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- Delphi 3
Most crystalline materials produce electron backscatter diffraction (EBSD) patterns in a scanning electron microscope (SEM). Delphi collects and analyzes these patterns to determine the crystallography of the material. That information, along with elemental composition, can be used to search libraries of known materials and positively identify the phase.
Delphi's phase identification algorithms utilize TSL's patented confidence index, in comparing the unknown material with reference phases, to determine the best solution. The confidence index feature is critical when candidate phases are similar, or when the EBSD pattern quality is low due to the condition of the sample (e.g. morphology, strain, surface roughness...).
The third generation of Delphi introduces a number of enhancements, further extending the program's lead in phase identification capabilities.
- DigiView IV Detector
DigiView IV is the latest member of the EDAX Electron Backscatter Diffraction (EBSD) series of detectors and is designed to serve a range of EBSD applications.
Using the DigiView IV in combination with EDAX’s OIM™ software, the detector can obtain orientation mapping data at rates up to 150 indexed patterns per second with indexing success rates of greater than 99%. The DigiView IV can also be used for Phase Identification using the Genesis and Delphi software applications. The detector can produce high resolution images up to 1392 x 1040 pixels.
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