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OIMTM is commonly used to evaluate many types of materials and minerals. To maximize the performance of EBSD, sample sample preparation must be carefully performed. Many samples have their own requirements for preparation. The majority of samples require some degree of mechanical polishing. There are six steps to a complete mechanical polish: Sectioning, Coarse Grinding, Mounting, Fine Grounding, Rough Polishing, and Final Polishing. In addition there are many metallographic guidelines available on the Internet, including Metallography.com and the websites of major metallographic consumable suppliers such as Buehler, Struers, and LECO. |
OIMTM map of a partially prepared Al-Si alloy microstructure that exhibits surface scratches and requires more preparation. |
There are several requirements for effective EBSD sample preparation beyond the preparation methods used for traditional optical microstructural examination:
Download EDAX-TSL’s Specimen Preparation Guide for a full, step by step process Below are a series of image pairs showing electron micrographs (left) and EBSD images (right) and the effects of progressively better sample preparation on the pattern quality observed. |
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![]() 1200 grit SiC polish |
![]() No pattern visible |
![]() 3 micron diamond polish |
![]() No pattern visible |
![]() 1 micron alpha alumina |
![]() Pattern Image Quality (IQ) = 25 |
![]() 0.3 micron alpha alumina |
![]() Pattern IQ = 166 |
![]() 10 minutes collodial silica |
![]() Pattern IQ = 177 |
![]() 30 minutes colloidal silica |
![]() Pattern IQ = 224 |
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