A comprehensive set of tools is provided to allow access and effective use of up to 3 unique databases.

EDAX-TSL Certified Database of Materials

• Includes chemistry and crystallographic parameters
  
• Checked for accuracy for use in electron diffraction work
  
• Contains about 200 common materials including metals, minerals, semiconductor and superconductor materials, etc.
  
• To improve analysis throughput, searches of the TSL database can be restricted to a specific group or groups of possible materials

ICDD (formerly JCPDS) Database

• Delphi provides access to the Powder Diffraction File produced by the International Center for Diffraction Data (ICDD). This popular database contains over 254,000 entries
  
• Features include: advanced indexing to greatly speed searches, selection of the groups of materials of interest (shown on left) allowing restricted searches to only relevant materials
  
• Full display of ICDD entry data from card including reflector planes and corresponding dspacing

User Database

• Build one or more custom libraries of identified materials perhaps related to sample type
  
• Set as the default database and use it with a single mouse click for maximum search speed

Other Databases Supported

• American Mineralogist Crystal Structure (AMCS) Database
• Inorganic Crystal Structure Database (ICSD)
• NIST Structural Database

Tools Available for the Advanced User

• Simulation of EBSD pattern and unit cell
  
• Interactive Reflector Editor-ICDD X-ray database entries must be converted for use in electron diffraction. Sometimes the strongest X-ray reflectors, as given in the ICDD database are not the strongest electron diffraction reflectors. The reflector editor allows ordering, addition and removal of reflectors
  
• Structure generator to build and refine lattice structures for work with new phases