Skip to content
English
Search

Videos

Visit the EDAXNews YouTube Channel for interesting material characterization applications, which use Energy Dispersive Spectroscopy (EDS), Electron Backscatter Diffraction (EBSD), Wavelength Dispersive Spectrometry (WDS) or X-ray Fluorescence (XRF) microanalysis tools to solve current analysis challenges. A complete listing of the videos available is below.

  • Energy Dispersive Spectroscopy (EDS) +

    • 3D EDS - Visualizing the True Structure of Materials
      3D EDS - Visualizing the True Structure of Materials

      Dr. Patrick Camus and Dr. Travis Rampton describe techniques using the latest software which gives microanalysts the ability to extract both 3D images and detailed quantification results from their EDS analysis.

      Dr. Patrick Camus and Dr. Travis Rampton describe techniques using the latest software which gives microanalysts the ability to extract both 3D images and detailed quantification results from their EDS analysis.

    • Advanced Spectrum Analysis and Quantification Precision/Accuracy
      Advanced Spectrum Analysis and Quantification Precision/Accuracy

      This presentation by Dr. Jens Rafaelsen was recorded on the EDAX booth at M&M 2018.

      This presentation by Dr. Jens Rafaelsen was recorded on the EDAX booth at M&M 2018.

    • APEX™ Analysis software for Element Silicon Drift Detectors (SDDs) at M&M 2016
      APEX™ Analysis software for Element Silicon Drift Detectors (SDDs) at M&M 2016

      Tara Nylese talks about the EDAX APEX™ software for the Element EDS System at M&M 2016

      Tara Nylese talks about the EDAX APEX™ software for the Element EDS System at M&M 2016

    • Beam Sensitive Samples and EDS Analysis
      Beam Sensitive Samples and EDS Analysis

      This presentation was made by Dr. Jens Rafaelsen, EDS Applications Engineer at EDAX, at a joint workshop with TESCAN.

      This presentation was made by Dr. Jens Rafaelsen, EDS Applications Engineer at EDAX, at a joint workshop with TESCAN.

    • EDAX Instant Insight - Element Silicon Drift Detector
      EDAX Instant Insight - Element Silicon Drift Detector

      Applications Engineer, Shawn Wallace gives an overview of the Element Silicon Drift Detector from EDAX.

      Applications Engineer, Shawn Wallace gives an overview of the Element Silicon Drift Detector from EDAX.

    • EDS Spectrum Analysis and Background Modeling
      EDS Spectrum Analysis and Background Modeling

      While the characteristic peaks in EDS spectra are usually the focal point of any spectral analysis, the background signal and Bremsstrahlung also carry significant information about the sample and analysis conditions. Various models and filters are used to separate the background from the characteristic peaks with each having their advantages and drawbacks. In this presentation by Dr. Jens Rafaelsen at M&M 2019 in Portland, OR, we go through some of the basics of EDS signal generation and detection in order to discuss the merits of the different approaches to the background signal and what information it can give us.

      While the characteristic peaks in EDS spectra are usually the focal point of any spectral analysis, the background signal and Bremsstrahlung also carry significant information about the sample and analysis conditions. Various models and filters are used to separate the background from the characteristic peaks with each having their advantages and drawbacks. In this presentation by Dr. Jens Rafaelsen at M&M 2019 in Portland, OR, we go through some of the basics of EDS signal generation and detection in order to discuss the merits of the different approaches to the background signal and what information it can give us.

    • Low kV EDS - Mapping at Low Limits
      Low kV EDS - Mapping at Low Limits

      Dr. Jens Rafaelsen presents a 'Lunch and Learn' session at M&M 2015.

      Dr. Jens Rafaelsen presents a 'Lunch and Learn' session at M&M 2015.

    • Octane Elite Plus and Super Silicon Drift Detectors (SDDs) at M&M 2016
      Octane Elite Plus and Super Silicon Drift Detectors (SDDs) at M&M 2016

      Tara Nylese discusses the Octane Elite Plus and Super Silicon Drift Detectors (SDDs) at Microscopy & Microanalysis 2016.

      Tara Nylese discusses the Octane Elite Plus and Super Silicon Drift Detectors (SDDs) at Microscopy & Microanalysis 2016.

    • Practical Applications of EDS in Materials Science
      Practical Applications of EDS in Materials Science

      Dr. Roger A. Ristau, Managing Director of the Center for Advanced Microscopy and Materials Analysis (CAMMA) at the University of Connecticut, presents an overview of how Energy Dispersive Spectroscopy (EDS) can be used to solve a variety of different materials analysis challenges.

