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EDAX is part of the Ametek Materials Analysis Division
EDAX offers energy dispersive spectroscopy (EDS), electron backscatter diffraction (EBSD), wavelength dispersive spectrometry (WDS) and micro x-ray fluorescence (Micro-XRF) products
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Energy Dispersive Spectroscopy (EDS)



EDAX Element Silicon Drift Detector (SDD) with slide

Element EDS System
The Element Energy Dispersive Spectroscopy (EDS) System delivers powerful analytical capability in a compact package, maximizing performance and flexibility, while providing streamlined operation to guarantee fast results and ease of use. It is focused on the industrial market, where application specific problems need to be solved quickly and accurately. The combination of an Element Silicon Drift Detector (SDD) with the user friendly APEX™ software provides a complete EDS microanalysis solution for all levels of analysis and high throughput industrial applications.


Octane Elect Silicon Drift Detector 

Octane Elect EDS System
SDD technology for the SEM is the preferred choice for X-ray microanalysis today. EDAX’s Octane Elect SDDs offer superior light element performance with the best collection efficiency available, capable of accepting extremely high count rates with excellent resolution.


EDAX Octane Elite Silicon Drift Detector (SDD) 

Octane Elite EDS System
The game changing advancements in the Octane Elite SDDs take detector technology to the next level. This line of detectors incorporates a new silicon nitride (Si3N4) window, which offers remarkable improvements in low energy sensitivity for light element detection and low kV microanalysis. The Octane Elite EDS System also uses state of the art electronics, which yield high speed X-ray data processing within a smaller and fully vacuum encapsulated detector device.


EDAX Octane Silicon Drift Detector (SDD) Series for the Transmission Electron Microscope (TEM)

Octane Silicon Drift Detector (SDD) Series for the Transmission Electron Microscope (TEM)
EDAX’s Octane SDD Series for the TEM are the world's first SDDs for the TEM that are fully integrated. Data acquisition and signal processing electronics are fully integrated into the detector. The integrated detector presents an elegant design that improves performance, facilitates installation and offers easy remote access via Ethernet from virtually any computer.


EDS spectrum with two matching spectra overlaid

Spectrum Library Matching in the TEAM™ Software Suite
Spectrum Matching is an automatic function that allows the user to search through a custom built spectrum library to find similar spectra. This greatly simplifies identification of unknowns by comparing them to a group of potential candidates and reduces the complexity of finding discrepancies and similarities between spectra.


EDAX TEAM™ 3D Imaging and Quant (IQ)

TEAM™ 3D Imaging and Quant (IQ)
The optional TEAM™ 3D IQ software is a 3D solution for EDS data, which performs both imaging and analysis operations within the same software package. EDAX offers simple, one click data transfer between the TEAM™ Software Suite and TEAM™ 3D IQ for the most comprehensive visual and analytical interpretation of EDS data available.


EDAX TEAM™ EDS Analysis System for the Scanning Electron Microscope (SEM)

TEAM™ EDS Analysis System for the SEM
The TEAM™ EDS Analysis System for the Scanning Electron Microscope (SEM) is offered with Octane Elect and Octane Elite EDS Systems for a wide range of applications. The TEAM™ EDS Analysis System coupled with Smart Features is the most intuitive and easy to use analytical tool available for the SEM.


EDAX TEAM™ EDS Analysis System for the Transmission Electron Microscope (TEM)

TEAM™ EDS Analysis System for the TEM
TEAM™ EDS Analysis System featuring the Octane Silicon Drift Detector (SDD) Series provides the ultimate analytical solution for transmission electron microscope (TEM). The systems are offered for TEMs and STEMs with Smart Features to make them more intuitive and easier to use.


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