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On May 7, 2009 EDAX began hosting a series of microanalysis Web Seminars that offer a first-hand education on microanalysis technologies available to you today. The seminars take place on the first Thursday of every month at 2:30 EST and run approximately one hour long with time allowed for questions and answers. Please note, time or schedule may be subject to change.
Future Topics:
A New Perspective on Powerful Mapping Data – October 7, 2010
As phase mapping becomes more routinely incorporated into X-ray microanalysis, operators will have a new perspective and varied look at their data. Phase mapping provides enhanced data analysis over traditional elemental mapping but can often be intimidating, due to complexities of elemental association. In this web seminar, we will explore how automated phase analysis will make those spectral associations for you and the interactivity possible, all in live time. From there, manual phase analysis is also available, allowing the user full control of their results.
What's New in OIMTM 6.0? – November 4, 2010
Join us in exploring the newest software features within OIMTM 6.0 under the 64-bit operating system of Windows® 7. New features include Quick-Gen buttons and toolbar with cleanup recipes, 3D texture plots, and quick data rotation through pole figure visualization.
Previous Topics: (Please contact your local representative to inquire about recordings of these seminars)
Live From M&M exhibition Portland, OR! – August 5, 2010
On Thursday August 5 we will be broadcasting our web seminar live from the EDAX booth at the Microscopy & Microanalysis exhibition in Portland Oregon! Join in for this 30 minute session where we talk about the new EDAX software functions and features that we are highlighting at the show. These will include the latest release of the EDAX Team™ EDS software package and the exciting new and unique features that we've added. We'll also review OIM 6, the first microanalysis platform written for 64 bit capability. With OIM 6, integration of EDS and EBSD data is taken to a new level.
EDS Quantification and Important Parameters – July 1, 2010
Quantitative analysis with EDS has become a quick and easy function which can be performed in fractions of a second with software capabilities. However, there are a tremendous number of important considerations that play a part in the quality of quantitative data. While the majority of EDS analysts simply click a button to get quant results, knowing and understanding some of the underlying foundations of quantitative analysis can be important for getting the most from your system.
With the new EDAX Team EDS software with Smart Quant, these important parameters are accounted for automatically and applied to the routines to optimize quantitative accuracy. However, full control of these parameters is also available to users should they decide to take control of their system for data collection.
Functions to optimize data quality include Peak ID and Expert ID logic, peak modeling for fit check on ambiguous or overlapping elements, background correction, peak intensity determination and important inter-element corrections.
This seminar will cover some of these important details that go on behind the scenes within Team EDS software and how the user can understand and control their analysis.
WDS System Optimization and Latest Enhancements – June 3, 2010
WDS analysis provides valuable performance enhancements to overall microanalytical techniques. Increased performance is the result of many fine details that are important to attain the level of analysis associated with WDS. Many of the optimization concerns which used to be difficult in the past are now automated within the EDAX LamdaSpec TEXS spectrometers. System optimization parameters include auto focus routines for intensity optimization, peak modeling, background point selection and quant analysis. These enhancements make WDS quality data available to novice or infrequent WDS analysts, allowing for truly multidisciplinary centers with high quality results.
In this seminar we will cover the latest automated techniques for optimizing collection, as well as advancements made in the system to provide capabilities never before available with WDS analysis.
Applications of Micro XRF in the Cement and Concrete Industries – May 6, 2010
For many decades bulk XRF has been used to monitor and study the chemical constituents of the overall chemical composition in cement to maintain quality and consistent materials. However, exposure over time to extremely varied environmental conditions can impact the integrity of concrete and concrete structures.
Chemical changes due to these conditions are generally spatially specific and require a technique that can analyze chemical variations within and throughout the material. Therefore, point by point, localized chemical analysis is required to understand what these effects are and where they are occurring.
This is a well suited application for the EDAX Orbis Micro XRF which can gather XRF chemistry data from point by point analysis into an XRF map or multi point mode. This system has been used to track elements and their permeation into concrete and associated concentration changes.
This seminar will explore how the sensitivity benefits of XRF analysis can be applied to localized mapping collection to trace major and minor chemical changes throughout a material.
Study of Microstructure with OIMTM Analysis – April 1, 2010
One of the keys to understanding microstructural properties of a material lies in the relationship between a crystal and its neighboring crystals. This association of crystals in a group and their variations forms the basis for many characteristics including grain identification and definition, boundary characterization, axis/angle relationship and orientation/texture variations. EBSD analysis with the OIMTM technique allows thorough study of these qualities and very many more important functions ranging from traditional texture analysis to those that have been an outgrowth of OIMTM collection.
