History

EDAX is the global leader in Energy Dispersive X-ray Spectroscopy (EDS), Electron Backscatter Diffraction (EBSD), Wavelength Dispersive X-ray Spectrometry (WDS) and X-ray Fluorescence (XRF) systems. EDAX manufactures, markets, and services high-quality products and systems for leading companies in semiconductors, metals, and geological, biological, material and ceramics markets.

Since its founding in 1962, EDAX has utilized its knowledge and expertise to develop ultra-sensitive silicon radiation sensors, digital electronics and specialized application software that facilitate solutions to research, development and industrial requirements.

EDAX is a unit of AMETEK Materials Analysis Division. AMETEK, Inc. is a leading global manufacturer of electronic instruments and electromechanical devices with annual sales of more than $4.0 billion.

Some landmark events that portray EDAX's commitment to maintaining a technology leadership position include:
  • 2010s +


    2017

    Release of APEX™ 1.1 software for Element EDS Systems
    Introduction of the Octane Elect EDS System

    2016

    Introduction of OIM Analysis™ v8.0
    Release of the APEX™ Analysis Software for Tabletop Scanning Electron Microscopes (SEMs)
    Introduction of the Octane Elite Plus and Super Silicon Drift Detectors (SDDs)
    Launch of the XLNCE SMX-ILH In-Line XRF Analyzer

    2015

    Release of TEAM™ 4.3 Software
    Introduction of the Octane Elite Silicon Drift Detector (SDD) Series
    Launch of the XLNCE SMX-BEN XRF Analyzer

    2014

    Launch of the Element SDD Series
    Release of TEAM™ 3D Imaging and Quant (IQ)
    Introduction of Pattern Region of Interest Analysis System (PRIAS™), a synergistic new imaging technique to visualize microstructure and provide new views of materials
    Introduction of Octane Silicon Drift Detector Series for the Transmission Electron Microscope

    2013

    Introduction of faster, more productive Hikari XP and DigiView EBSD cameras
    Release of TEAM™ Neptune and TEAM™ Trident integrated analysis systems
    Introduction of WDS as part of the TEAM™ Analysis System

    2012

    EDAX celebrates its 50th anniversary
    Introduction of the Octane Silicon Drift Detector (SDD) Series
    Release of TEAM™ Pegasus integrated EDS and EBSD analysis system

    2011

    Release of Coating Analysis Software for Orbis Micro-XRF Systems
    Introduction of the Apollo XLT SDD Series for the Transmission Electron Microscope (TEM)

    2010

    Introduction of OIM 6.0 Software

  • 2000s +


    2009

    Introduction of the TEAM™ EDS Analysis System
    Introduction of the Apollo X and XL Silicon Drift Detector Series

    2008

    Introduction of the Orbis Micro-XRF Spectrometer
    Introduction of the Apex X-ray Microanalysis System
    Introduction of the DigiView IV Electron Backscatter Diffraction Detector
    Release of EXpert ID Revolutionary Element Identification Software Available within Genesis

    2007

    Introduction of the Apollo Silicon Drift Detector Series

    2006

    EDAX and SPECTRO Analytical Instruments become Business Units within the new AMETEK Materials Analysis Division
    Introduction of high speed Hikari EBSD Detector
    Introduction of OIM 3D Data Collection and Processing Tool 
    Introduction of the LambdaSpec (TEXS) Wavelength Dispersive Detector

    2005

    Introduction of TEXS HP wavelength dispersive X-ray spectrometer
    Introduction of the Eagle III XPL automated filter option
    Introduction of DigiView III CCD Detector

    2004

    Introduction of Trident three-in-one analysis tool Combines EDS, EBSD and WDS
    Introduction of Neptune; complimentary union of EDS and WDS for accurate X-ray microanalysis
    Release of Element Detective within Genesis

    2003

    Introduction of the third generation Eagle µ-Probe micro-focus XRF
    Introduction of DigiView II firewire CCD Detector

    2002

    Introduction of Genesis system, which includes new hardware and multiple detector capabilities combined with Genesis software
    Introduction of Pegasus; simultaneous data acquisition optimizing EDS and EBSD
    Introduction of three new detectors for microanalysis: the CryoSpec Si(Li) LN2 Free detector, the LambdaSpec (LEXS) Wavelength Dispersive detector and the MegaSpec Silicon Drift Detector
    Release of ChI-Scan™ software to incorporate elemental composition into the indexing process in EBSD
    EDAX celebrates its 40th anniversary!
    EDAX achieves re-certification to the ISO9001:2000 standard

    2001 

    AMETEK Inc. acquires EDAX Inc.
    Introduction of Genesis EDS Software, setting a new standard for overall ease of use, while maintaining flexibility and power
    Introduction of DigiView high-speed, high resolution CCD detector, the first fully digital EBSD detector

    2000

    Release of ViP software, a unique quant routine which take into account and corrects for beam scattering that occurs while working in low vacuum, variable pressure SEM conditions
    Introduction of Delphi, an integrated EBSD/EDS phase identification product
  • 1990s +


    1999

    EDAX acquires TexSEM Laboratories (TSL), the industry leader in Electron Backscatter Diffraction analysis
    Introduction of Automated Crystallography for the TEM (ACT)

    1998


    Introduction of the Falcon EDS system; providing economy and performance

    1997

    Introduction of the EAGLE µ-Probe; a new generation of micro-focus XRF
    Introduction of the OIM EBSD System on PC platform
    First simultaneous OIM/EDS scan

    1996

    Introduction of the Phoenix - the first Windows-NT based EDS system
    Introduction of Sapphire detectors series; providing the best standard resolution of any EDS detector

    1995

    Introduction of the DX PRIME, a PC Windows-95 based EDS system
    Introduction of the CryoSpec liquid nitrogen free detector

    1994

    TexSEM Laboratories (TSL) founded by the OIM development team offers the first commercially available fully automated EBSD System

    1993


    Introduction of the DX-95 XRF system
    ISO 9001 certification

    1992

    Introduction of DX-4, the world's first and most popular Windows based EDS system
    Introduction of EDAX's unique compact detecting unit (CDU)
    Introduction of the first fully automated EBSD system (OIM)
  • 1980s +


    1987

    Introduction of the PV9800 EDS X-ray microanalysis system

    1985

    Introduction of the PV9900 EDS X-ray microanalysis system

    1984

    First commercially available EBSD System (developed by the forerunner to TSL)

    1982


    First computer aided Electron Backscatter Diffraction (EBSD) System developed at Bristol University by Dr. David Dingley
  • 1970s +


    1979

    Introduction of the PV9500 XRF System

    1978


    Introduction of the PV9100 EDS X-ray microanalysis system

    1972

    Nuclear Diodes becomes EDAX International, Inc.
    Introduction of the ECON, the first windowless detector
  • 1960s +


    1969

    Introduction of Nuclear Diodes 505 - the first commercially available X-ray system for electron microscope applications

    1964

    Introduction of LN2-cooled detectors

    1962


    Company founded under the name Nuclear Diodes