBSD.
- Dynamic EBSD Pattern Simulation
  
  Dynamic EBSD Pattern Simulation
  
  Kinematical based simulation has helped move EBSD forward but lacks the ability to realistically capture the intensity of the bands in the patterns. In recent years, significant strides have been made to improve the simulation of EBSD patterns using a dynamical model of diffraction. The ability to more accurately simulate diffraction has helped advance EBSD development in several ways. In this presentation, we will briefly describe dynamical simulation of diffraction and three specific applications based on dynamical diffraction: reflector optimization, dictionary indexing, and background generation.
  
  Kinematical based simulation has helped move EBSD forward but lacks the ability to realistically capture the intensity of the bands in the patterns. In recent years, significant strides have been made to improve the simulation of EBSD patterns using a dynamical model of diffraction. The ability to more accurately simulate diffraction has helped advance EBSD development in several ways. In this presentation, we will briefly describe dynamical simulation of diffraction and three specific applications based on dynamical diffraction: reflector optimization, dictionary indexing, and background generation.
- EBSD Analysis of Beam Sensitive Materials by Direct Detection
  
  EBSD Analysis of Beam Sensitive Materials by Direct Detection
  
  EBSD pattern collection on beam-sensitive materials is limited by the beam current and accelerating voltage that can be applied without damaging the crystal structure. In this webinar, we will use a Clarity™ detector to explore the minimum number of electrons required to produce indexable diffraction patterns as a function of backscatter coefficient, fraction of diffracted electrons, and accelerating voltage. In many cases, indexable patterns can already be obtained using beam currents in the pA range with less than 20 electrons per pixel. When the obtained diffracted intensity is still insufficient to get good indexing, the quality of extremely poor patterns can be enhanced using NPAR™ by considering adjacent EBSD patterns without the need to increase the beam current. Unmatched performance for low-dose mapping will be illustrated with examples of biominerals and perovskite photovoltaic materials, along with applications in lithium battery technology and more.
  
  EBSD pattern collection on beam-sensitive materials is limited by the beam current and accelerating voltage that can be applied without damaging the crystal structure. In this webinar, we will use a Clarity™ detector to explore the minimum number of electrons required to produce indexable diffraction patterns as a function of backscatter coefficient, fraction of diffracted electrons, and accelerating voltage. In many cases, indexable patterns can already be obtained using beam currents in the pA range with less than 20 electrons per pixel. When the obtained diffracted intensity is still insufficient to get good indexing, the quality of extremely poor patterns can be enhanced using NPAR™ by considering adjacent EBSD patterns without the need to increase the beam current. Unmatched performance for low-dose mapping will be illustrated with examples of biominerals and perovskite photovoltaic materials, along with applications in lithium battery technology and more.
- EDAX Instant Insight - Atom Probe Assist
  
  EDAX Instant Insight - Atom Probe Assist
  
  A brief introduction to the EDAX Atom Probe Assist software module.
  
  A brief introduction to the EDAX Atom Probe Assist software module.
- EDAX Instant Insight - NPAR™
  
  EDAX Instant Insight - NPAR™
  
  A brief overview of the EDAX Neighbor Pattern Averaging/Reindexing (NPAR) software.
  
  A brief overview of the EDAX Neighbor Pattern Averaging/Reindexing (NPAR) software.
- EDAX Instant Insight - PRIAS™
  
  EDAX Instant Insight - PRIAS™
  
  A brief overview of the EDAX Pattern Region of Interest Analysis System (PRIAS) software.
  
  A brief overview of the EDAX Pattern Region of Interest Analysis System (PRIAS) software.
- The Evolution and Revolution in EBSD Pattern Detection
  
  The Evolution and Revolution in EBSD Pattern Detection
  
  A description of some history of EBSD analysis, a look at the current state of the game, and then at future developments, focusing especially on CMOS and DED detectors.
  
  A description of some history of EBSD analysis, a look at the current state of the game, and then at future developments, focusing especially on CMOS and DED detectors.
- Microstructural Characterization of Additive Manufactured Materials via EBSD
  
  Microstructural Characterization of Additive Manufactured Materials via EBSD
  
  A discussion of topics related to Electron Backscatter Diffraction (EBSD) and additive manufactured materials.
  
  A discussion of topics related to Electron Backscatter Diffraction (EBSD) and additive manufactured materials.
- Montage Large Area Mapping with APEX Software for EBSD
  
  Montage Large Area Mapping with APEX Software for EBSD
  
  Learn how to use the Montage Large Area Mapping function in APEX Software for EBSD.
  
  Learn how to use the Montage Large Area Mapping function in APEX Software for EBSD.
- New Developments in EBSD Detector Technology
  
  New Developments in EBSD Detector Technology
  
  Learn about the advantages of both CMOS and DED technology and the possible implications for new EBSD analysis systems.
  
