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![]() Orbis PC Silicon Drift Detector (SDD) Analyzer
The Orbis PC Silicon Drift Detector (SDD) Analyzer is an upgraded model that is exceptionally well suited to analyze smaller samples or make faster measurements. The instrument is delivered with an advanced, LN-Free X-ray silicon drift detector (SDD), enhanced color video camera with 3x digital zoom, and a 30 µm polycapillary lens. The Orbis PC SDD’s sample positioner has an upgraded XYZ stage with higher-precision sample positioning.
Standard Orbis PC components include:
- Rh tube (50kV, 50 W)
- 30 µm ultra-high intensity poly-capillary optic (FWHM @ MoKα)
- Automated primary beam filter system (Open position, 6 filters, Shutter)
- Dual CCD cameras: 10x color; 75x color (3x digital zoom)
- Advanced 30 mm2 Silicon Drift Detector (SDD). No liquid cryogen cooling required
- High precision computer-controlled XYZ stage
- Sample chamber: vacuum or air
- Digital signal analyzer electronics
- Operating SW with automated analysis and quantification routines including:
- Fundamental Parameter analysis with or without standards
- Trace element analysis in light element matrices using Fundamental Parameters analysis
- Semi-empirical analysis using calibrations with standards
Options:
- Sample chamber viewport with 4.9" x 4.9" (124 mm x 124 mm) viewable area
- Advanced 50 mm2 Silicon Drift Detector (SDD)
- Large area SiLi detectors are available for this model where appropriate for customer applications
- Mo tube (50kV, 50W)
- Automated collimators (1 mm and 2 mm) in conjunction with mono-capillary optic; selectable by SW control
- Software: Spectral Mapping, Image Processing SW, Linescan, Coating Analysis, Spectral Matching, Alloy ID, Remote Spectrometer SW for data processing
Ca-P-Si elemental map of fossilized bone using a red-green-blue mixer to create overlay.
Orbis Micro-XRF Elemental Analyzer Bulletin
Orbis Micro-XRF System Brochure
Orbis Coating Software
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