home
China    Japan    ametek.com    Home    Contact Us    Careers               
PRODUCT LINES
X-ray Microanalysis
TSL Crystallography
Integrated X-ray and EBSD
Micro-EDXRF
New Products

EBSD Technologies
General EBSD Bibliography
  

  


 
What's New

 

Hikari: The FIRST EBSD Detector to Index at over 300 pps

With the continued development of the Hikari EBSD detector, EDAX further solidifies its position as the market leader and pre-eminent supplier of microanalysis tools: providing high quality data at high speeds

  • With the OIM 5.2 software release, EDAX introduces EBSD data collection at 320 indexed patterns per second
  • Triplet Indexing of patterns enables more efficient and more accurate pattern indexing at higher speeds.
  • Multi-threaded programming harnesses the speed and power of the dual-processor PC

More about Hikari...

More about the OIMTM 5.2 software release...

Speed with Accuracy...

EBSD: The NEW Analytical Solution for Steel

EBSD continues to provide novel solutions to challenging materials and mineralogical problems.  See what EDAX EBSD can do for your steel analytical needs.

  • Retained austenite phase content
  • Inclusion analysis
  • Texture measurement
  • Orientation mapping
  • Phase distribution, grain size
 

3D EBSD Wizard

  • OIMTM 3D for the combined ion-electron beam SEM
  • Guides user through set-up of 3D EBSD scan
  • Wizard automatically controls and monitors scan progress
  • Batch processing of OIMTM data sets
  3D EBSD Visualization Software 
  • Developed specifically for EDAX EBSD applications and the need to display 3D data sets using traditional OIMTM map types 
  • Produces 3D graphical displays from previously collected EBSD serially collected data sections
  • Recommended for the graphical rendering of 3D OIMTM data sets.
  • Includes zoom, pan, and rotate functionality
  • Data may be cropped in x, y, and z planes, in positive and negative directions. 
  • Extraction of individual or multiple grains from the 3D solid
  • Images and MPEG movies are easily created
  • Graphical display in common OIMTM map types

Integrated Forward Scatter Detector

Unique imaging technology for your EDAX EBSD system

  • Enhanced imaging functionality within OIMTM DC software
  • Orientation contrast
  • Topographical contrast
  • Compositional contrast

IMC16 Exhibition Magazine Cover

  • EDAX and Loughborough University provided an EBSD-EDS ChI-Scan map for the Exhibition magazine
  • Al-Si intermetallic structure is highlighted
  • Produced using simultaneous EBSD-EDS from EDAX 
  • Map was courtesy of Chun-Liang Chen and Professor Rachel Thomson, of Institute of Polymer Technology and Materials Engineering at Loughborough University, Leicestershire, UK University
  • More about ChI-Scan...
 

 

 
 
 
 
 
 
                                                                                                                                                   
 
Overview Press Releases and Trade Shows Services & Support Literature Our Products Contact Sales Our Locations Related Web Sites Privacy Policy Trademarks Map