  Learn about the advantages of both CMOS and DED technology and the possible implications for new EBSD analysis systems.
- OIM Analysis™ v8 - What's New, What It Can Do, and How It Can Improve Your Materials Characterization
  
  OIM Analysis™ v8 - What's New, What It Can Do, and How It Can Improve Your Materials Characterization
  
  Significant new functionality has been introduced into OIM™ Analysis with the introduction of v8. This video gives an introduction to the basic functionality of OIM™ Analysis as well as an overview of the exciting new features in v8 including: multithreading optimization, EBSD pattern reindexing, ChI-Scan, NPAR, anti-grain analysis and correlation plots.
  
  Significant new functionality has been introduced into OIM™ Analysis with the introduction of v8. This video gives an introduction to the basic functionality of OIM™ Analysis as well as an overview of the exciting new features in v8 including: multithreading optimization, EBSD pattern reindexing, ChI-Scan, NPAR, anti-grain analysis and correlation plots.
- OIM Analysis: Grain Size and Grain Structure Information
  
  OIM Analysis: Grain Size and Grain Structure Information
  
  Learn more about how the EDAX OIM Analysis™ Software can provide valuable information about grain size and grain structure.
  
  Learn more about how the EDAX OIM Analysis™ Software can provide valuable information about grain size and grain structure.
- OIM Analysis: Looking at the Texture or Preferred Orientation of Different Materials
  
  OIM Analysis: Looking at the Texture or Preferred Orientation of Different Materials
  
  Learn how to use the EDAX OIM Analysis™ Software to look at the texture or preferred orientation of various materials.
  
  Learn how to use the EDAX OIM Analysis™ Software to look at the texture or preferred orientation of various materials.
- Pattern Region of Interest Analysis System (PRIAS™)
  
  Pattern Region of Interest Analysis System (PRIAS™)
  
  This presentation outlines the analysis and imaging opportunities afforded by PRIAS imaging.
  
  This presentation outlines the analysis and imaging opportunities afforded by PRIAS imaging.
- t-EBSD - Orientation Measurements in TEM Foils
  
  t-EBSD - Orientation Measurements in TEM Foils
  
  A presentation about using Transmission EBSD to analyze TEM foils.
  
  A presentation about using Transmission EBSD to analyze TEM foils.
- Transmission EBSD - Part 1
  
  Transmission EBSD - Part 1
  
  Part One: high resolution EBSD; transmission EBSD introduction; applications.
  
  Part One: high resolution EBSD; transmission EBSD introduction; applications.
- Transmission EBSD - Part 2
  
  Transmission EBSD - Part 2
  
  Part Two: large area t-EBSD.
  
  Part Two: large area t-EBSD.
- Understanding and Combining the Reindexing Functions in OIM Analysis™ v8
  
  Understanding and Combining the Reindexing Functions in OIM Analysis™ v8
  
  This tutorial video shows some of the functions in the OIM Analysis v8 software.
  
  This tutorial video shows some of the functions in the OIM Analysis v8 software.
- Using Templates in OIM Analysis
  
  Using Templates in OIM Analysis
  
  Learn how to create and use templates in the EDAX OIM Analysis™ Software.
  
  Learn how to create and use templates in the EDAX OIM Analysis™ Software.
- Visualizing EDS Data from Simultaneous EDS-EBSD Acquisitions
  
  Visualizing EDS Data from Simultaneous EDS-EBSD Acquisitions
  
  Learn how to use the EDAX OIM Analysis™ Software to visualize EDS data from simultaneous EDS-EBSD acquisitions.
  
  Learn how to use the EDAX OIM Analysis™ Software to visualize EDS data from simultaneous EDS-EBSD acquisitions.

Wavelength Dispersive Spectrometry (WDS) +
- {2}
  
  {3}
- Heating experiments with an in-situ stage combined with EDS and the advantages of WDS
  
  Heating experiments with an in-situ stage combined with EDS and the advantages of WDS
  
  For this presentation, the capability of the heating stage was combined with Energy Dispersive X-ray Spectroscopy (EDS) to record the data from a TiAl alloy. With this experiment, the stability of the material and the possibilities of the combined systems will be shown. The EDAX Octane Elite Super EDS System and the Gatan Murano™ heating stage were used for this experiment. The advantages of using Wavelength Dispersive X-ray Spectroscopy (WDS) to complete the analytic characterization will also be discussed.
  
