TSL OIM^TM  Academy

Since the founders of TSL introduced Orientation Imaging Microscopy (OIM^TM) in 1994, it has rapidly become a standard microstructural characterization tool in hundreds of facilities around the world. OIM’s flexible data collection and analysis tools are unparalleled, and the capabilities increase with each new version of OIM^TM software.

To ensure that TSL users get the most from their systems, we offer periodic training by expert users. In fact, we offer the best customer training in the industry – at least that’s what customers tell us. The course includes lectures, computer time, and microscope time, covering everything from the basics to advanced hands-on operation.

The following schedule contains a brief description of the topics that will be covered during the three day course:

       

Day 1 Crystallography Concepts used in EBSD Sample Preparation Hardware Setup and Operation OIMTM Data Collection-Calibration Indexing Material Files Scan Strategies Day 2 Interactive Analysis on the SEM Phase ID OIMTM Analysis-Maps Plots Charts Interactive Point and Click Analysis Day 3 Cross Correlation and Partitioning of data Multi-phase analysis Data cleanup Multi-dataset analysis Report Strategies Putting it all together Discussion and wrap up