|
In order to generate accurate X-ray microanalysis data, solid foundations are of the utmost importance. The foundations include the detector, digital pulse processing electronics and analytical software. The Genesis Apex 2 improves all aspects of these foundations, building on over 45 years of experience as the technology leader for EDS X-ray microanalysis. The Genesis Apex 2 system is designed around the latest in silicon drift detector (SDD) chip technology in the Apollo SDD series, new innovative digital pulse processing electronics, DPP III, and analytical software via the latest additions available in Version 6 of the market leading EDS software, Genesis.
|
Software
Genesis provides materials characterization solutions for many X-ray microanalyis applications, from straight forward qualitative analysis and accurate quantitative analysis to fast X-ray mapping and automated particle classification. The latest version of the market leading EDS software, Genesis 6, includes many new advanced features including EXpert ID and SnapShot. To enhance EDS capabilities, Genesis has advanced to the next level for optimum peak identification with the introduction of the revolutionary new standard in element identification, EXpert ID. SnapShot enables the user to automatically collect spectra at user-defined time intervals to examine the interaction of samples and the electron beam.
|
 |
Genesis X-ray Microanalysis Software. A powerful, easy to use, single window user interface allowing for straightforward, yet flexible analysis. The user interface allows the user to move quickly between microanalysis techniques and have all the necessary tools and detector controls available within one software package.
The software is controlled via an easy to use COPILOT panel, which has been designed using the unique Genesis 90/90 rule so that the tools needed by 90% of all users, 90% of the time are always easily available. The COPILOT has a straightforward design with the buttons arranged to allow the user to collect spectra, images or maps by simply following the downward flow of the buttons. The more advanced user has the opportunity to select and change parameters via right mouse clicks and pull down menus.
The Genesis software enables full qualitative and quantitative analysis including collection of digital images, spectra, linescans and maps. The numerous mapping features available to the user include drift correction, live spectral mapping and advanced spectral mapping of collected data for full data review.
Electronics
With the introduction of silicon drift detectors and their capability to operate at high input count rates the emphasis in digital pulse processing development has been to ensure that the majority of input counts are available to the analytical software.
- Operates optimally at short shaping times to reduce dead time effects
- Capable of handling up to 850,000 input cps and throughput over 350,000 cps
- State of the art pulse pile-up correction to minimize artifacts in the spectrum
- Capable of operating in parallel with other DPP electronics for multiple detector configurations
Detector
Utilizing the latest SDD chip technology, the Apollo SDD series offers a selection of performances to satisfy all X-ray microanalysis requirements. A range of chip sizes and energy resolutions are available for applications from simple qualitative analysis to ultra fast X-ray mapping.
- Typical Premium Plus resolution down to 125eV at MnK and below 52eV at CK
- Premium Plus first-in-class peak to background ratios up to 15,000:1
- Covers all applications from accurate quantitative analysis to fast X-ray mapping
- All SDD detectors are LN2 free and vibration free, ensuring they have no effect on the SEM performance, even at ultra high magnifications
|