      Dr. Roger A. Ristau, Managing Director of the Center for Advanced Microscopy and Materials Analysis (CAMMA) at the University of Connecticut, presents an overview of how Energy Dispersive Spectroscopy (EDS) can be used to solve a variety of different materials analysis challenges.

    • Spectrum Library Matching
      Spectrum Library Matching

      EDAX Global Applications Manager Tara Nylese describes a powerful new addition to TEAM™ Analysis software packages.

      EDAX Global Applications Manager Tara Nylese describes a powerful new addition to TEAM™ Analysis software packages.

    • TEAM™ 3D Imaging and Quant (IQ) - Dr. Patrick Camus
      TEAM™ 3D Imaging and Quant (IQ) - Dr. Patrick Camus

      Dr. Patrick Camus of EDAX demonstrates the flexibility and power afforded by use of TEAM™ 3D IQ software to analyze EDS data slices.

      Dr. Patrick Camus of EDAX demonstrates the flexibility and power afforded by use of TEAM™ 3D IQ software to analyze EDS data slices.

    • TEAM™ 3D Imaging and Quant (IQ) - Tara Nylese
      TEAM™ 3D Imaging and Quant (IQ) - Tara Nylese

      Tara Nylese gives a presentation, originally recorded at M&M 2015. TEAM™ 3D IQ is a 3D solution for EDS data, which performs both imaging and analysis operations within the same software package, offering the most comprehensive visual and analytical interpretation of EDS data available.

      Tara Nylese gives a presentation, originally recorded at M&M 2015. TEAM™ 3D IQ is a 3D solution for EDS data, which performs both imaging and analysis operations within the same software package, offering the most comprehensive visual and analytical interpretation of EDS data available.

    • The Material Properties of Silicon Nitride Windows
      The Material Properties of Silicon Nitride Windows

      Evaluation of the ability of the Silicon Nitride windows, used in the latest EDS silicon drift detectors, to withstand mechanical and physical abuse.

      Evaluation of the ability of the Silicon Nitride windows, used in the latest EDS silicon drift detectors, to withstand mechanical and physical abuse.

  • Electron Backscatter Diffraction (EBSD) +

    • A (R)evolution of EBSD Pattern Detection
      A (R)evolution of EBSD Pattern Detection

      This short video clip shows an animation, which was presented by Dr. René de Kloe at RMS EBSD 2019. It shows the next frontier in EBSD applications with amazing structural details and clarity.

      This short video clip shows an animation, which was presented by Dr. René de Kloe at RMS EBSD 2019. It shows the next frontier in EBSD applications with amazing structural details and clarity.

    • An Introduction to APEX™ Software for EBSD
      An Introduction to APEX™ Software for EBSD

      EBSD Product Manager, Matt Nowell gives an overview of the APEX™ Software for EBSD.

      EBSD Product Manager, Matt Nowell gives an overview of the APEX™ Software for EBSD.

    • Dynamic EBSD Pattern Simulation
      Dynamic EBSD Pattern Simulation

      Kinematical based simulation has helped move EBSD forward but lacks the ability to realistically capture the intensity of the bands in the patterns. In recent years, significant strides have been made to improve the simulation of EBSD patterns using a dynamical model of diffraction. The ability to more accurately simulate diffraction has helped advance EBSD development in several ways. In this presentation, we will briefly describe dynamical simulation of diffraction and three specific applications based on dynamical diffraction: reflector optimization, dictionary indexing, and background generation.

      This is the video of a presentation made by Dr. Stuart Wright as a Lunch & Learn session at M&M 2019.

      Kinematical based simulation has helped move EBSD forward but lacks the ability to realistically capture the intensity of the bands in the patterns. In recent years, significant strides have been made to improve the simulation of EBSD patterns using a dynamical model of diffraction. The ability to more accurately simulate diffraction has helped advance EBSD development in several ways. In this presentation, we will briefly describe dynamical simulation of diffraction and three specific applications based on dynamical diffraction: reflector optimization, dictionary indexing, and background generation.

      This is the video of a presentation made by Dr. Stuart Wright as a Lunch & Learn session at M&M 2019.

    • EDAX Instant Insight - Atom Probe Assist
      EDAX Instant Insight - Atom Probe Assist

      A brief introduction to the EDAX Atom Probe Assist software module, given by EBSD product manager, Matt Nowell.

