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EDAX Inc. continues to advance materials characterization, while raising the standard with speed and accuracy with its new products.
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TEAMTM EDS Analysis System
TEAMTM EDS with Smart Features provides industry-leading analytical intelligence that allows users to obtain higher quality and more reliable results. Smart Features include Smart Diagnostics, Smart Acquisition, Smart Phase Mapping, EXpert ID and Smart Data Review that guide and assist users every step of the way.
The TEAMTM EDS system offers a modern interface that allows for an open layout and maximizes the display area for what really matters-the results. The layout and the way the system interacts are unique.
The monitoring and operating conditions of the system are available with Smart Diagnostics. Optimal set-up of the image collection occurs with Smart Acquisition. Available to the user is guidance and dynamic adjustment of the map collection with Smart Phase Mapping. TEAMTM EDS offers the most accurate peak identification and quantification in the industry with EDAX's revolutionary EXpert ID. Reports are generated in a single button click with Smart Data Review.
No other system on the market offers this type of built-in analytical intelligence. TEAMTM EDS assists the user as needed every step of the way and is as flexible as any user might require. TEAMTM EDS users will have an EDS system with the 'Smarts' to do the job of EDS analysis with more confidence than ever before.
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Apollo Silicon Drift Detector
The Apollo Series offers a range of detector sizes and performane levels including a large-area SDD chip.The positioning of the detectors close to the sample, make it comparable to the best-designed Si(Li) detectors. EDAX's Apollo Series offers users the best of both worlds. All SDDs are able to map at high resolution, and all SDDs can map at high count rates. Users of the Apollo Series gain the benefits of both simultaneously.
For the past several years SDD detectors have been able to process a very high volume of X-rays, making high-speed mapping possible. At times, the resolution was sacrificed to achieve increased throughput. With the new Apollo Series, mapping resolution no longer suffers. High-resolution, high-speed mapping is defined by EDAX as better than 135 eV resolution @ 100,000 cps and deadtime of 30% throughput.
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Orbis Micro-XRF Spectrometer
Building on more than 10 years of Micro-XRF experience, the Orbis Spectrometer yields a system with excellent Micro-XRF capability while setting a new standard in analytical flexibility. The Orbis incorporates a unique motorized turret integrating video and X-ray optics allowing coaxial sample view and X-ray analysis. Primary beam filters can be used with a variety of X-ray optics to allow true XRF analytical capabilities in a micro-spot analysis. The working distance is increased to allow analysis over a rougher sample topography without sacrificing signal intensity. Two additional X-ray collimators can be added to the optical turret for a total of three X-ray beam sizes to expand the Orbis analytical capabilities beyond traditional Micro-XRF analysis.
All this analytical flexibility is packaged into a table-top unit with powerful, easy-to-use analysis software. Orbis users can make elemental analyses on small samples such as particles, fragments and inclusions, or automated multi-point and elemental imaging analysis on larger samples with all the benefits and simplicity of an XRF analyzer. Benefits include:
• Non-destructive measurement
• Minimal sample preparation (e.g. no sample coating is necessary)
• Improved sensitivity for many elements in comparison to SEM/EDS
• Inclusion and coating thickness analysis with the penetrating power
of X-rays
• Analysis of wet samples |
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