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Hikari EBSD Detector

High Speed EBSD: Now at 450 Indexed patterns per second (pps)

Short Description:
The Hikari continues EDAX-TSL's tradition of pioneering EBSD technology. Hikari is a full featured, completely integrated CCD-based detector that excels at all EBSD applications, whether they require speed or sensitivity and signal to noise performance. Hikari can achieve simultaneous acquisition and indexing speeds of 450 patterns per second for many materials.

Features

Speed: 45 0 indexed patterns per second
With the OIM^TM 5.2 software release, EDAX introduces faster EBSD data collection speeds and additional software functionality
Triplet Indexing of patterns enables more efficient and more accurate pattern indexing at higher speeds
Multi-threaded programming harnesses the speed and power of the dual-processor PC
Camera console integrated within OIM^TM software
Customizable image processing functionality
User configurable camera positioning
High precision camera slide
Sleeker camera design, advanced CCD camera chip and improved pattern imaging optics

111 Crystal Direction Map

Performance

The Hikari detector performs EBSD scans at 450 indexed points per second (pps) while accomplishing indexing success rates of greater than 99%. The combination of high-speed pattern acquisition with reliable and accurate pattern analysis provided by the Hikari allows users to obtain consistent high-quality data in shorter times. This high level of performance is unequalled by any other EDSD product.

Benefits

Significantly reduces OIM^TM scan times
Reduces the need for overnight scans
Blend of speed and quality well suited for both production and research lab environments
Rapid collection rates reduce susceptibility to long term SEM beam instability
Ideal for combined ion/electron beam
applications of 3D OIM^TM EBSD

IPF + IQ Map

Hikari pattern image processing functionality within OIM^TM DC

Control

The new and improved camera control console is now embedded within the Orientation Imaging Microscopy (OIM^TM ) data collection software. The acquisition and optimization controls are organized in an easy-to-follow layout. Image processing functionality is available for optimization of pattern display, depending on the preferences of the user. The user may save preferred processing routines are recipes for convenient recall at a later date.