      A brief introduction to the EDAX Atom Probe Assist software module, given by EBSD product manager, Matt Nowell.

    • EDAX Instant Insight - Hikari EBSD Camera from EDAX
      EDAX Instant Insight - Hikari EBSD Camera from EDAX

      'EDAX Instant Insight' into the Hikari EBSD Camera - first of a new series of ≈2 minute product overviews from EDAX.

      'EDAX Instant Insight' into the Hikari EBSD Camera - first of a new series of ≈2 minute product overviews from EDAX.

    • EDAX Instant Insight - NPAR™
      EDAX Instant Insight - NPAR™

      The EDAX Neighbor Pattern Averaging/Reindexing (NPAR™) software is briefly described by EBSD Product Manager Matt Nowell.

      The EDAX Neighbor Pattern Averaging/Reindexing (NPAR™) software is briefly described by EBSD Product Manager Matt Nowell.

    • EDAX Instant Insight - PRIAS™
      EDAX Instant Insight - PRIAS™

      The EDAX Pattern Region of Interest Analysis System (PRIAS™) software is briefly described by EBSD Product Manager Matt Nowell.

      The EDAX Pattern Region of Interest Analysis System (PRIAS™) software is briefly described by EBSD Product Manager Matt Nowell.

    • EDAX Instant Insight - Velocity™ EBSD Camera Series
      EDAX Instant Insight - Velocity™ EBSD Camera Series

      EDAX EBSD Product Manager Matt Nowell describes the new Velocity™ EBSD Camera Series, which offers high-speed EBSD mapping with the highest indexing performance on real world materials. Powered by a CMOS sensor, the Velocity™ combines fast acquisition with high sensitivity and low noise performance for optimal collection and data quality.

      EDAX EBSD Product Manager Matt Nowell describes the new Velocity™ EBSD Camera Series, which offers high-speed EBSD mapping with the highest indexing performance on real world materials. Powered by a CMOS sensor, the Velocity™ combines fast acquisition with high sensitivity and low noise performance for optimal collection and data quality.

    • The Evolution and Revolution in EBSD Pattern Detection
      The Evolution and Revolution in EBSD Pattern Detection

      EDAX EBSD Product Manager, Matt Nowell and Applications Specialist, Dr. Rene de Kloe presented this Lunch & Learn at M&M 2019. They describe some history of EBSD analysis, look at the current state of the game and then at future developments, focusing especially on CMOS and DED detectors.

      EDAX EBSD Product Manager, Matt Nowell and Applications Specialist, Dr. Rene de Kloe presented this Lunch & Learn at M&M 2019. They describe some history of EBSD analysis, look at the current state of the game and then at future developments, focusing especially on CMOS and DED detectors.

    • New Developments in EBSD Detector Technology
      New Developments in EBSD Detector Technology

      EDAX EBSD Product Manager, Matt Nowell talks about the advantages of both CMOS and DED technology and discusses the possible implications for new EBSD analysis systems. This presentation was originally made at M&M 2018 in Baltimore, MD.

      EDAX EBSD Product Manager, Matt Nowell talks about the advantages of both CMOS and DED technology and discusses the possible implications for new EBSD analysis systems. This presentation was originally made at M&M 2018 in Baltimore, MD.

    • NPAR™ Demo Video
      NPAR™ Demo Video

      EBSD Product Manager, Matt Nowell gives a short software demonstration of 'Neighbor Pattern Averaging and Reindexing' (NPAR™).

      EBSD Product Manager, Matt Nowell gives a short software demonstration of 'Neighbor Pattern Averaging and Reindexing' (NPAR™).

    • OIM Analysis™ v8 - What's New, What It Can Do, and How It Can Improve Your Materials Characterization - M&M 2016 Lunch & Learn
      OIM Analysis™ v8 - What's New, What It Can Do, and How It Can Improve Your Materials Characterization - M&M 2016 Lunch & Learn

      Significant new functionality has been introduced into OIM Analysis™ with the introduction of v8. This video gives an introduction to the basic functionality of OIM Analysis™ as well as an overview of the exciting new features in v8 including: multithreading optimization, EBSD pattern reindexing, ChI-Scan™, NPAR™, anti-grain analysis and correlation plots.

      Significant new functionality has been introduced into OIM Analysis™ with the introduction of v8. This video gives an introduction to the basic functionality of OIM Analysis™ as well as an overview of the exciting new features in v8 including: multithreading optimization, EBSD pattern reindexing, ChI-Scan™, NPAR™, anti-grain analysis and correlation plots.

