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- Genesis Apex 2
In order to generate accurate X-ray microanalysis data, solid foundations are of the utmost importance. The foundations include the detector, digital pulse processing electronics and analytical software. The Genesis Apex 2 improves all aspects of these foundations, building on over 45 years of experience as the technology leader for EDS X-ray microanalysis. The Genesis Apex 2 system is designed around the latest in silicon drift detector (SDD) chip technology in the Apollo SDD series, new innovative digital pulse processing electronics, DPP III, and analytical software via the latest additions available in Version 6 of the market leading EDS software, Genesis.
- Genesis Software
Genesis provides materials characterization solutions for many X-ray microanalyis applications, from straight forward qualitative analysis and accurate quantitative analysis to fast X-ray mapping and automated particle classification. The latest version of the market leading EDS software, Genesis 6, includes many new advanced features including EXpert ID and SnapShot. To enhance EDS capabilities, Genesis has advanced to the next level for optimum peak identification with the introduction of the revolutionary new standard in element identification, EXpert ID. SnapShot enables the user to automatically collect spectra at user-defined time intervals to examine the interaction of samples and the electron beam.
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