Bismuth

Electron Backscatter Diffraction (EBSD)

BSCCO (Bi-Sr-Ca-Cu-Co) Superconductor

EBSD Pattern

EDAX Periodic Table of Elements - Bismuth

Orientation & IQ map overlaid on SED image

EDAX Periodic Table of Elements - Bismuth

EDAX Periodic Table of Elements - Bismuth

Orientation & IQ map

EDAX Periodic Table of Elements - Bismuth

EDAX Periodic Table of Elements - Bismuth 

Phase & IQ map

EDAX Periodic Table of Elements - Bismuth

Sn-Bi
EDAX Periodic Table of Elements - Bismuth 

Phase orientation and orientation deviation maps from a single p-type BiTe device element
Phase map (left), Orientation map (center), and Orientation Deviation map (right) from a single p-type Bi-Te device element. The phase map shows the presence of a tin phase with the Thermoelectric (TE) element and the orientation spread map shows large orientation gradients present at the tin-Bi2-Te3 interfaces. These strained regions will affect the thermal and electrical properties of the TE material.

EDAX Periodic Table of Elements - Bismuth
Phase map combined with a gray scale EBSD IQ map from a cross-sectioned BiTe device 
Phase map combined with gray-scale EBSD image quality map generated from simultaneously collected EBSD-EDS data from cross-sectioned Bi-Te TE device showing the many phases that are present in a TE device. The microstructures of each of these phases, as well as the interfaces between the phases, contribute to the overall performance of the device and can be optimized for increased efficiency.