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  • 2010s +


    2017

    Release of APEX™ 1.1 software for Element EDS Systems
    Introduction of the Octane Elect EDS System

    2016

    Introduction of OIM Analysis™ v8.0
    Release of the APEX™ Analysis Software for Tabletop Scanning Electron Microscopes (SEMs)
    Introduction of the Octane Elite Plus and Super Silicon Drift Detectors (SDDs)
    Launch of the XLNCE SMX-ILH In-Line XRF Analyzer

    2015

    Release of TEAM™ 4.3 Software
    Introduction of the Octane Elite Silicon Drift Detector (SDD) Series
    Launch of the XLNCE SMX-BEN XRF Analyzer

    2014

    Launch of the Element SDD Series
    Release of TEAM™ 3D Imaging and Quant (IQ)
    Introduction of Pattern Region of Interest Analysis System (PRIAS™), a synergistic new imaging technique to visualize microstructure and provide new views of materials
    Introduction of Octane Silicon Drift Detector Series for the Transmission Electron Microscope

    2013

    Introduction of faster, more productive Hikari XP and DigiView EBSD cameras
    Release of TEAM™ Neptune and TEAM™ Trident integrated analysis systems
    Introduction of WDS as part of the TEAM™ Analysis System

    2012

    EDAX celebrates its 50th anniversary
    Introduction of the Octane Silicon Drift Detector (SDD) Series
    Release of TEAM™ Pegasus integrated EDS and EBSD analysis system

    2011

    Release of Coating Analysis Software for Orbis Micro-XRF Systems
    Introduction of the Apollo XLT SDD Series for the Transmission Electron Microscope (TEM)

    2010

    Introduction of OIM 6.0 Software