    • Pattern Region of Interest Analysis System (PRIAS™)
      Pattern Region of Interest Analysis System (PRIAS™)

      In this presentation from M&M 2014, Matt Nowell outlines the analysis and imaging opportunities afforded by PRIAS™ imaging.

      In this presentation from M&M 2014, Matt Nowell outlines the analysis and imaging opportunities afforded by PRIAS™ imaging.

    • Recent Advances and Innovations in EBSD Microstructure Characterization
      Recent Advances and Innovations in EBSD Microstructure Characterization

      EBSD Product Manager, Matt Nowell looks at recent developments in EBSD analysis tools: Hikari cameras, PRIAS™ imaging and OIM features. Recorded at the EDAX EBSD User Workshop in Wiesbaden, November 2014.

      EBSD Product Manager, Matt Nowell looks at recent developments in EBSD analysis tools: Hikari cameras, PRIAS™ imaging and OIM features. Recorded at the EDAX EBSD User Workshop in Wiesbaden, November 2014.

    • t-EBSD - Orientation Measurements in TEM Foils
      t-EBSD - Orientation Measurements in TEM Foils

      This presentation was originally given by Dr. Rene de Kloe at M&M 2015.

      This presentation was originally given by Dr. Rene de Kloe at M&M 2015.

    • Transmission EBSD - Part 1
      Transmission EBSD - Part 1

      Part One: high resolution EBSD; transmission EBSD introduction; applications. Recorded at EBSD Workshop 2014.

      Part One: high resolution EBSD; transmission EBSD introduction; applications. Recorded at EBSD Workshop 2014.

    • Transmission EBSD - Part 2
      Transmission EBSD - Part 2

      Part Two: large area t-EBSD. Recorded at EBSD Workshop 2014

      Part Two: large area t-EBSD. Recorded at EBSD Workshop 2014

    • Understanding and Combining the Reindexing Functions in OIM Analysis™ v8
      Understanding and Combining the Reindexing Functions in OIM Analysis™ v8

      This tutorial video shows a presentation given by Applications Specialist Shawn Wallace at M&M 2018.

      This tutorial video shows a presentation given by Applications Specialist Shawn Wallace at M&M 2018.

  • Wavelength Dispersive Spectrometry (WDS) +

    • Integration of WDS into TEAM™
      Integration of WDS into TEAM™

      Overview of the Smart Features included in EDAX TEAM™ WDS Analysis System given by Michaela Schleifer, European Applications Manager, at the TEAM™ WDS Workshop in Wiesbaden, November 2013.

      Overview of the Smart Features included in EDAX TEAM™ WDS Analysis System given by Michaela Schleifer, European Applications Manager, at the TEAM™ WDS Workshop in Wiesbaden, November 2013.

    • Optics - An Important Part of the WDS Spectrometer
      Optics - An Important Part of the WDS Spectrometer

      Presentation by Dr. Procop (Institute for Scientific Instruments, Berlin) from EDAX TEAM™ WDS Workshop, November 2013

      Presentation by Dr. Procop (Institute for Scientific Instruments, Berlin) from EDAX TEAM™ WDS Workshop, November 2013

    • WDS Applications in Aircraft Technology
      WDS Applications in Aircraft Technology

      Presentation given by Tim Hattenberg of NLR, at TEAM™ WDS Workshop in Wiesbaden, November 2013.

      Presentation given by Tim Hattenberg of NLR, at TEAM™ WDS Workshop in Wiesbaden, November 2013.

    • WDS in Glass Chemistry
      WDS in Glass Chemistry

      Presentation on the use of WDS in the analysis of glass given by Dr. Günter Völksch formerly of the University of Jena, at the TEAM™ WDS Workshop in Wiesbaden, November 2013

      Presentation on the use of WDS in the analysis of glass given by Dr. Günter Völksch formerly of the University of Jena, at the TEAM™ WDS Workshop in Wiesbaden, November 2013

    • WDS - Where EDS Hits the Limit!
      WDS - Where EDS Hits the Limit!

      Presentation by EDAX European Applications Manager, Michaela Schleifer, given at the TEAM™ WDS Workshop in Wiesbaden, November 2013.

      Presentation by EDAX European Applications Manager, Michaela Schleifer, given at the TEAM™ WDS Workshop in Wiesbaden, November 2013.

  • Integrated Technologies +

    • Correlating EDS and Micro-XRF
      Correlating EDS and Micro-XRF

      This presentation from M&M 2014 looks at the relative advantages of EDS and Micro-XRF analysis and suggests how the two techniques can be used together for optimal materials characterization.

