EDAX offers the next generation in X-ray microanalysis systems for materials characterization.

The Genesis X-ray microanalysis systems combine the technologically advanced EDS and WDS detectors, with the fastest digital pulse processing electronics and the most powerful microanalysis software available. 

The Genesis XM systems are available in two models

• Genesis XM2 - Standard yet versatile X-ray microanalysis system
  Genesis XM4 - Powerful, versatile and expandable for all your materials characterization needs

The Genesis X-ray microanalysis software provides Results with Confidence via an easy user interface with all applications accessible from one window.

The user can navigate around the software using the COPILOT, which is designed using Genesis' unique "90-90" rule (where 90% of users spend 90% of their analytical time).

EDAX offers a full range of EDS detectors, optimally designed to provide the ideal tool for any SEM or TEM. 

The range of EDS detectors available include:

• Si(Li) - the Sapphire Si(Li) detector - with LEAP+ crystals for the best light element performance of any Si(Li) detector in the EDS market today.
• SDD - the Apollo SDD series including the Apollo 10, Apollo XV and Apollo 40- fulfilling the promise of the latest Silicon Drift Detector technology.  Superior light element performance with the best collection efficiency available.  Capable of accepting extremely high count rates with excellent resolution.   

 All EDAX EDS detectors conform to ISO 15632:2002 specifying performance at productive countrates.

EDAX offers the next generation of WDS, the LambdaSpec. The uniquely designed LambdaSpec is a parallel beam X-ray spectrometer, that will fit on all electron microscopes (and in most cases in the EDS port, if necessary).

The software has been designed to enable the LambdaSpec to be operated as an EDS system with an easy to use user interface, without having to consider wavelengths and angles. In fact, the LambdaSpec is a WDS system that acts like an EDS system.

The LambdaSpec includes five diffracting crystals a flow proportional counter and counting electronics and is available in two versions:

• The LEXS (Low Energy X-ray Spectrometer)
• The TEXS HP (Transition Element X-ray Spectrometer).    

To completely understand a material, whether it be naturally occurring or man-made, the scientist needs to determine the relationships between its physical properties, morphology, chemistry and crystallography.

EDAX offers a range of seamlessly integrated systems for full and advanced materials characterization including:

• The Pegasus system - enabling the simultaneous collection of EDS (chemistry) and EBSD (crystallography) data, allowing direct correlation between the elemental content and microstructural aspects of the material being studied.  
• The Neptune system - the unique combination of EDS and WDS (LambdaSpec) systems for advanced chemical analysis
• The Trident system - the ultimate materials characterization tool, seamlessly integrating EDS, EBSD and WDS, to provide the material scientist with the complete solution.