MAHWAH, NJ - EDAX Inc., a leader in X-ray microanalysis and electron backscatter diffraction (EBSD) instrumentation, in partnership with Carl Zeiss SMT, showcased OIM 3D, the new three-dimensional Orientation Imaging Microscopy (OIMTM ) EBSD product, at the Microscopy and Microanalysis 2006 Conference, July 31 through August 3, 2006, at the Navy Pier Convention Center in Chicago.
"The use of the combined focused ion beam and electron beam microscopes has grown exponentially in the last few years. The development of the OIMTM 3D application finally allows the material scientist to understand what is happening within the sample, not just on the surface," notes Del Redfern, Product Marketing Manager for Materials Characterization Tools at EDAX.
"The product was developed by the close co-operation of the software and development groups with Carl Zeiss SMT and EDAX Inc, along with the support and expertise of Dr. Stefan Zaefferer of the Max Plank Institute" adds Redfern.
"Many of the standard two-dimensional maps and images that have long been available in OIMTM Analysis can now be easily utilized within OIMTM 3D. The information available through examining this extra dimension affords new insight into many important questions at the cutting edge of today’s research," explains Redfern.
"With the new 3D rendering package the 3D visualization functionality can be conveniently accessed within OIMTM Analysis with a click of a button. Data sets can be easily rotated and cross-sectioned at user-defined locations," he adds.
"The OIMTM 3D Visualization software provides some new and exciting capabilities to the EDAX suite of microanalysis tools: EDS, EBSD, and WDS systems offering a seamless integration that allow the material characterization scientist to generate ‘Results with Confidence’," concludes Redfern.
EDAX is the acknowledged leader in Energy Dispersive Microanalysis, X-ray Fluorescence and Electron Backscatter Diffraction instrumentation. It designs, manufactures, installs and services high-quality products and systems for leading companies in semiconductors, metals, geological, biological, material and ceramics market. Since 1962, EDAX has used its knowledge and experience to develop ultra-sensitive silicon radiation sensors, digital electronics and specialized application software that facilitate solutions to research, development and industrial requirements.
EDAX is a unit of AMETEK Materials Analysis Division. AMETEK, Inc. is a leading global manufacturer of electronic instruments and electromechanical devices with annualized sales of more than $1.6 billion.
For further information about EDAX-TSL, contact us at:
EDAX
91 McKee Drive, Mahwah, NJ 07430
Tel: (201) 529-4880 · Fax: (201) 529-3156
E-mail: info.edax@ametek.com
Website: www.edax.com
Click here for a hi-res image of OIM 3D Grain with Mis-orientations Identified
Click here for a hi-res image of OIM 3D IPF Map of Nickel
