EDAX Inc. continues to advance materials characterization, while raising the standard with speed and accuracy with its new products.

The Apollo SDD LN2 free EDS detectors are based on the latest silicon drift chamber technologies utilizing EDAX's state of the art electronics and seamlessly interface with the market leading Genesis software. The collection efficiency of the SDD, coupled with the light element and resolution performance provide the Genesis software with data ideal for qualitative and quantitative analysis leading to results with confidence.

The new Hikari high speed EBSD detector continues EDAX-TSL's tradition of pioneering EBSD technology. Hikari is a full featured, completely integrated CCD-based detector that excels at all EBSD applications, whether they require speed and sensitivity or signal to noise performance. Hikari provides the fastest EBSD pattern acquisition rate available and can achieve simultaneous acquisition and indexing speeds of 320 patterns per second for many materials. The accuracy and efficiency of the Hikari makes it an ideal analytical tool for research, materials characterization, and production laboratory environments. The Hikari is also ideal for Insitu testing experiments, utilizing heating and tensile stages and 3D EBSD using an ion-electron beam SEM.
 

OIM™ 3D provides tools for the batch analysis of OIM™ data sets collected serially using an ion-electron SEM. Once identically processed the powerful 3D Visualization Software renders the data sets as a 3-dimensional solid. Six direction sectioning, pan, zoom, rotate, and grain selection functionality is easily accessible with a simple mouse click.

OIM^TM 3D Wizard for the ion-electron SEM guides the user through the set-up of the 3D EBSD scan. It automatically controls and monitors scan progress and allows for batch processing of OIM^TM data sets.