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Fun & Interesting!

This section of the EDAX-TSL website provides an opportunity to display new, interesting, or unusual EBSD scans or applications that we or you (the customer) have analyzed. So often with EBSD, we find fascinating images and unusual samples that are just fun to show other people.

If you have any such images and applications, please send them to us and we'll put them on the website - to edax.coolstuff@ametek.com . Please send high resolution images so that they can be formatted appropriately. We look forward to hearing from you and seeing some of the interesting EBSD applications.

Hot Forged 7075 Aluminum

Grain Shape Orientation Map of a carabiner cross-section

Aside from being an interesting and useful application for EBSD, the size of the OIM scan was remarkable:

  • Scan Size: 6 mm x 8 mm
  • Accomplished using OIMTM Combo-scan
  • 1200 fields collected using EDAX beam and stage control
  • All fields were stitched together within OIMTM

The Result: OIMTM is an excellent method for characterizing the material flow and microstructure in forged, rolled, drawn, cast, and otherwise deformed structures.

Texture Analysis of Hot Forged 7075 Aluminum

Orientation map, grain shape orientation map, and texture plot of a carabiner cross-section similar to that shown above.

Here, the scans were performed with a very fine step size to illustrate the dramatic structural flow and detail. The scan indicated a dominant [010] texture.

  • Scan size: 1 mm x 4mm
  • 3 million data points
  • Accomplished using OIMTM Combo-scan
  • All fields were stitched together within OIMTM

Tungsten Light Bulb Filament

During manufacturing, the tungsten wire is highly polished and annealed prior to assembly into the light bulb. These preparation steps are performed to eliminate surface defects and internal stresses (respectively) that could contribute to filament breakage in the application.

For EBSD, a filament provided the opportunity to demonstrate how easy it is to obtain patterns from locations on the unprepared filament surface, and the ease of which one can perform a scan on an irregular surface.

Archive of Interesting OIMTM  Analyses

Access Archive

Very interesting OIMTM applications that are too good not to show.

                           
 
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