OIMTM Data Collection is a uniquely powerful, integrated suite of tools for acquiring and analyzing electron backscatter diffraction (EBSD) patterns in the scanning electron microscope (SEM). Crystallographic orientation data can be collected in both interactive and automatic modes, easily satisfying the demands of any modern materials science, characterization, or geological laboratory.
The most comprehensive solution available for analyzing orientation and related aspects of crystalline microstructures using EBSD. Virtually unlimited potential for interrogating the wealth of information contained in OIMTM scans, and all in one program. OIMTM provides ease of use for novice users and very extensive data analysis and mining capabilities for advanced users.
