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EDAX Introduces the new Orbis Micro-XRF Spectrometer
EDAX Inc. has introduced the Orbis micro-XRF inorganic elemental analyzer system, setting a new standard in analytical flexibility. The Orbis incorporates a unique motorized turret for coaxial sample view and X-ray analysis. Primary beam filters can be used with X-ray optics for tailored micro to millimeter spot elemental analyses. Orbis micro-XRF measurements are non-destructive, require minimal sample preparation and offer improved sensitivity over SEM/EDS. Applications include forensics, materials identification/compositional analysis, failure analysis, RoHS/WEEE, non-destructive testing, elemental imaging and more.
Forensic
The Orbis provides for non-destructive analysis of small to large objects, solids, powders and residues. It is possible to create elemental maps and spectra of trace elements for most of these sample types.
Industrial
In addition to the forensic capabilities, the Orbis incorporates numerous automation features to increase productivity and throughput for industrial settings.
- Wear Metal Debris
- Silicone in paper Products
- Quality Control and Failure Analysis
- Electronics, Circuit boards, component analysis, batteries
- Catalyst research
- Minerals, Ceramics
- Precious Metal Alloys
- Lighting & Filament Production
- Coating Thickness and Composition (e.g. solar panels, lead frames)
- RoHS/WEEE
Museum Collections
Non-destructive analysis is a crucial aspect of investigating precious artifacts. Coupled with the Orbis' ability to accommodate a wide variety of object sizes, it is possible to acquire elemental maps and spectra of elements, sometimes even from below the surface.
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