      This presentation from M&M 2014 looks at the relative advantages of EDS and Micro-XRF analysis and suggests how the two techniques can be used together for optimal materials characterization.

    • EDAX Instant Insight - Phase Mapping with EDAX TEAM™ Software
      EDAX Instant Insight - Phase Mapping with EDAX TEAM™ Software

      'EDAX instant Insight' into Phase Mapping with TEAM™ Software. This new series of videos gives a ≈2 minute overview of specific EDAX products.

      'EDAX instant Insight' into Phase Mapping with TEAM™ Software. This new series of videos gives a ≈2 minute overview of specific EDAX products.

    • Frontiers in Integrated Microanalysis
      Frontiers in Integrated Microanalysis

      EDAX Global Applications Manager, Tara Nylese presents an overview of EDS, EBSD and WDS techniques as both stand-alone and integrated materials analysis tools and shows some of the latest advances in materials characterization.

      EDAX Global Applications Manager, Tara Nylese presents an overview of EDS, EBSD and WDS techniques as both stand-alone and integrated materials analysis tools and shows some of the latest advances in materials characterization.

    • In A Hurry To Get Things Done? How To Get High Quality, High Speed Data Collection with EDS and EBSD - M&M 2016 Lunch & Learn
      In A Hurry To Get Things Done? How To Get High Quality, High Speed Data Collection with EDS and EBSD - M&M 2016 Lunch & Learn

      In this presentation from M&M 2016, Global Applications Manager, Tara Nylese and Applications Specialist, Shawn Wallace give an overview of the latest hardware and software, which enable high quality and high speed data collection with EDS and EBSD.

      In this presentation from M&M 2016, Global Applications Manager, Tara Nylese and Applications Specialist, Shawn Wallace give an overview of the latest hardware and software, which enable high quality and high speed data collection with EDS and EBSD.

    • Synergistic Operation of WDS with EDS
      Synergistic Operation of WDS with EDS

      Presentation given by Dr. Patrick Camus, Principal Product Development Engineer at EDAX, at the TEAM™ WDS Workshop in Wiesbaden, November 2013.

      Presentation given by Dr. Patrick Camus, Principal Product Development Engineer at EDAX, at the TEAM™ WDS Workshop in Wiesbaden, November 2013.

    • Tara Nylese - EDAX at M&M 2015
      Tara Nylese - EDAX at M&M 2015

      Tara Nylese reveals the newly released Octane Elite detector from EDAX

      Tara Nylese reveals the newly released Octane Elite detector from EDAX

    • TEAM™ Analysis Systems
      TEAM™ Analysis Systems

      Overview of EDAX TEAM™ Analysis Systems for complete materials characterization presented by Mike Coy, former Global Marketing Manager at the TEAM™ WDS Workshop in Wiesbaden, November 2013.

      Overview of EDAX TEAM™ Analysis Systems for complete materials characterization presented by Mike Coy, former Global Marketing Manager at the TEAM™ WDS Workshop in Wiesbaden, November 2013.

    • Welcome to EDAX!
      Welcome to EDAX!

      This is a video overview of microanalysis techniques and the EDAX products, which deliver them.

      This is a video overview of microanalysis techniques and the EDAX products, which deliver them.

  • X-ray Fluorescence (XRF) +

    • EDAX Instant Insight - XLNCE SMX XRF Analyzers
      EDAX Instant Insight - XLNCE SMX XRF Analyzers

      EDAX Instant Insight into the XLNCE SMX XRF Series - a short video overview of the SMX-ILH and SMX-BEN Analyzers.

      EDAX Instant Insight into the XLNCE SMX XRF Series - a short video overview of the SMX-ILH and SMX-BEN Analyzers.

    • XLNCE SMX-BEN XRF Analyzer
      XLNCE SMX-BEN XRF Analyzer

      The XLNCE SMX-BEN is a benchtop Energy Dispersive X-ray Fluorescence (EDXRF) analyzer that provides non-destructive, coating thickness and composition measurement for process development, process control, and quality assurance. In this video Sia Afshari, Product Manager, gives an overview of the analyzer.

      The XLNCE SMX-BEN is a benchtop Energy Dispersive X-ray Fluorescence (EDXRF) analyzer that provides non-destructive, coating thickness and composition measurement for process development, process control, and quality assurance. In this video Sia Afshari, Product Manager, gives an overview of the analyzer.

Follow on WordPress.com