Maps, Charts, and Plots are easily generated from within the OIM^TM Analysis software. The most commonly used graphical representations are accessed from the  QuickGen Toolbar , which is conveniently located on the OIM^TM tool bar. 

The screen capture at right shows some typical data analyses, including an orientation (IPF map), texture pole figure, misorientation boundary analysis, and a chart displaying a misorientation angle comparison.  And, this is just the beginning...

An almost limitless selction of other maps are available.  The maps can either be created from the menu bar or by using right mouse clicks on data sets displayed in the Project Tree. In fact, the Project Tree is the central navigational point for OIM data analysis, from which virtually all functionality may be tapped.

Some widely-used representations of data are shown in the section below.

Common Map, Chart, and Plot Types:

Orientation based : IPF, Euler angle, components ...

Misorientation based : local misorientation (strain)

Non-orientation Scalar: image quality, confidence index, from other detectors (FSD, SED, BSE), and phase maps

Grain based: size, shape, average image quality, orientation spread

Property : Taylor or Schmid Factor, Elastic Modulus

Some specific examples of data analyses are provided below:

Sample Data Analyses

• Grain Shape
• Misorientation Mapping
• Random Misorientation
• Orientation Deviation
• Elastic Modulus Maps
• Reconstructed Grain Boundaries
• Grain Boundary Density
• Advanced Twin Boundary Determination
• IQ Map Variations

Map Enhancements

• Map Overlays
• Map Zooming
• Flexi-View