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EDAX is part of the Ametek Materials Analysis Division
EDAX offers energy dispersive spectroscopy (EDS), electron backscatter diffraction (EBSD), wavelength dispersive spectrometry (WDS) and micro x-ray fluorescence (Micro-XRF) products
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Electron Backscatter Diffraction (EBSD)



Enhanced APT specimen preparation for grain boundary segregation analysis

Atom Probe Assist
Atom Probe Assist is a tool designed to help users of atom probe tomography prepare specimens for faster and more efficient analysis than previously possible. Atom Probe Assist reduces the total time needed to obtain high-quality atom probe data and accelerates progress in understanding questions in materials research, such as grain boundary segregation.


EDAX DigiView EBSD Camera

DigiView EBSD Camera
EDAX's DigiView is a versatile high resolution digital camera for capturing high quality EBSD patterns with a maximum acquisition speed of 200 indexing points per second with 99% indexing reliability. The CCD sensor has a high Quantum Efficiency (QE) and the camera is designed for very low noise imaging, and when combined with an optimized phosphor screen, results in a higher sensitivity for EBSD applications.


EDAX Forward Scatter Detector (FSD)

Forward Scatter Detector (FSD)
The FSD is an ideal analytical tool for previewing the microstructure to select a region for EBSD data collection and for qualitatively inspecting the microstructure to characterize deformation and strain gradients critical to materials design.


EDAX Hikari EBSD Camera Series

The Hikari EBSD Camera Series
EDAX’s high-speed and high-sensitivity Hikari EBSD Camera Series is the next generation in EBSD cameras offering outstanding performance across the complete range of EBSD applications. With Hikari cameras, users no longer need to decide between speed and sensitivity. Hikari cameras collect data at high speed when throughput is essential and perform at the same high indexing rates under challenging nano-analysis conditions. The Hikari EBSD Camera Series can achieve simultaneous acquisition and indexing speeds up to 1,400 indexed points per second for efficient SEM use.


A schematic showing how NPAR averages the EBSD pattern at each point with the EBSD patterns from each of its neighboring points to reduce noise

Neighbor Pattern Averaging & Reindexing (NPAR™)
NPAR™ is an innovative approach to measuring crystallographic orientation from EBSD patterns. With NPAR™, the collected EBSD pattern is averaged with all the closest surrounding EBSD patterns on the mapping grid and then reindexed. This approach reduces the image noise similar to frame averaging, but without the associated time penalty. This improves the SNR of the pattern and allows the EBSD detector to be operated at higher
gain settings than conventionally used without sacrificing indexing
performance.


EDAX Pattern Region of Interest Analysis System (PRIAS)

Pattern Region of Interest Analysis System (PRIAS™)
PRIAS™ is a synergistic imaging technique to visualize microstructure and provide exciting new views of your materials. PRIAS™ enables users to quickly characterize materials without requiring full EBSD pattern indexing.


EDAX TEAM™ EBSD Analysis System

TEAM™ EBSD Analysis System
EDAX’s TEAM™ EBSD Analysis System is the most comprehensive system available for analyzing crystalline microstructures. The solution obtains crystallographic orientation, grain-boundary character, and phase-distribution information from single and polyphase crystalline materials through the collection and analysis of Electron Backscatter Diffraction (EBSD) patterns in a scanning electron microscope (SEM). TEAM™ EBSD Analysis System combines the ease of use of the TEAM™ software platform with the analytical power of OIM to provide state of the art crystal structure characterization to all users.



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