While data collection and scanning involves many important details, this seminar will focus on the visualizations that can be created from an OIMTM scan set and the nearly unlimited possibilities for materials characterization with OIM Analysis. Several examples of sample types and the generation of sample specific data will be covered. This will be an excellent opportunity for current OIMTM users to learn more about their output potential or for new analysts curious about the many possibilities of EBSD.
The Solar Cell Industry and EBSD – March 4, 2010
Solar cell Photovoltaics (PV) and their technologies are one of the fastest growing sources of renewable energy both in the US and worldwide. There is an increasing demand for the growth of the technology to meet the expectation of energy needs in the transition to cleaner energy sources. Many companies, from start ups to energy giants, are investing tremendous time and funding to rapidly increase the efficiency and performance of their PV designs.
Higher expense and reduced availability of traditional solar cell silicon devices have led to the advancement of PV thin films. One of the major characteristics of PV efficiency in thin films is related to the grain boundary nature of these polycrystalline films. This makes EBSD an extremely valuable method of characterizing why and how grain boundaries can improve performance and what the relationships between PV processing techniques and efficiency/performance yield are. These understandings can drive the process enhancements needed in this ever growing field.
This seminar will cover an introduction to photovoltaics and the grain boundary effects on performance through EBSD with several examples and a case study of CdTe thin films.
Welcome TEAM EDS – February 4, 2010
Join us in exploring the new EDAX Team EDS software! This revolutionary new EDS software combines the science of EDS with the latest in computer technologies and brings it to the analyst in a software package built from the ground up. With Team EDS you can the put experience of EDS experts to work for you and change the way you do EDS forever.
In this seminar we will discuss the design and key features of the software and explore some of the details of EDS acquisition and interactivity of TEAM. We will also have a special note from one of our lead software developers. Participation and questions are encouraged as we continue the introduction of this exciting software to microanalysts worldwide.
What's New in Genesis? – May 7, 2009
Log in to review the newest software features within the Genesis EDS software. New features include enhanced mapping and multipoint capabilities as well as EXpert ID which is used to obtain the most from your Auto ID routine.
Introduction to µXRF - The EDAX Orbis µXRF – June 4, 2009
The Orbis is a standalone tool which is incredibly valuable for nondestructive testing in a wide range of applications including forensics, petrochemical, semiconductor, aviation, transportation and more. Benefits of µXRF include increased sensitivity for lower limits of detection, little to no sample prep for dirty, insulating or wet samples and greater range of sample sizes and types. Paired with an optical microscope, the user can identify the area of interest and collect from a small region (down to 30 micron spot) all the way up to full maps of up to millimeters to centimeters large.
Introduction to Silicon Drift Detectors (SDD) – July 2, 2009
The EDS trend has been moving towards SDD capabilities for dramatic increases in collection capabilities, electronics, and throughput. The benefits extend from spectral collection with confident results in seconds to mapping collection at over several hundred thousand CPS and much more without sacrificing resolution or low energy performance.
Introduction to Electron Backscatter Diffraction (EBSD) – August 6, 2009
EBSD is becoming increasingly prevalent in many industries as a compliment to EDS analysis. EBSD will allow the user to identify and characterize crystal structure information at every point in a sample and generate maps with grain information (boundary, sizing etc), orientation information, structural phase differentiation, texture data and much more.
Why Add a Second Detector? Using Dual SDDs for EDS Analysis. – September 3, 2009
Explore this new capability and the reasons why it can gain you very valuable added benefits to a single detector system. We'll explore the geometry and topography benefits to samples that are less than ideal for a single detector system. Immediate spectral comparison, doubling your collection abilities and software optimization for combined maps will be covered.
Specific Applications of Micro-XRF. – October 1, 2009
During this web seminar we'll explore some of the most commonly uses for micro-XRF including forensics and trace evidence, as well as some up and coming applications that are gaining popularity such a concrete and geological applications.
Go Beyond EDS Resolution With WDS Analysis. – November 5, 2009
This seminar will focus on the benefits of enhancing EDS analysis with the superior resolution of WDS. Difficult peak overlaps in EDS can easily be separated with WDS spectra in minutes providing clarity and insight into your difficult samples. We'll also explore the benefit of better minimum detectable limits of trace elements via WDS, quantitative accuracy and map review.
Bringing it All Together With Integration. – December 3, 2009
One technique can provide helpful microanalytical information, while another technique provides another aspect. By bringing two or three capabilities together in an integrated system on an SEM, comprehensive sample analysis is possible. With the EDAX integrated products, Pegasus, Neptune and Trident, you may learn something new about your sample that you never knew before!
EDAX customers are encouraged to attend. If you would like to participate please contact EDAX at edax.applications@ametek.com and you will be provided with login information. Login is as simple as logging onto a website link and calling into a toll free number. This new offering is available to all EDAX users and is free of charge. Take this opportunity to learn more about your EDAX product(s).
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