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DigiView IV is the latest member of the EDAX Electron Backscatter Diffraction (EBSD) series of detectors and is designed to serve a range of EBSD applications.
Using the DigiView IV in combination with EDAX’s OIM™ software, the detector can obtain orientation mapping data at rates up to 150 indexed patterns per second with indexing success rates of greater than 99%. The DigiView IV can also be used for Phase Identification using the Genesis and Delphi software applications. The detector can produce high resolution images up to 1392 x 1040 pixels.
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The DigiView IV is a versatile high resolution, high sensitivity digital camera tailored for high throughput scientific applications. The CCD sensor has a particularly high Quantum Efficiency (QE), peaking in the blue-green spectrum for use with an optimized phosphor screen coating resulting in higher sensitivity for EBSD applications. Noise is significantly reduced using a single stage Peltier cooling system that does not require a cooling fan.
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Control of the DigiView IV is available through the software applications, with full control over the gain, black level, exposure time, and binning settings. Comprehensive image processing capability is also included for optimal image quality. The detector uses a bellows-based insertion and retraction system for operation while under vacuum and for live-imaging for maximum vacuum and system integrity. An optional integrated Forward Scatter Detector (FSD) is also available.
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