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OIM Analysis
OIM Analysis v8
OIM Analysis v8
With the addition of new functionality and features, OIM Analysis™ v8 has reset the standard for EBSD data analysis capability and enables users to achieve new insight into microstructural characterization.
Resources
The new features include:
Multithreaded Operation
- optimized code to take advantage of modern multi-core CPUs for faster map rendering, highlighting and characterization calculations
EBSD Pattern Indexing
- ability to reindex points within an OIM mapping dataset while away from the Scanning Electron Microscope (SEM) using EDAX's triplet indexing, ChI-Scan™, and Neighbor Pattern Averaging and Reindexing (NPAR™) technology
Anti-Grains Analysis
- allows for characterization of non-indexed data points
Correlative Plots
- visualization of the relationship between two EBSD measurement values when plotted relative to each other
HDF5 Support
- EBSD patterns are saved in HDF5 format and are compatible with Cross Court for HR-EBSD
Correlative Microscopy
- import of spatially-specific measurements for visualization and corrective analysis
Resources
Brochure
An Introduction to OIM Analysis Brochure
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OIM Analysis Product Bulletin
OIM Matrix Product Bulletin
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