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The Orbis PC Silicon Drift Detector (SDD) Analyzer is an upgraded model that is exceptionally well suited to analyze smaller samples or make faster measurements. The instrument is delivered with an advanced, LN-Free X-ray silicon drift detector (SDD), enhanced color video camera with 3x digital zoom, and a 30 µm polycapillary lens. The Orbis PC SDD’s sample positioner has an upgraded XYZ stage with higher-precision sample positioning.
Standard Orbis PC components include:
- Rh tube (50kV, 50 W)
- 30 µm ultra-high intensity poly-capillary optic (FWHM @ MoKα)
- Automated primary beam filter system (Open position, 6 filters, Shutter)
- Dual CCD cameras: 10x color; 75x color (3x digital zoom)
- Advanced Silicon Drift Detector (SDD)* No liquid cryogen cooling required
- High precision computer-controlled XYZ stage
- Sample chamber: vacuum or air
- Digital signal analyzer electronics
- Operating SW with automated analysis and quantification routines including:
- Fundamental Parameter analysis with or without standards
- Trace element analysis in light element matrices using Fundamental Parameters analysis
- Semi-empirical analysis using calibrations with standards
Options:
- Mo tube (50kV, 50W)
- Automated collimators (1 mm and 2 mm) in conjunction with mono-capillary optic; selectable by SW control
- Software: Spectral Mapping, Image Processing SW, Linescan, Coating Analysis, Spectral Matching, Alloy ID, Remote Spectrometer SW for data processing
*Large area SiLi detectors are available for this model where appropriate for customer applications.
Ca-P-Si elemental map of fossilized bone using a red-green-blue mixer to create overlay.
Orbis Micro-XRF System
Orbis Coating Software
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