MAHWAH, NJ - EDAX Inc., a leader in micro X-ray fluorescence, has introduced the Orbis micro-XRF elemental analyzer system, setting a new standard in analytical flexibility. Building on more than 10 years of micro-XRF experience, the Orbis spectrometer incorporates a unique motorized turret that integrates video and X-ray optics allowing coaxial sample view and X-ray analysis.

Two additional X-ray collimators can be added to the optical turret for a total of three X-ray beam sizes to expand Orbis' analytical capabilities beyond traditional micro-XRF analysis. The working distance also is increased to allow analysis over rough sample topography without sacrificing signal intensity.

Primary beam filters can be used with a variety of X-ray optics to allow true XRF analytical capabilities in a micro-spot analysis. The Orbis system is available with mono-capillary optics or as the Orbis PC with an ultra high-intensity poly-capillary optic.

Detection limits with the Orbis PC can be < 5 PPM for a spot size of 30 to 40 um using primary beam filters. The Orbis is also available with a large area LN-Free SDD for the ultimate in signal throughput while maintaining excellent elemental peak resolution further improving detection limits.

All this analytical flexibility is packaged into a table-top unit with powerful, easy-to-use analysis software. Orbis users can make elemental analyses on small samples such as particles, fragments and inclusions, or conduct automated multi-point and elemental imaging analysis on larger samples with all the benefits and simplicity of an XRF analyzer. 

Among the benefits of the Orbis system are non-destructive measurement, minimal sample preparation (e.g. no sample coating is necessary), improved sensitivity for many elements in comparison to SEM/EDS, inclusion and coating thickness analysis with the penetrating power of X-rays, and analysis of wet samples.

Applications for the Orbis micro-XRF system span a gamut of end uses and include criminal forensics, industrial forensics and quality control, non-destructive materials testing, RoHS compliance, layer thickness and composition analysis, geologic composition and more.

EDAX is the acknowledged leader in Energy Dispersive Microanalysis, Electron BackScatter Diffraction and X-ray Fluorescence instrumentation. It designs, manufactures, installs and services high-quality products and systems for leading companies in the semiconductor, metals, geological, pharmaceutical, biomaterials, and ceramics markets.

Since 1962, EDAX has used its knowledge and experience to develop ultra-sensitive silicon radiation sensors, digital electronics and specialized application software that facilitate solutions to research, development and industrial requirements.

EDAX is a unit of AMETEK Materials Analysis Division. AMETEK, Inc. is a leading global manufacturer of electronic instruments and electromechanical devices with 2007 sales of more than $2.1 billion.

For further information about EDAX, contact us at:

EDAX

91 McKee Drive, Mahwah, NJ 07430

Tel: (201) 529-4880· Fax: (201) 529-3156

E-mail: info.edax@ametek.com

Website: www.edax.com

Click here for a hi-res image of the EDAX Orbis micro-XRF system