X-ray Metrology

  • SMX-BEN icon
    XLNCE SMX-BEN

    The XLNCE SMX-BEN is a benchtop Energy Dispersive X-ray Fluorescence (EDXRF) analyzer that provides non-destructive, composition and coating thickness measurement and analysis on virtually all materials. It is an

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  • SMX-ILH icon
    XLNCE SMX-ILH

    The XLNCE SMX-ILH XRF system is a process control and yield management platform that offers integrated and remote module configurations for in-line atmospheric analysis of coating composition and thickness measurements of

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