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Integrated Material Characterization Systems
 

 
X-ray Microanalysis

Integrated Material Characterization Systems
  • Pegasus Integrated EDS and EBSD System
    To completely understand a material, whether it is naturally occurring or man-made, the scientist or analyst needs to determine the relationships between its physical properties, morphology, chemistry and crystallography. The Pegasus system enables the simultaneous collection of EDS (chemistry) and EBSD (crystallography) data, allowing direct correlation between the elemental content and microstructural aspects of the material being studied.

  • Neptune - Advanced X-ray Microanalysis combining EDS and WDS
    The Neptune system provides a seamless integration of EDS and WDS, for more in-depth X-ray microanalysis

  • Trident Three-In-One Tool: EDS, EBSD, WDS
    Scientists have long recognized the need to determine the relationship between physical properties, morphology, chemistry and crystal structure for virtually any man-made or naturally occurring materials. It many studies, it is becoming increasingly important to pursue the investigation of composition and structure on a micro-scale. Utilizing an electron microscope, the scientist has a number of techniques at their disposal, including EDS, EBSD and WDS. The Trident system offers the unique combination of Genesis EDS X-Ray Microanalysis, LambdaSpec WDS and TSL EBSD in a single analytical tool, combining the latest in technology for all three techniques. With the Trident system, the need to compromise the performance of one tool, to optimize the performance of another, is drastically reduced or eliminated, depending on the SEM chamber configuration.

 
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