  For this presentation, the capability of the heating stage was combined with Energy Dispersive X-ray Spectroscopy (EDS) to record the data from a TiAl alloy. With this experiment, the stability of the material and the possibilities of the combined systems will be shown. The EDAX Octane Elite Super EDS System and the Gatan Murano™ heating stage were used for this experiment. The advantages of using Wavelength Dispersive X-ray Spectroscopy (WDS) to complete the analytic characterization will also be discussed.
- Integration of WDS into TEAM™
  
  Integration of WDS into TEAM™
  
  Overview of the Smart Features included in EDAX TEAM™ WDS Analysis System at a WDS Workshop.
  
  Overview of the Smart Features included in EDAX TEAM™ WDS Analysis System at a WDS Workshop.
- Optics - An Important Part of the WDS Spectrometer
  
  Optics - An Important Part of the WDS Spectrometer
  
  Presentation by Dr. Procop (Institute for Scientific Instruments, Berlin) from a WDS Workshop.
  
  Presentation by Dr. Procop (Institute for Scientific Instruments, Berlin) from a WDS Workshop.
- WDS Applications in Aircraft Technology
  
  WDS Applications in Aircraft Technology
  
  Presentation given by Tim Hattenberg of NLR, at a WDS Workshop.
  
  Presentation given by Tim Hattenberg of NLR, at a WDS Workshop.
- WDS in Glass Chemistry
  
  WDS in Glass Chemistry
  
  Presentation on the use of WDS in the analysis of glass given by Dr. Günter Völksch formerly of the University of Jena, at a WDS Workshop.
  
  Presentation on the use of WDS in the analysis of glass given by Dr. Günter Völksch formerly of the University of Jena, at a WDS Workshop.
- WDS - Where EDS Hits the Limit!
  
  WDS - Where EDS Hits the Limit!
  
  Presentation given at a WDS Workshop.
  
  Presentation given at a WDS Workshop.

Integrated Technologies +
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- Correlating EDS and Micro-XRF
  
  Correlating EDS and Micro-XRF
  
  This presentation looks at the relative advantages of EDS and Micro-XRF analysis and suggests how the two techniques can be used together for optimal materials characterization.
  
  This presentation looks at the relative advantages of EDS and Micro-XRF analysis and suggests how the two techniques can be used together for optimal materials characterization.
- Frontiers in Integrated Microanalysis
  
  Frontiers in Integrated Microanalysis
  
  An overview of EDS, EBSD, and WDS techniques as both stand-alone and integrated materials analysis tools and shows some of the latest advances in materials characterization.
  
  An overview of EDS, EBSD, and WDS techniques as both stand-alone and integrated materials analysis tools and shows some of the latest advances in materials characterization.
- In A Hurry To Get Things Done? How To Get High Quality, High Speed Data Collection with EDS and EBSD
  
  In A Hurry To Get Things Done? How To Get High Quality, High Speed Data Collection with EDS and EBSD
  
  This presentation gives an overview of EDAX hardware and software, which enables high-quality and high-speed data collection with EDS and EBSD.
  
  This presentation gives an overview of EDAX hardware and software, which enables high-quality and high-speed data collection with EDS and EBSD.
- Resolving crystallographically similar phases for more accurate characterization
  
  Resolving crystallographically similar phases for more accurate characterization
  
  This video shows how using simultaneously collected Energy Dispersive Spectroscopy (EDS) and Electron Backscatter Diffraction (EBSD) data can be used to improve phase mapping performance on samples with similar crystallographic phases. For these samples, the EBSD patterns for each phase are very similar due to similar cubic crystal structures. The EDS spectra are different, though, and can be used to determine which crystal structure to use for EBSD analysis. Combining both EDS and EBSD provides more accurate, quicker characterization than alternative methods.
  
  This video shows how using simultaneously collected Energy Dispersive Spectroscopy (EDS) and Electron Backscatter Diffraction (EBSD) data can be used to improve phase mapping performance on samples with similar crystallographic phases. For these samples, the EBSD patterns for each phase are very similar due to similar cubic crystal structures. The EDS spectra are different, though, and can be used to determine which crystal structure to use for EBSD analysis. Combining both EDS and EBSD provides more accurate, quicker characterization than alternative methods.
- Synergistic Operation of WDS with EDS
  
  Synergistic Operation of WDS with EDS
  
  Presentation given at a WDS Workshop.
  
  Presentation given at a WDS Workshop.
- Visualizing EDS Data from Simultaneous EDS-EBSD Acquisitions
  
  Visualizing EDS Data from Simultaneous EDS-EBSD Acquisitions
  
  Learn how to use the EDAX OIM Analysis™ Software to visualize EDS data from simultaneous EDS-EBSD acquisitions.
  
  Learn how to use the EDAX OIM Analysis™ Software to visualize EDS data from simultaneous EDS-EBSD acquisitions.