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Genesis provides materials characterization solutions for many X-ray microanalyis applications, from straight forward qualitative analysis and accurate quantitative analysis to fast X-ray mapping and automated particle classification. The latest version of the market leading EDS software, Genesis 6, includes many new advanced features including EXpert ID and SnapShot. To enhance EDS capabilities, Genesis has advanced to the next level for optimum peak identification with the introduction of the revolutionary new standard in element identification, EXpert ID. SnapShot enables the user to automatically collect spectra at user-defined time intervals to examine the interaction of samples and the electron beam.
Genesis, the next generation of EDS microanalysis software, enables all the EDS microanalysis data required for full analysis to be generated from an easy to use, single window interface. By simply clicking on the appropriate tab, one can toggle between the various applications making it easier and faster to navigate the software. The COPILOT panels are designed with EDAX’s “90–90 rule” in mind. Each panel contains the tools that 90% of the analysts spend 90% of their time using to obtain their results. Set-up parameters can be selected using right mouse clicks within the COPILOT. The advanced features of Genesis can be accessed by expanding the various portions of the COPILOT, or through the pull down menus available in each tab.
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Spectrum Genesis provides you with rapid and accurate qualitative and quantitative analysis. Following Genesis' unique 90/90 rule you can collect a spectrum, perform automatic peak identification, visually confirm the identification, quantify the data, save the results and generate a report with ease. The quantification can be performed using “close” standards or using EDAX's finely tuned algorithms for True Standardless Quantification (TSQ). Maps / Lines With Genesis Maps / Lines you can collect spectra, images and maps with ease. Whether you require image enhancements and processing, ultra high-resolution digital images, Quant Maps Fast Mapping or Line Scans, Genesis' image gallery is the most ideal display tool for making comparisons and then reporting multiple samplings with the templates provided for your convenience. Particles Genesis' Particle Analysis package allows you to acquire structural and chemical data simultaneously. You can qualify, quantify, classify, save and report your data easily, then if you wish reanalyze it at a later date to modify the stored results. You can easily reference the data to the processed image, as the data table is linked to the color-coded image. Multi-Point Using the Multi-Point package you have the capability to set up and perform a complex unattended data gathering session easily. You can acquire data from data from random points, a line, a matrix or combinations of these with the automated beam and stage control. You can process and save the data for Spectra Mapping, where spectra are acquired at each pixel. You can retrieve the data at a later stage to create line profiles across a region of the sample or provide quantitative data pixel by pixel.
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